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    • 1. 发明申请
    • Measuring Apparatus and Measuring Method
    • 测量仪器和测量方法
    • US20090040522A1
    • 2009-02-12
    • US12224491
    • 2007-02-16
    • Yukitoshi OtaniNaoki AsatoToshitaka Wakayama
    • Yukitoshi OtaniNaoki AsatoToshitaka Wakayama
    • G01N21/21
    • G01N21/21G01J4/04G01N21/23
    • A measuring apparatus that measures the polarization state of analysis target light includes a modulation section 20 that includes a retarder 22 and an analyzer 24, a light intensity information acquisition section 30 that acquires light intensity information about modulated light obtained by modulating the analysis target light at the modulation section, and a calculation section 50 that calculates a polarization characteristic element of the analysis target light based on the light intensity information. The light intensity information acquisition section acquires the light intensity information about first modulated light to Nth modulated light respectively obtained by modulating the analysis target light at the modulation section set under first to Nth principal axis direction conditions which differ in the principal axis direction of at least one of the retarder and the analyzer. The calculation section calculates the polarization characteristic element based on a light intensity theoretical expression for the first modulated light to the Nth modulated light and first light intensity information to Nth light intensity information.
    • 测量分析对象光的偏振状态的测量装置包括:调制部20,其包括延迟器22和分析器24;光强度信息获取部30,其获取通过调制分析对象光获得的调制光的光强度信息 调制部,以及基于光强度信息计算分析对象光的偏振特性元素的计算部50。 光强度信息获取部获取通过调制在至少主轴方向上不同的第一至第N主轴方向条件下设定的调制部分的分析目标光,分别获得关于第一调制光至第N调制光的光强度信息 减速器和分析仪之一。 计算部基于第一调制光对第N调制光和第一光强度信息的光强度理论表达式计算偏振特性元素至第N光强度信息。