专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US4863842A Silver halide photographic light sensitive material 失效
标题翻译：卤化银照相感光材料
公开(公告)号：US4863842A
公开(公告)日：1989-09-05
申请号：US230716
申请日：1988-08-09
申请人： Yutaka Kaneko , Kenzi Kadokura , Toyoki Nishijima , Kaoru Onodera
发明人： Yutaka Kaneko , Kenzi Kadokura , Toyoki Nishijima , Kaoru Onodera
IPC分类号： G03C7/30
CPC分类号： G03C7/301
摘要： A silver halide photographic light sensitive material, which contains at least one magenta dye image forming coupler expressed by the following general formula [I], at least one piperazine or homopiperazine compound expressed by the following general formula [XIIIa], at least one compound selected from a coumarane or a chroman compounds expressed by general formula [XIIIa] and hydroxyindane compounds expressed by [XIIIb], below, is described as being stable to light and moisture, and featuring an excellent color reproducibility. ##STR1## The effect of the invention is further improved by additionally employing a metallic compound wherein an optical quenching rate of singlet oxygen is more than 3.times.10.sup.7 M.sup.-1 .multidot.sec.sup.-1.

2. 发明授权

US4973546A Light-sensitive silver halide photographic material improved in stability of dye image 失效
标题翻译：感光卤化银照相材料改善了染料图像的稳定性
公开(公告)号：US4973546A
公开(公告)日：1990-11-27
申请号：US224242
申请日：1988-07-26
申请人： Yutaka Kaneko , Kenzi Kadokura
发明人： Yutaka Kaneko , Kenzi Kadokura
IPC分类号： G03C7/26 , G03C7/30 , G03C7/38 , G03C7/392
CPC分类号： G03C7/301 , G03C7/39296 , G03C7/3825 , G03C7/39216 , G03C7/39248 , G03C7/39268 , G03C7/39272 , G03C7/39276 , G03C7/3928
摘要： A light-sensitive silver halide photographic material comprising a magenta coupler represented by the formula I: ##STR1## at least one magenta image stabilizer represented by formula XII: ##STR2## at least one magenta dye image stabilizer selected from a group consisting of a compound represented by general formulas XIIIa and XIIIb: ##STR3##
摘要翻译：一种感光卤化银照相材料，其包含由式I表示的品红色成色剂：至少一种由式XII表示的品红色影像稳定剂：XII至少一种品红染料影像稳定剂，选自：由通式XIIIa和XIIIb表示的化合物：XIIIa XIIIb

3. 发明授权

US4814262A Silver halide photographic light-sensitive material to provide dye-image with improved color-fastness to light 失效
标题翻译：卤化银摄影感光材料，为染色剂提供更好的耐色牢度
公开(公告)号：US4814262A
公开(公告)日：1989-03-21
申请号：US107270
申请日：1987-10-09
申请人： Shuichi Sugita , Shinji Yoshimoto , Naoko Shimada , Satoshi Nakagawa , Yutaka Kaneko , Toyoki Nishijima
发明人： Shuichi Sugita , Shinji Yoshimoto , Naoko Shimada , Satoshi Nakagawa , Yutaka Kaneko , Toyoki Nishijima
IPC分类号： G03C7/30 , G03C7/32 , G03C7/392 , G03C7/26 , G03C1/34 , G03C7/38
CPC分类号： G03C7/3225 , G03C7/3005 , G03C7/3924
摘要： A silver halide photographic light-sensitive material improved in light-fastness of dye images and in prevention of yellow-stain formation in a non-colored area after processing. The photographic material comprises a support having thereon photographic structural layers including at least one silver halide emulsion layer. At least one of the photographic component layers contains a compound represented by the following Formula [I]: ##STR1## A magenta coupler represented by the following formula [M-I] is preferably used with the above compound. ##STR2##
摘要翻译：卤化银照相感光材料在染色图像的耐光性方面提高，并且防止在加工后的无色区域中形成黄色斑。照相材料包括其上具有包含至少一个卤化银乳剂层的照相结构层的支撑体。至少一个照相组分层含有由下式[I]表示的化合物：下式[M-1]表示的品红色成色剂优选与上述化合物一起使用。公式[M-I]

4. 发明授权

US08943786B2 Packaging and filling machine 有权
标题翻译：包装灌装机
公开(公告)号：US08943786B2
公开(公告)日：2015-02-03
申请号：US12991963
申请日：2009-05-05
申请人： Hidetoshi Konno , Yutaka Kaneko , Keiji Yano
发明人： Hidetoshi Konno , Yutaka Kaneko , Keiji Yano
IPC分类号： B65B3/30 , B65B61/28 , B29C65/02 , B29C65/74 , B29C65/00 , B65B9/12 , B65B9/20 , B65B9/22 , B65B51/30 , B65B57/14 , B29C53/48 , B29C65/08 , B29C65/18 , B29C35/04 , B29K305/02 , B29K711/12 , B29L9/00 , B65B61/24
CPC分类号： B65B61/28 , B29C53/48 , B29C65/02 , B29C65/08 , B29C65/10 , B29C65/18 , B29C65/7451 , B29C66/024 , B29C66/0242 , B29C66/1122 , B29C66/4312 , B29C66/71 , B29C66/723 , B29C66/72321 , B29C66/72328 , B29C66/72341 , B29C66/7373 , B29C66/81427 , B29C66/81431 , B29C66/83543 , B29C66/8491 , B29C66/92 , B29C66/9241 , B29C66/92921 , B29C2035/046 , B29C2793/009 , B29K2023/06 , B29K2305/02 , B29K2711/123 , B29K2995/0067 , B29L2009/00 , B29L2009/003 , B29L2031/7166 , B65B9/12 , B65B9/20 , B65B9/2035 , B65B9/22 , B65B51/30 , B65B57/145 , B65B61/24 , B29C65/00
摘要： A packaging and filling machine that is capable of easily preforming with the forming flaps by keeping the pressure of the filled liquid food in the tube at positive pressure, capable of preventing the pressure of the liquid food from dropping to negative pressure, even if the pressure of the liquid food decreases due to the change in the liquid food pressure, and capable of preventing outside atmosphere materials from invading into the tube.A pressure flange fixed on a periphery of the filling pipe absorbs fluctuation of the pressure of the liquid food in the tube below the pressure flange, and prevents the liquid food pressure from dropping to negative pressure to keep the pressure of the liquid food in the tube below the pressure flange at a positive pressure.
摘要翻译：一种包装和灌装机，其能够通过将填充的液体食品的压力保持在管中的正压力下容易地预成型，能够防止液体食物的压力下降至负压，即使压力的液体食物由于液体食物压力的变化而降低，并且能够防止外部大气物质侵入到管中。固定在填充管周边的压力凸缘吸收压力凸缘下方的管中的液体食物的压力波动，并且防止液体食物压力下降到负压，以将液体食物的压力保持在管中压力法兰正压下方。

5. 发明申请

US20120132801A1 METHOD AND AN APPARATUS OF AN INSPECTION SYSTEM USING AN ELECTRON BEAM 有权
标题翻译：使用电子束检测系统的方法和装置
公开(公告)号：US20120132801A1
公开(公告)日：2012-05-31
申请号：US13366874
申请日：2012-02-06
申请人： Yuko IWABUCHI , Hideo Todokoro , Hiroyoshi Mori , Mitsugu Sato , Yasutsugu Usami , Mikio Ichihashi , Satoru Fukuhara , Hiroyuki Shinada , Yutaka Kaneko , Katsuya Sugiyama , Atsuko Takafuji , Hiroshi Toyama
发明人： Yuko IWABUCHI , Hideo Todokoro , Hiroyoshi Mori , Mitsugu Sato , Yasutsugu Usami , Mikio Ichihashi , Satoru Fukuhara , Hiroyuki Shinada , Yutaka Kaneko , Katsuya Sugiyama , Atsuko Takafuji , Hiroshi Toyama
IPC分类号： H01J37/28
CPC分类号： H01J37/28 , G01N23/20 , G01N23/2251 , G03F7/7065 , G06T7/001 , G06T2207/10056 , G06T2207/30148 , H01J37/04 , H01J37/20 , H01J37/265 , H01J2237/04756 , H01J2237/20221 , H01J2237/2444 , H01J2237/24592 , H01J2237/2817 , H01J2237/31766
摘要： Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer.The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.
摘要翻译：通过提供新颖的检查方法和采用这种新方法的检测装置，本发明通过使用电子束的本发明解决了常规检查方法中遇到的问题和采用该方法的传统装置，该方法能够提高扫描样本的速度作为半导体晶片。本发明提供的检验新颖方法包括以下步骤：产生电子束; 通过使用物镜将生成的电子束会聚在样品上; 使用会聚电子束扫描样品; 扫描期间连续移动样品; 检测在样本和物镜之间的位置处从样本发出的带电粒子，并将检测到的带电粒子转换成电信号; 存储由电信号传送的图像信息; 通过使用所存储的图像信息将图像与另一图像进行比较; 并检测样本的缺陷。

6. 发明授权

US08157183B2 Expansion valve, heat pump type refrigeration cycle apparatus, and air handling unit 有权
标题翻译：膨胀阀，热泵式制冷循环装置和空气处理单元
公开(公告)号：US08157183B2
公开(公告)日：2012-04-17
申请号：US12402134
申请日：2009-03-11
申请人： Takahito Hayashi , Hideki Sekiguchi , Yutaka Kaneko
发明人： Takahito Hayashi , Hideki Sekiguchi , Yutaka Kaneko
IPC分类号： F25B41/04 , F25B41/06
CPC分类号： F25B41/062 , F25B13/00 , F25B2341/0652 , Y02B30/72
摘要： A first expansion valve is provided in an outdoor unit, and a second expansion valve is provided in an indoor unit. A pipe line connects a first joint pipe of the first expansion valve and a second joint pipe of the second expansion valve. When a refrigerant flows in from the second joint pipe and flows out from the first joint pipe, the first and second expansion valves are in a full open state due to pressure of the refrigerant. When the refrigerant flows in from the first joint pipe and flows out from the second joint pipe, the first and second expansion valves are in semi-closed state (flow rate controlling state). In a cooling mode, the second expansion valve expands the refrigerant just before an indoor heat exchanger, and in a heating mode, the first expansion valve expands the refrigerant just before an outdoor heat exchanger. In both heating and cooling mode, a large amount of refrigerant flows through the pipe line to reduce pressure loss.
摘要翻译：第一膨胀阀设置在室外机中，第二膨胀阀设置在室内机。管路连接第一膨胀阀的第一接头管和第二膨胀阀的第二接头管。当制冷剂从第二关节管流入并从第一关节管流出时，第一和第二膨胀阀由于制冷剂的压力而处于全开状态。当制冷剂从第一关节管流入并从第二关节管流出时，第一和第二膨胀阀处于半闭合状态（流量控制状态）。在冷却模式中，第二膨胀阀刚好在室内热交换器之前膨胀制冷剂，并且在加热模式下，第一膨胀阀在室外热交换器之前膨胀制冷剂。在加热和冷却两种模式下，大量制冷剂流过管道，以减少压力损失。

7. 发明申请

US20090293520A1 EXPANSION VALVE, HEAT PUMP TYPE REFRIGERATION CYCLE APPARATUS, AND AIR HANDLING UNIT 有权
标题翻译：膨胀阀，热泵式制冷循环装置和空气处理装置
公开(公告)号：US20090293520A1
公开(公告)日：2009-12-03
申请号：US12402134
申请日：2009-03-11
申请人： Takahito Hayashi , Hideki Sekiguchi , Yutaka Kaneko
发明人： Takahito Hayashi , Hideki Sekiguchi , Yutaka Kaneko
IPC分类号： F25B41/04 , F25B13/00
CPC分类号： F25B41/062 , F25B13/00 , F25B2341/0652 , Y02B30/72
摘要： A first expansion valve is provided in an outdoor unit, and a second expansion valve is provided in an indoor unit. A pipe line connects a first joint pipe of the first expansion valve and a second joint pipe of the second expansion valve. When a refrigerant flows in from the second joint pipe and flows out from the first joint pipe, the first and second expansion valves are in a full open state due to pressure of the refrigerant. When the refrigerant flows in from the first joint pipe and flows out from the second joint pipe, the first and second expansion valves are in semi-closed state (flow rate controlling state). In a cooling mode, the second expansion valve expands the refrigerant just before an indoor heat exchanger, and in a heating mode, the first expansion valve expands the refrigerant just before an outdoor heat exchanger. In both heating and cooling mode, a large amount of refrigerant flows through the pipe line to reduce pressure loss.
摘要翻译：第一膨胀阀设置在室外机中，第二膨胀阀设置在室内机。管路连接第一膨胀阀的第一接头管和第二膨胀阀的第二接头管。当制冷剂从第二关节管流入并从第一关节管流出时，第一和第二膨胀阀由于制冷剂的压力而处于全开状态。当制冷剂从第一关节管流入并从第二关节管流出时，第一和第二膨胀阀处于半闭合状态（流量控制状态）。在冷却模式中，第二膨胀阀刚好在室内热交换器之前膨胀制冷剂，并且在加热模式下，第一膨胀阀在室外热交换器之前膨胀制冷剂。在加热和冷却两种模式下，大量制冷剂流过管道，以减少压力损失。

8. 发明授权

US07439506B2 Method and an apparatus of an inspection system using an electron beam 失效
标题翻译：使用电子束的检查系统的方法和装置
公开(公告)号：US07439506B2
公开(公告)日：2008-10-21
申请号：US11798239
申请日：2007-05-11
申请人： Yuko Iwabuchi , Hideo Todokoro , Hiroyoshi Mori , Mitsugu Sato , Yasutsugu Usami , Mikio Ichihashi , Satoru Fukuhara , Hiroyuki Shinada , Yutaka Kaneko , Katsuya Sugiyama , Atsuko Takafuji , Hiroshi Toyama
发明人： Yuko Iwabuchi , Hideo Todokoro , Hiroyoshi Mori , Mitsugu Sato , Yasutsugu Usami , Mikio Ichihashi , Satoru Fukuhara , Hiroyuki Shinada , Yutaka Kaneko , Katsuya Sugiyama , Atsuko Takafuji , Hiroshi Toyama
IPC分类号： H01J37/256 , H01J37/244
CPC分类号： H01J37/28 , G01N23/20 , G01N23/2251 , G03F7/7065 , G06T7/001 , G06T2207/10056 , G06T2207/30148 , H01J37/04 , H01J37/20 , H01J37/265 , H01J2237/04756 , H01J2237/20221 , H01J2237/2444 , H01J2237/24592 , H01J2237/2817 , H01J2237/31766
摘要： Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer.The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.
摘要翻译：通过提供新颖的检查方法和采用这种新方法的检测装置，本发明通过使用电子束的本发明解决了常规检查方法中遇到的问题和采用该方法的传统装置，该方法能够提高扫描样本的速度作为半导体晶片。本发明提供的检验新颖方法包括以下步骤：产生电子束; 通过使用物镜将生成的电子束会聚在样品上; 使用会聚电子束扫描样品; 扫描期间连续移动样品; 检测在样本和物镜之间的位置处从样本发出的带电粒子，并将检测到的带电粒子转换成电信号; 存储由电信号传送的图像信息; 通过使用所存储的图像信息将图像与另一图像进行比较; 并检测样本的缺陷。

9. 发明授权

US07397031B2 Method of inspecting a circuit pattern and inspecting instrument 失效
标题翻译：检查电路图案和检查仪器的方法
公开(公告)号：US07397031B2
公开(公告)日：2008-07-08
申请号：US11452989
申请日：2006-06-15
申请人： Hiroyuki Shinada , Atsuko Takafuji , Takanori Ninomiya , Yuko Sasaki , Mari Nozoe , Hisaya Murakoshi , Taku Ninomiya , Yuji Kasai , Hiroshi Makino , Yutaka Kaneko , Kenji Tanimoto
发明人： Hiroyuki Shinada , Atsuko Takafuji , Takanori Ninomiya , Yuko Sasaki , Mari Nozoe , Hisaya Murakoshi , Taku Ninomiya , Yuji Kasai , Hiroshi Makino , Yutaka Kaneko , Kenji Tanimoto
IPC分类号： H01J37/28
CPC分类号： G01N23/225 , G01R31/307 , H01J37/28 , H01J2237/2817
摘要： An apparatus for inspecting a sample using a scanning electron microscope includes a sample stage, a first electron-optical system to scan an electron beam of a first beam current on the sample, a second electron-optical system to scan an electron beam of a second beam current smaller than the first beam current on the sample, a mechanism to move the sample stage, a detector provided in each of the first and second electron-optical systems to detect a secondary electron. The first electron-optical system is operable in a first mode and the second electron-optical system is operable in a second mode with higher resolution than that of the first mode. In the first mode, the sample is observed while the sample stage is moved continuously, and in the second mode, the sample is observed by detecting a secondary electron using the detector while the sample stage is held stationary.
摘要翻译：使用扫描电子显微镜检查样品的装置包括样品台，用于扫描样品上的第一束电流的电子束的第一电子 - 光学系统，用于扫描第二电子束的电子束的第二电子 - 光学系统光束电流小于样品上的第一光束电流，移动样品台的机构，设置在每个第一和第二电子光学系统中的检测二次电子的检测器。第一电子 - 光学系统可在第一模式中操作，并且第二电子 - 光学系统可以以比第一模式更高的分辨率在第二模式中操作。在第一模式中，在样品台连续移动时观察样品，在第二模式中，通过在样品台保持静止时使用检测器检测二次电子来观察样品。

10. 发明授权

US06518548B2 Substrate temperature control system and method for controlling temperature of substrate 失效
公开(公告)号：US06518548B2
公开(公告)日：2003-02-11
申请号：US10084378
申请日：2002-02-28
申请人： Masakazu Sugaya , Fumio Murai , Yutaka Kaneko , Masafumi Kanetomo , Shigeki Hirasawa , Tomoji Watanabe , Tatuharu Yamamoto , Katsuhiro Kuroda
发明人： Masakazu Sugaya , Fumio Murai , Yutaka Kaneko , Masafumi Kanetomo , Shigeki Hirasawa , Tomoji Watanabe , Tatuharu Yamamoto , Katsuhiro Kuroda
IPC分类号： H05B368
CPC分类号： H01L21/67103 , H01L21/67248
摘要： So as to provide a substrate temperature control system capable of unifying the temperature of the substrate and capable of shortening the temperature elevation time (temperature lowering time), the substrate temperature control system is equipped with a temperature control plate (heating or cooling plate) having a plurality of projections on the surface and serving to set the temperature of the substrate, and a chuck mechanism to fix the substrate in contact to a plurality of the projections by chucking the substrate toward the direction of the temperature control plate.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式