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    • 2. 发明授权
    • Method and portable testing apparatus for safely testing an
autotransformer for power distribution lines
    • 用于安全测试配电线路自耦变压器的方法和便携式测试装置
    • US5455506A
    • 1995-10-03
    • US278238
    • 1994-07-21
    • Yvan MimeaultJacques KirouacYves TremblayRoland Caron
    • Yvan MimeaultJacques KirouacYves TremblayRoland Caron
    • G01R31/06
    • G01R31/027G01R31/025
    • A method and an apparatus are provided for safely testing an autotransformer of power distribution lines which has an identified centre tap ground connector, a primary winding terminal and a secondary winding terminal. The method for safely testing the autotransformer includes the steps of disconnecting the terminals and connector of the autotransformer from the distribution lines, applying a first testing AC voltage having a maximum value of substantially one volt only between a first of the terminals and the ground connector, measuring a first value of an AC voltage between the first terminal and the ground connector, and measuring a second value of an AC voltage between the second of the terminals and the ground connector. Thereafter, the method includes the steps of applying a second testing AC voltage having a maximum value of substantially one volt only between the second terminal and the ground connector, measuring a third value of an AC voltage between the second terminal and the ground connector, and measuring a fourth value of an AC voltage between the first terminal and the ground connector. Then, the method further includes steps of comparing the four measured values to predetermined constants, and generating corresponding signals indicating that autotransformer is short-circuited or that the same is open-circuited. When, the autotransformer being test is not short-circuited nor open-circuited, the method includes the step of generating a signal indicating that the first terminal is the secondary winding terminal or the first terminal is the primary winding terminal, whereby the primary and secondary terminals are clearly identified.
    • 提供了一种用于安全地测试配电线路的自耦变压器的方法和装置,该配电线路具有识别的中心抽头接地连接器,初级绕组端子和次级绕组端子。 用于安全地测试自耦变压器的方法包括以下步骤:从分配线断开自耦变压器的端子和连接器,仅在第一端子和接地连接器之间施加具有基本上一伏的最大值的第一测试交流电压, 测量第一端子和接地连接器之间的交流电压的第一值,以及测量第二端子与接地连接器之间的交流电压的第二值。 此后,该方法包括以下步骤:仅在第二端子和接地连接器之间施加具有基本上一伏的最大值的第二测试AC电压,测量第二端子和接地连接器之间的AC电压的第三值,以及 测量第一端子和接地连接器之间的交流电压的第四值。 然后,该方法还包括以下步骤:将四个测量值与预定常数进行比较,并产生指示自耦变压器短路或相同的开路的相应信号。 当被测自耦变压器不短路或断路时,该方法包括产生指示第一端子是次级绕组端子或第一端子是初级绕组端子的信号的步骤,由此初级和次级 终端清楚识别。
    • 3. 发明授权
    • Fiber optic access nodes
    • 光纤接入节点
    • US4650278A
    • 1987-03-17
    • US547244
    • 1983-10-31
    • Roman MaciejkoYves Tremblay
    • Roman MaciejkoYves Tremblay
    • G02B6/28G02B6/34G02B6/35G02B6/42H04B10/29G02B6/36
    • G02B6/3502G02B6/2804G02B6/2808G02B6/2937G02B6/4246H04B10/29G02B6/3562G02B6/3574G02B6/3582
    • A fiber optic access node has input and output fibers terminating at a housing. A module is retractably insertable into the housing to automatically lock into a position in which an output zone of the module aligns with the output fiber and input zone of the module aligns with the input fiber. The input and output zones may be those of fiber optic passive elements such as a bypass fiber, a fiber tap, a fiber extension loop or a wavelength division multiplexed device, or may be those of an active element such as a repeater incorporating a light emitter, a light detector and a control circuit. The fiber optic element may be encapsulated within a plastics block or can be clamped between two plates. The combination of module and housing allows rapid and easy substitution of fiber optic functions within a fiber network.
    • 光纤接入节点具有终端于外壳的输入和输出光纤。 模块可伸缩地插入壳体中以自动锁定到模块的输出区域与输出光纤对准的位置,并且模块的输入区域与输入光纤对准。 输入和输出区可以是诸如旁路光纤,光纤抽头,光纤延伸环或波分复用器件的光纤无源元件的输入和输出区,或者可以是有源元件的那些,例如并入光发射器 ,光检测器和控制电路。 光纤元件可以封装在塑料块内,或者夹在两块板之间。 模块和外壳的组合可以快速轻松地替换光纤网络中的光纤功能。
    • 4. 发明授权
    • Fiber optic star coupler
    • 光纤星形耦合器
    • US4653845A
    • 1987-03-31
    • US611478
    • 1984-05-17
    • Yves TremblayIan S. FewRomain MaciejkoJohn D. Ralston
    • Yves TremblayIan S. FewRomain MaciejkoJohn D. Ralston
    • G02B6/28G02B6/40G02B6/20
    • G02B6/40G02B6/2808
    • A fiber optic star coupler particularly for use in providing optical interconnects between circuit boards has a light mixer into which input and output fibers are inserted. The mixer has rectangular cross-section passage, an interior surface of which is highly reflecting. The mixer is long enough to promote a degree of internal reflection of light from any one of the input fibers sufficient that the corresponding light intensity reaching the output fibers is substantially uniform. In an optical interconnect arrangement, interconnection between circuit boards in a rack or cabinet is achieved by mounting light emitting and light receiving units on each board and leading fibers to which the units are fixed to the fiber optic star coupler so that light from the emitter units enters one end of the light mixer and fibers leading to the receiver units enter the opposed end of the light mixer. The fiber optic star coupler is substantially cheaper and more easily manufactured than known fiber optic star couplers using a polished glass slab as a light mixer.
    • 特别用于在电路板之间提供光学互连的光纤星形耦合器具有插入输入和输出光纤的光混合器。 混合器具有矩形横截面通道,其内表面高反射。 混合器足够长以促进来自任何一个输入光纤的光的内部反射度足以使到达输出光纤的相应光强度基本上均匀。 在光学互连装置中,通过将光发射和光接收单元安装在每个板上并将单元固定到光纤星形耦合器的引导光纤安装在一起来实现机架或机柜中的电路板之间的互连,使得来自发射器单元 进入光混合器的一端,通向接收器单元的光纤进入光混合器的相对端。 与使用抛光玻璃板作为光混合器的已知光纤星形耦合器相比,光纤星形耦合器实质上便宜且更容易制造。
    • 6. 发明授权
    • Systems for and methods of using a display controller to output data
    • 使用显示控制器输出数据的系统和方法
    • US08077180B1
    • 2011-12-13
    • US11962685
    • 2007-12-21
    • Yves Tremblay
    • Yves Tremblay
    • G06F3/038G06F15/00G09G5/00G06T1/00
    • G06F3/14G09G2350/00G09G2370/04G09G2370/22
    • In accordance with one aspect, a display controller is included in a graphics processing unit. In some embodiments, the display controller includes a read memory requester configured to provide a data request to a source of image data, a data path configured to be coupled to the source of image data, an output coupled to the data path and a control unit in electrical communication with the read memory requester and the data path. In accordance with one embodiment, the output is configured to provide image data processed by the display controller and the control unit is configured to stop an output of image data processed by the display controller. In accordance with a further embodiment, the control unit includes a stop-output register configured to provide information employed by the control unit to stop the output of image data processed by the display controller.
    • 根据一个方面,显示控制器包括在图形处理单元中。 在一些实施例中,显示控制器包括读存储器请求器,其被配置为向图像数据源提供数据请求,被配置为耦合到图像数据源的数据路径,耦合到数据路径的输出和控制单元 与读取存储器请求器和数据路径电通信。 根据一个实施例,输出被配置为提供由显示控制器处理的图像数据,并且控制单元被配置为停止由显示控制器处理的图像数据的输出。 根据另一实施例,控制单元包括停止输出寄存器,该停止输出寄存器被配置为提供由控制单元采用的信息,以停止由显示控制器处理的图像数据的输出。
    • 8. 发明授权
    • Method of making specular infrared mirrors for use in optical devices
    • 制造用于光学器件的镜面红外镜的方法
    • US06656528B2
    • 2003-12-02
    • US09987829
    • 2001-11-16
    • Luc OuelletYves Tremblay
    • Luc OuelletYves Tremblay
    • B05D310
    • G02B5/0891G02B5/0808G02B6/29326G02B6/29328
    • A method of making highly reflective mirrors on a wafer in the manufacture of photonic devices involves preheating a wafer to remove adsorbed volatile contaminants at a temperature between about 300 and 600° C. The wafer surface is etched at a temperature between about 300 and 600° C. to remove absorbed and chemically absorbed contaminants in the presence of a plasma to prevent poisoning. The wafer surface is thoroughly cooled so as to as reduce the surface mobility of the impinging atoms during the subsequent metallic deposition. A deposition is then carried out on the cooled wafer of a gettering layer for gettering hydrogen, oxygen and nitrogen. A metallic reflective layer is then deposited in a deposition chamber, and finally the wafer is removed from the deposition chamber to prevent excessive bulk oxidation.
    • 在制造光子器件时在晶片上制造高反射镜的方法包括预热晶片以在约300-600℃之间的温度下去除吸附的挥发性污染物。晶片表面在约300和600℃之间的温度下被蚀刻 C.在等离子体存在下除去吸收和化学吸收的污染物,以防止中毒。 晶片表面被彻底冷却,以便在随后的金属沉积期间降低冲击原子的表面迁移率。 然后在吸气层的冷却晶片上进行沉积,以吸除氢气,氧气和氮气。 然后将金属反射层沉积在沉积室中,最后将晶片从沉积室移除以防止过度的体积氧化。