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1. 发明授权

US06720775B2 Pulsed eddy current two-dimensional sensor array inspection probe and system 有权
标题翻译：脉冲涡流二维传感器阵列检测探头和系统
公开(公告)号：US06720775B2
公开(公告)日：2004-04-13
申请号：US09681824
申请日：2001-06-12
申请人： Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , Curtis Wayne Rose , Thomas James Batzinger , Kenneth Gordon Herd
发明人： Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , Curtis Wayne Rose , Thomas James Batzinger , Kenneth Gordon Herd
IPC分类号： G01R3128
CPC分类号： G01N27/904
摘要： A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
摘要翻译：用于导电部件检查的脉冲涡流二维传感器阵列探针包括邻近被检查结构设置的驱动线圈，连接到驱动线圈的脉冲发生器，可操作以脉冲方式激励驱动线圈传递瞬态电磁焊剂进入被检查的结构，以及布置成二维阵列并且基本上被驱动线圈包围的传感器阵列，可操作以感测和产生来自被检查结构中的瞬态电磁通量的输出信号。

2. 发明授权

US06911826B2 Pulsed eddy current sensor probes and inspection methods 有权
标题翻译：脉冲涡流传感器探头和检查方法
公开(公告)号：US06911826B2
公开(公告)日：2005-06-28
申请号：US10727401
申请日：2003-12-03
申请人： Yuri Alexeyevich Plotnikov , Thomas James Batzinger , Shridhar Champaknath Nath , Sandeep Kumar Dewangan , Carl Stephen Lester , Kenneth Gordon Herd , Curtis Wayne Rose
发明人： Yuri Alexeyevich Plotnikov , Thomas James Batzinger , Shridhar Champaknath Nath , Sandeep Kumar Dewangan , Carl Stephen Lester , Kenneth Gordon Herd , Curtis Wayne Rose
IPC分类号： G01B7/34 , G01B7/00 , G01N27/90 , G01N27/82 , G01R31/28 , G01R33/00 , G01R33/12
CPC分类号： G01N27/904
摘要： A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.
摘要翻译：脉冲涡流传感器探头包括传感器阵列板。多个传感器布置在传感器阵列板上，并且可操作以在被检查的部件中感测并产生来自瞬态电磁通量的输出信号。每个传感器都具有带正和负输出的差分输出。至少一个驱动线圈被布置成与传感器相邻，并且可操作以将瞬态电磁通量传输到该部件中。第一和第二多路复用器布置在传感器阵列板上并可操作以在传感器之间切换。第一和第二多路复用器分别连接到传感器的正和负输出。

3. 发明授权

US06707297B2 Method for in-situ eddy current inspection of coated components in turbine engines 失效
标题翻译：涡轮发动机涂层部件原位涡流检测方法
公开(公告)号：US06707297B2
公开(公告)日：2004-03-16
申请号：US10122836
申请日：2002-04-15
申请人： Shridhar Champaknath Nath , Thomas James Batzinger , Curtis Wayne Rose , Yuri Alexeyevich Plotnikov , Kenneth Gordon Herd
发明人： Shridhar Champaknath Nath , Thomas James Batzinger , Curtis Wayne Rose , Yuri Alexeyevich Plotnikov , Kenneth Gordon Herd
IPC分类号： G01N2782
CPC分类号： G01N27/9046
摘要： A method for in-situ eddy current inspection of at least one coated component includes applying a drive pulse at a measurement position on an outer surface of the coated component, while the coated component is installed in an operational environment of the coated component. The coated component includes a base metal and a coating disposed on the base metal. The method further includes receiving a response signal from the coated component, comparing the response signal with a reference signal to obtain a compared signal, analyzing the compared signal for crack detection, and determining whether a crack near the measurement position has penetrated into the base metal, if the presence of the crack in the coating is indicated.
摘要翻译：用于至少一个涂覆部件的原位涡流检查的方法包括在涂覆部件的外表面上的测量位置处施加驱动脉冲，同时将涂覆部件安装在涂覆部件的操作环境中。涂覆的部件包括贱金属和设置在母材上的涂层。该方法还包括从涂覆部件接收响应信号，将响应信号与参考信号进行比较以获得比较信号，分析用于裂纹检测的比较信号，以及确定测量位置附近的裂纹是否穿透到基底金属如果指示涂层中存在裂纹。

4. 发明授权

US06545469B1 Embedded eddy current inspection apparatus, system, and method 失效
标题翻译：嵌入式涡流检测仪，系统及方法
公开(公告)号：US06545469B1
公开(公告)日：2003-04-08
申请号：US09682902
申请日：2001-10-31
申请人： Thomas James Batzinger , Shridhar Champaknath Nath , Kenneth Gordon Herd
发明人： Thomas James Batzinger , Shridhar Champaknath Nath , Kenneth Gordon Herd
IPC分类号： G01N2790
CPC分类号： G01N27/9046
摘要： An embedded eddy current inspection apparatus includes a substrate having an opening, and a test eddy current coil (“test coil”) affixed to the substrate near the opening. An internally inspected multilayer component structure includes an upper layer, a lower layer, and an eddy current probe embedded between the upper and lower layers. The eddy current probe includes the test coil facing a subject layer selected from the upper and lower layers. A method of inspecting a multilayer component structure includes simultaneously energizing the test coil and a reference eddy current coil (“reference coil”) embedded between the upper and lower layers and facing the subject layer. The reference coil is located in a reference region of the multilayer structure. A test signal from the test coil is compared with a reference signal from the reference coil, to determine whether a flaw is present in the subject layer near the test coil.
摘要翻译：嵌入式涡流检查装置包括具有开口的基板和在开口附近固定到基板的测试涡流线圈（“测试线圈”）。内部检查的多层组件结构包括上层，下层和嵌入在上层和下层之间的涡流探针。涡流探针包括面向从上层和下层选择的被摄体层的测试线圈。检查多层部件结构的方法包括同时激励测试线圈和嵌入在上层和下层之间并面向主体层的参考涡流线圈（“参考线圈”）。参考线圈位于多层结构的参考区域中。将来自测试线圈的测试信号与来自参考线圈的参考信号进行比较，以确定在测试线圈附近的被摄体层中是否存在缺陷。

5. 发明授权

US06888347B2 Omnidirectional eddy current probes, array probes, and inspection systems 失效
标题翻译：全向涡流探头，阵列探头和检测系统
公开(公告)号：US06888347B2
公开(公告)日：2005-05-03
申请号：US10662681
申请日：2003-09-12
申请人： Thomas James Batzinger , Shridhar Champaknath Nath , Curtis Wayne Rose
发明人： Thomas James Batzinger , Shridhar Champaknath Nath , Curtis Wayne Rose
IPC分类号： G01N27/90 , G01N27/82
CPC分类号： G01N27/9033
摘要： An omnidirectional eddy current probe includes a number of sense coils arranged in a stack having a principal axis. At least two of the sense coils are rotationally skewed about the principal axis relative to one another. The sense coils are operatively connected to each other and a drive coil is also positioned in the stack. An impulse through the drive coil induces a magnetic influx through a conducting material specimen having a surface, thereby generating eddy currents on the surface. Secondary magnetic field generated from the eddy currents produces corresponding signals in the sense coils, and the signals are then analyzed for the possibility of surface flaw in the conducting material.
摘要翻译：全向涡流探针包括布置在具有主轴的堆叠中的多个感测线圈。感测线圈中的至少两个相对于彼此围绕主轴旋转倾斜。感测线圈可操作地彼此连接，并且驱动线圈也位于堆叠中。通过驱动线圈的冲击通过具有表面的导电材料试样引起磁流入，从而在表面上产生涡流。从涡流产生的二次磁场在感测线圈中产生相应的信号，然后分析信号中导电材料表面缺陷的可能性。

6. 发明授权

US06812697B2 Molded eddy current array probe 有权
公开(公告)号：US06812697B2
公开(公告)日：2004-11-02
申请号：US10253848
申请日：2002-09-24
申请人： William Stewart McKnight , Shridhar Champaknath Nath , Sandie Elizabeth Gresham , Richard Lloyd Trantow , Douglas Edward Ingram , John William Ertel , Thomas James Batzinger , Curtis Wayne Rose , Francis Howard Little
发明人： William Stewart McKnight , Shridhar Champaknath Nath , Sandie Elizabeth Gresham , Richard Lloyd Trantow , Douglas Edward Ingram , John William Ertel , Thomas James Batzinger , Curtis Wayne Rose , Francis Howard Little
IPC分类号： G01N2790
CPC分类号： G01N27/9006 , G01N27/902 , G01N27/904
摘要： The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.

7. 发明授权

US06670808B2 Self reference eddy current probe, measurement system, and measurement method 有权
标题翻译：自参考涡流探头，测量系统和测量方法
公开(公告)号：US06670808B2
公开(公告)日：2003-12-30
申请号：US09682376
申请日：2001-08-27
申请人： Shridhar Champaknath Nath , Curtis Wayne Rose , Carl Stephen Lester , Thomas James Batzinger
发明人： Shridhar Champaknath Nath , Curtis Wayne Rose , Carl Stephen Lester , Thomas James Batzinger
IPC分类号： G01B706
CPC分类号： G01B7/105 , G01N27/904
摘要： A self referencing eddy current probe for determining conductive coating thickness includes a housing having a reference sample area, for accommodating a reference sample, and a testing edge, for positioning on a component during a coating thickness measurement. The eddy current probe further includes a reference eddy current coil situated in the housing adjacent to the reference sample area and a test eddy current coil, which is located at the testing edge. A self referencing eddy current measurement system, for measuring a thickness of a conductive coating on a component, includes the self referencing eddy current probe. The system further includes a signal generator for energizing the test and reference coils and a comparison module for comparing a test signal received from the test coil and a reference signal received from the reference coil and outputting a compared signal.
摘要翻译：用于确定导电涂层厚度的自参考涡流探针包括具有用于容纳参考样品的参考样品区域的壳体和用于在涂层厚度测量期间在组件上定位的测试边缘。涡流探头还包括位于壳体中的参考涡流线圈，其与参考样品区域相邻，并且测试涡流线圈位于测试边缘。用于测量部件上的导电涂层的厚度的自参考涡流测量系统包括自参考涡流探针。该系统还包括用于激励测试和参考线圈的信号发生器和用于比较从测试线圈接收的测试信号和从参考线圈接收的参考信号并输出比较信号的比较模块。

8. 发明授权

US06414483B1 Eddy current inspection method and apparatus for detecting flaws in an electrically conductive component 失效
标题翻译：用于检测导电部件中的缺陷的涡流检查方法和装置
公开(公告)号：US06414483B1
公开(公告)日：2002-07-02
申请号：US09627049
申请日：2000-07-27
申请人： Shridhar Champaknath Nath , Thomas James Batzinger , Curtis Wayne Rose , Paul Peter Stryjek
发明人： Shridhar Champaknath Nath , Thomas James Batzinger , Curtis Wayne Rose , Paul Peter Stryjek
IPC分类号： G01N2782
CPC分类号： G01N27/9006
摘要： A method of inspecting a preselected area of an electrically conductive component to determine whether flaws are present. The method includes the steps of permanently mounting an eddy current element on the component over the preselected area and energizing the element to generate alternating magnetic fields proximate the component. An electrical signal generated by a secondary magnetic field formed proximate the component is detected using the element and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw in the component. Inspection apparatus for performing this method is also disclosed.
摘要翻译：检查导电部件的预选区域以确定是否存在缺陷的方法。该方法包括以下步骤：将涡流元件永久性地安装在预选区域上的部件上，并激励该元件以产生接近该部件的交变磁场。使用元件检测由邻近分量形成的次级磁场产生的电信号，并将检测到的电信号与参考信号进行比较，以确定检测信号是否不同于参考信号。差异表明组件中存在缺陷。还公开了用于执行该方法的检查装置。

9. 发明授权

US07015690B2 Omnidirectional eddy current probe and inspection system 失效
标题翻译：全向涡流探头和检测系统
公开(公告)号：US07015690B2
公开(公告)日：2006-03-21
申请号：US10856381
申请日：2004-05-27
申请人： Changting Wang , Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , William Stewart McKnight , Gigi Olive Gambrell
发明人： Changting Wang , Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , William Stewart McKnight , Gigi Olive Gambrell
IPC分类号： G01N27/90 , G01N27/72
CPC分类号： G01N27/902 , G01N27/9033 , G01N27/904
摘要： An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.
摘要翻译：全向涡流（EC）探针包括至少一个具有第一和第二感测线圈的EC通道，该第一和第二感测线圈在第一（x）和第二（y）方向上偏移并且在至少一个方向（x， y）。至少一个驱动线圈被配置为在感测线圈附近产生用于EC通道的探测场。全方位的EC检测系统包括一个包括多个EC通道和驱动线圈的全向EC阵列探针（ECAP）。每个EC通道包括具有相反极性的第一和第二感测线圈。驱动线圈具有交替极性。电气连接对相应的EC通道执行差分感测。纠正驱动线圈设置在EC通道的相应末端并产生探测场。涡流仪器连接到全向ECAP，并从EC通道接收差分感测信号。

10. 发明授权

US08436608B2 Eddy current inspection system and method 有权
标题翻译：涡流检测系统及方法
公开(公告)号：US08436608B2
公开(公告)日：2013-05-07
申请号：US12563403
申请日：2009-09-21
申请人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
发明人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
IPC分类号： G01N27/82 , G01R33/14 , G01R33/00
CPC分类号： G01N27/904
摘要： A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
摘要翻译：提供多频涡流（MFEC）检测系统，用于检查零件上的表面硬化深度。 MFEC检查系统包括被配置为产生一个或多个多频激励信号的发生器和被配置为设置在该部分的一侧的涡流探针。涡流探头包括一个或多个驱动器和一个或多个拾取传感器。一个或多个驱动器被配置为接收一个或多个多频率激励信号以在该部分中引起涡流。一个或多个拾取传感器被配置为检测部件的局部区域内的感应涡流以产生一个或多个多频响应信号。 MFEC系统还包括处理器，其被配置为接收一个或多个多频响应信号以进行处理以确定部件的局部区域的壳体硬化深度。还提出了脉冲涡流检测系统和涡流检测方法。

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