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1. 发明申请

US20090222213A1 AUTOMATIC ANALYZER 审中-公开
标题翻译：自动分析仪
公开(公告)号：US20090222213A1
公开(公告)日：2009-09-03
申请号：US12388845
申请日：2009-02-19
申请人： Yuko HAMAZUMI , Tomonori Mimura , Yuki Fukuyama
发明人： Yuko HAMAZUMI , Tomonori Mimura , Yuki Fukuyama
IPC分类号： G01N33/48 , G06F19/00
CPC分类号： G01N35/00663 , G01N2035/00673
摘要： The present invention provides an index that makes it possible to use, in an automatic analyzer, an approximate expression based on a theoretical chemical reaction formula derived from reaction process data, and automatically check for apparatus abnormalities, reagent deteriorations, and improper accuracy control during each continuous or individual inspection.Reaction process data, which is measured when the automatic analyzer determines the relationship between reaction absorbance and time, is approximated to ABS=A0+A1 (1−e−kt) by the least-squares method. The resulting reaction start point absorbance A0, final reaction absorbance A1, reaction rate constant k, and residual error, which is the aggregate sum of differences between approximate values and measured values, are then used as the index of reaction status.
摘要翻译：本发明提供一种能够在自动分析装置中使用基于从反应过程数据导出的理论化学反应式的近似表达式的指标，并且可以自动检查装置异常，试剂恶化和每次检测中的不正确的精度控制连续或个别检查。当自动分析仪确定反应吸光度和时间之间的关系时测量的反应过程数据通过最小二乘法近似为ABS = A0 + A1（1-e-kt）。然后将所得到的反应起点吸光度A0，最终反应吸光度A1，反应速率常数k和剩余误差（即近似值和测量值之间的差值的总和）用作反应状态的指标。

2. 发明申请

US20110125415A1 METHOD FOR ASSISTING JUDGMENT OF ABNORMALITY OF REACTION PROCESS DATA AND AUTOMATIC ANALYZER 有权
标题翻译：协助反应过程数据异常判断的方法和自动分析仪
公开(公告)号：US20110125415A1
公开(公告)日：2011-05-26
申请号：US12995219
申请日：2009-05-28
申请人： Satoshi Mitsuyama , Yuki Fukuyama , Hidekatsu Takada , Hideyuki Ban , Tomonori Mimura
发明人： Satoshi Mitsuyama , Yuki Fukuyama , Hidekatsu Takada , Hideyuki Ban , Tomonori Mimura
IPC分类号： G06F19/00 , G01N35/00 , G01N21/00
CPC分类号： G01N21/77 , G01N21/272 , G01N21/78 , G01N35/00603 , G01N2035/0097
摘要： In the event of a suspected abnormality in the device, sample or reagent, a laboratory technician had to examine the abnormal reaction process data item by item, and infer the cause of the abnormality, which took effort and time in some cases. Abnormality judgment is assisted using: indicator computation means that computes an indicator indicating a feature parameter of a given waveform by applying a pre-defined evaluation formula to time series data of photometric values; relative indicator computation means that computes a value indicating a relationship of the indicator of target data to the indicator computed in the past; and indicator display means that simultaneously displays a value computed by the indicator computation means and the value computed by the relative indicator computation means. According to the present method, which is a method for assisting judgment of abnormality wherein a feature parameter of a given absorbance change is computed, it can be made easier to find certain abnormalities, and it becomes possible to attain more efficient device maintenance and improved device reliability without the addition of any new parts.
摘要翻译：如果装置，样品或试剂中有疑似异常，实验室技术人员必须逐项检查异常反应过程数据，并推断异常的原因，在某些情况下花费时间和精力。协助使用以下方式辅助异常判断：指标计算装置，通过对光度值的时间序列数据应用预定义的评估公式来计算指示给定波形的特征参数的指标; 相对指标计算是指计算出目标数据指标与过去计算出的指标的关系的值; 指示符显示装置，同时显示由指标计算装置计算的值和由相关指标计算装置计算的值。根据本方法，其是计算给定吸光度变化的特征参数的异常判断方法，可以更容易地发现某些异常，并且可以实现更有效的装置维护和改进装置可靠性无需添加任何新零件。

3. 发明授权

US09217712B2 Method for assisting judgment of abnormality of reaction process data and automatic analyzer 有权
标题翻译：协助判断反应过程数据异常和自动分析仪的方法
公开(公告)号：US09217712B2
公开(公告)日：2015-12-22
申请号：US12995219
申请日：2009-05-28
申请人： Satoshi Mitsuyama , Yuki Fukuyama , Hidekatsu Takada , Hideyuki Ban , Tomonori Mimura
发明人： Satoshi Mitsuyama , Yuki Fukuyama , Hidekatsu Takada , Hideyuki Ban , Tomonori Mimura
IPC分类号： G06F19/00 , G01N35/00 , G01N21/00 , G01N21/77
CPC分类号： G01N21/77 , G01N21/272 , G01N21/78 , G01N35/00603 , G01N2035/0097
摘要： In the event of a suspected abnormality in the device, sample or reagent, a laboratory technician had to examine the abnormal reaction process data item by item, and infer the cause of the abnormality, which took effort and time in some cases. Abnormality judgment is assisted using: indicator computation means that computes an indicator indicating a feature parameter of a given waveform by applying a pre-defined evaluation formula to time series data of photometric values; relative indicator computation means that computes a value indicating a relationship of the indicator of target data to the indicator computed in the past; and indicator display means that simultaneously displays a value computed by the indicator computation means and the value computed by the relative indicator computation means. According to the present method, which is a method for assisting judgment of abnormality wherein a feature parameter of a given absorbance change is computed, it can be made easier to find certain abnormalities, and it becomes possible to attain more efficient device maintenance and improved device reliability without the addition of any new parts.
摘要翻译：如果装置，样品或试剂中有疑似异常，实验室技术人员必须逐项检查异常反应过程数据，并推断异常的原因，在某些情况下花费时间和精力。协助使用以下方式辅助异常判断：指标计算装置，通过对光度值的时间序列数据应用预定义的评估公式来计算指示给定波形的特征参数的指标; 相对指标计算是指计算出目标数据指标与过去计算出的指标的关系的值; 指示符显示装置，同时显示由指标计算装置计算的值和由相关指标计算装置计算的值。根据本方法，其是计算给定吸光度变化的特征参数的异常判断方法，可以更容易地发现某些异常，并且可以实现更有效的装置维护和改进装置可靠性无需添加任何新零件。

4. 发明申请

US20130088512A1 EXAMINATION INFORMATION DISPLAY DEVICE AND METHOD 有权
标题翻译：检查信息显示装置和方法
公开(公告)号：US20130088512A1
公开(公告)日：2013-04-11
申请号：US13638591
申请日：2011-03-23
申请人： Masato Suzuki , Maiko Kawase , Yayoi Shitara , Yuki Fukuyama
发明人： Masato Suzuki , Maiko Kawase , Yayoi Shitara , Yuki Fukuyama
IPC分类号： G09G5/377
CPC分类号： G09G5/377 , A61B5/055 , A61B6/03 , A61B6/463 , G06F19/00 , G06Q10/06 , G06Q50/22 , G16H10/60
摘要： An examination information display device of the present invention includes: a storage unit that stores examination information of an object; a display unit that has a display screen on which the examination information is displayed; an extraction unit that extracts candidate examination information, which is a candidate referred to or compared with a reference examination to be diagnosed, using supplementary information of the examination information of the object stored in the storage unit; and a display control unit that displays the candidate examination information in a predetermined display region of the display screen.
摘要翻译：本发明的检查信息显示装置包括：存储单元，存储对象的检查信息; 显示单元，其具有显示检查信息的显示屏幕; 提取单元，使用存储在存储单元中的对象的检查信息的补充信息来提取作为要诊断的参考检查的参考或比较的候选检查信息; 以及显示控制单元，其将候选检查信息显示在显示屏幕的预定显示区域中。

5. 发明授权

US08929627B2 Examination information display device and method 有权
标题翻译：检查信息显示装置及方法
公开(公告)号：US08929627B2
公开(公告)日：2015-01-06
申请号：US13638591
申请日：2011-03-23
申请人： Masato Suzuki , Maiko Kawase , Yayoi Shitara , Yuki Fukuyama
发明人： Masato Suzuki , Maiko Kawase , Yayoi Shitara , Yuki Fukuyama
IPC分类号： G06K9/00 , G09G5/377 , A61B6/00 , G06F19/00 , G06Q10/06 , G06Q50/22 , A61B5/055 , A61B6/03
CPC分类号： G09G5/377 , A61B5/055 , A61B6/03 , A61B6/463 , G06F19/00 , G06Q10/06 , G06Q50/22 , G16H10/60
摘要： An examination information display device of the present invention includes: a storage unit that stores examination information of an object; a display unit that has a display screen on which the examination information is displayed; an extraction unit that extracts candidate examination information, which is a candidate referred to or compared with a reference examination to be diagnosed, using supplementary information of the examination information of the object stored in the storage unit; and a display control unit that displays the candidate examination information in a predetermined display region of the display screen.
摘要翻译：本发明的检查信息显示装置包括：存储单元，存储对象的检查信息; 显示单元，其具有显示检查信息的显示屏幕; 提取单元，使用存储在存储单元中的对象的检查信息的补充信息来提取作为要诊断的参考检查的参考或比较的候选检查信息; 以及显示控制单元，其将候选检查信息显示在显示屏幕的预定显示区域中。

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