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1. 发明授权

US08496113B2 Insert for carrier board of test handler 有权
标题翻译：插入测试处理程序的承载板
公开(公告)号：US08496113B2
公开(公告)日：2013-07-30
申请号：US12100729
申请日：2008-04-10
申请人： Yun-Sung Na , Tae-Hung Ku , Jae-Hyun Son , Dong-Han Kim , Young-Yong Kim
发明人： Yun-Sung Na , Tae-Hung Ku , Jae-Hyun Son , Dong-Han Kim , Young-Yong Kim
IPC分类号： B65D73/02
CPC分类号： G01R31/2893
摘要： An insert for a carrier board of a test handler is disclosed. In a first aspect, the latch block applying to the insert is detachably coupled to the insert body. The latch block can be reused, and thus this reduces wastage of resources and eliminates the insert replacement fee. In a second aspect, the insert pocket having hooks is detachably coupled to the insert body. The insert body can be reused. The latch unit is installed to the insert pocket, so that the damaged latch unit can be easily replaced. The insert forms a plurality of holes in the bottom of the loading part thereof, to expose the leads of the semiconductor devices through the holes downwardly. Thus, the insert can load semiconductor devices regardless of the dimensions of the semiconductor devices.
摘要翻译：公开了一种用于测试处理机的载板的插入件。在第一方面，应用于插入件的闩锁块可拆卸地联接到插入体。闩锁块可以重复使用，因此这减少了资源的浪费，并消除了插件更换费用。在第二方面，具有钩的插入口可拆卸地联接到插入体。插入体可以重复使用。闩锁单元安装到刀片槽中，从而可以方便地更换损坏的闩锁单元。插入件在其装载部分的底部形成多个孔，以通过孔向下暴露半导体器件的引线。因此，无论半导体器件的尺寸如何，插入件可以加载半导体器件。

2. 发明申请

US20080298946A1 Test Handler 有权
标题翻译：测试处理程序
公开(公告)号：US20080298946A1
公开(公告)日：2008-12-04
申请号：US12097398
申请日：2007-02-09
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： B65G1/133
CPC分类号： G01R31/2893 , G01R31/2886
摘要： A test handler is disclosed, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time. Also, the present invention can be easily applied to various types of testers.
摘要翻译：公开了一种测试处理器，其包括测试托盘，至少一个打开单元和位置改变装置。测试盘在其侧面对准多个插入件。每个插件在其上载入至少一个半导体器件。打开单元在测试托盘的一侧的一部分打开插入件。位置改变装置移动至少一个开口单元，使得至少一个开口单元可以位于测试托盘的一侧的另一部分，使得至少一个开口单元可以在所述另一个开口单元处打开插入件测试托盘一侧的一部分。本发明可以根据半导体器件尺寸，生产成本和部件更换时间的变化来减少更换部件的数量。此外，本发明可以容易地应用于各种类型的测试器。

3. 发明申请

US20070182437A1 Test handler and operation method thereof 有权
标题翻译：测试处理程序及其操作方法
公开(公告)号：US20070182437A1
公开(公告)日：2007-08-09
申请号：US11639418
申请日：2006-12-15
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/26
CPC分类号： G01R31/2867
摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.
摘要翻译：公开了一种测试处理程序。用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。

4. 发明授权

US08653845B2 Test handler and method for operating the same for testing semiconductor devices 有权
标题翻译：用于测试半导体器件的测试处理器和操作方法
公开(公告)号：US08653845B2
公开(公告)日：2014-02-18
申请号：US13296421
申请日：2011-11-15
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/20
CPC分类号： G01R31/2893 , G01R31/2886
摘要： A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.
摘要翻译：提供了一种测试处理器，其包括测试托盘，至少一个打开单元和位置改变装置。测试盘在其侧面对准多个插入件。每个插件在其上载入至少一个半导体器件。打开单元在测试托盘的一侧的一部分打开插入件。位置改变装置移动至少一个开口单元，使得至少一个开口单元可以位于测试托盘的一侧的另一部分，使得至少一个开口单元可以在所述另一个开口单元处打开插入件测试托盘一侧的一部分。本发明可以根据半导体器件尺寸，生产成本和部件更换时间的变化来减少更换部件的数量。

5. 发明授权

US08159252B2 Test handler and method for operating the same for testing semiconductor devices 有权
标题翻译：用于测试半导体器件的测试处理器和操作方法
公开(公告)号：US08159252B2
公开(公告)日：2012-04-17
申请号：US12097398
申请日：2007-02-09
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/20
CPC分类号： G01R31/2893 , G01R31/2886
摘要： A test handler and method for operating a test handler for testing semiconductor devices are provided. The test handler includes a test tray located on one side of an opening apparatus in which a plurality of inserts are arrayed, wherein each insert comprises at least one semiconductor device loaded thereon, at least one opening unit for opening inserts at one part of the one side of the test tray, and a position changing apparatus comprises a motor including a driving pulley for moving at least one opening unit along a contact surface of the test tray such that the at least one opening unit changes positions on the test tray and is located at another part of the one side of the test tray in order to open inserts at the other part of the one side of the test tray.
摘要翻译：提供了一种用于操作用于测试半导体器件的测试处理器的测试处理器和方法。测试处理器包括位于打开装置的一侧的测试托盘，其中排列有多个插入件，其中每个插入件包括装载在其上的至少一个半导体器件，至少一个开口单元，用于在一个部分处打开插入件并且位置改变装置包括电动机，其包括用于沿着测试托盘的接触表面移动至少一个开口单元的驱动滑轮，使得至少一个打开单元改变测试托盘上的位置并且位于在测试托盘的一侧的另一部分，以便在测试托盘的一侧的另一部分处打开插入件。

6. 发明申请

US20100001753A1 Position changing apparatus for test handler and power transferring apparatus 有权
标题翻译：用于测试处理器和动力传送装置的位置改变装置
公开(公告)号：US20100001753A1
公开(公告)日：2010-01-07
申请号：US12385790
申请日：2009-04-20
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/26 , G01R1/04
CPC分类号： G01R31/2867
摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.
摘要翻译：公开了一种测试处理程序。用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。

7. 发明授权

US07898271B2 Position changing apparatus for test handler and power transferring apparatus 有权
标题翻译：用于测试处理器和动力传送装置的位置改变装置
公开(公告)号：US07898271B2
公开(公告)日：2011-03-01
申请号：US12385790
申请日：2009-04-20
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/00
CPC分类号： G01R31/2867
摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.
摘要翻译：公开了一种测试处理程序。用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。

8. 发明授权

US07538542B2 Test handler and operation method thereof 有权
标题翻译：测试处理程序及其操作方法
公开(公告)号：US07538542B2
公开(公告)日：2009-05-26
申请号：US11639418
申请日：2006-12-15
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/26
CPC分类号： G01R31/2867
摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.
摘要翻译：公开了一种测试处理程序。用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。

9. 发明授权

US08026735B2 Test handler 有权
标题翻译：测试处理程序
公开(公告)号：US08026735B2
公开(公告)日：2011-09-27
申请号：US12368930
申请日：2009-02-10
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jae-Sung Park , Su-Myung Lee
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jae-Sung Park , Su-Myung Lee
IPC分类号： G01R31/26 , G01R31/28
CPC分类号： G01R31/2893
摘要： A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.
摘要翻译：在本发明中公开了一种测试处理器。测试处理器可以包括其上布置有多个插入件以装载至少一个半导体器件的测试托盘，用于同时打开排列在测试托盘的一部分上的多个插入件的一部分的至少一个开口单元，以及测试托盘传送装置，用于允许打开单元同时打开在传送测试托盘时排列在测试托盘的另一部分上的多个插入件的其他部分。因此，尽管要测试的半导体器件改变其尺寸，但是测试处理器的更换部件数量减少，从而降低制造成本和更换工作时间。本发明的测试处理器减少半导体器件的加载时间，减少干扰，提高教学效率并提高空间利用效率。此外，测试处理程序可以应用于各种类型的测试器。

10. 发明申请

US20100001739A1 TEST TRAY FOR TEST HANDLER 有权
标题翻译：测试托盘测试托盘
公开(公告)号：US20100001739A1
公开(公告)日：2010-01-07
申请号：US12513039
申请日：2007-10-22
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jung-Woo Hwang
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jung-Woo Hwang
IPC分类号： H01H31/02
CPC分类号： G01R31/2893
摘要： A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.
摘要翻译：公开了一种用于测试处理器的测试盘，其装载有半导体器件，然后沿着预定的循环路线携带它们。测试托盘允许一个固定单元将多个相邻的插入模块固定到框架的接收空间，从而有效地使用框架的空间并且允许相对大量的插入模块安装在相同的区域中到常规的测试托盘。

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