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    • 8. 发明授权
    • Nano-particles and process for producing nano-particles
    • 纳米颗粒和生产纳米颗粒的方法
    • US07297298B2
    • 2007-11-20
    • US10738092
    • 2003-12-18
    • Yuki MatsunamiShintaro Washizu
    • Yuki MatsunamiShintaro Washizu
    • B29B9/00
    • B01J13/02A61K8/11A61K2800/413A61Q13/00A61Q19/00
    • It is an object of the present invention to provide a process for producing nano-particles, capable of efficiently producing monodisperse nano-particles substantially uniform in particle size and composition, and freely controllable in particle size and composition at low cost. The process for producing nano-particles comprises a particle precursor capturing step in which a liquid containing the particle precursor is incorporated in another liquid containing dendritic branching molecules to capture the particle precursor by the dendritic branching molecule, and particle forming step in which the particle precursor captured by the dendritic branching molecule is transformed into the particle.
    • 本发明的目的是提供一种纳米粒子的制造方法,其能够有效地制造粒径,组成等基本均匀的单分散纳米粒子,能够以低成本自由控制粒径和组成。 制备纳米颗粒的方法包括:颗粒前体捕获步骤,其中将含有颗粒前体的液体引入含有树突状支化分子的另一液体中以通过树枝状支化分子捕获颗粒前体,以及颗粒形成步骤,其中颗粒前体 被树枝状支化分子捕获的物质被转化成颗粒。
    • 9. 发明申请
    • Fine structure body, process for producing the same, and Raman spectroscopic method and apparatus
    • 精细结构体,其制造方法和拉曼光谱方法和装置
    • US20070118936A1
    • 2007-05-24
    • US11601822
    • 2006-11-20
    • Yuki Matsunami
    • Yuki Matsunami
    • C30B23/00
    • G01N21/658B22F2998/00B82Y15/00G01J3/44Y10T117/1008B22F1/0025
    • A fine structure body comprises: (i) a base body, and (ii) a plurality of metal nanorods, which have been distributed and located on a surface of the base body, a proportion X being equal to at least 15%, the proportion X being calculated with the formula: X=(A−B)/C×100[%]wherein A represents the sum total of the projected areas of all of the metal nanorods, B represents the sum total of the projected areas of certain metal nanorods, each of which is located as an isolated metal nanorod at a spacing larger than 10 nm from the closest metal nanorod, and C represents the entire projected area of the fine. structure body, including regions free from the metal nanorods.
    • 精细结构体包括:(i)基体,和(ii)分布并位于基体表面上的多个金属纳米棒,比例X等于至少15%,比例 X用公式计算:<?in-line-formula description =“In-line Formulas”end =“lead”?> X =(AB)/ Cx100 [%] <?in-line-formula description =“In 线公式“end =”tail“?>其中A表示所有金属纳米棒的投影面积的总和,B表示某些金属纳米棒的投影面积的总和,每个金属纳米棒各自位于隔离层 金属纳米棒的距离最近的金属纳米棒的距离大于10nm,C代表整个投影面积。 结构体,包括不含金属纳米棒的区域。
    • 10. 发明授权
    • Target detecting apparatus, target detection method and target detection substrate
    • 目标检测装置,目标检测方法和目标检测基板
    • US07202954B2
    • 2007-04-10
    • US10733450
    • 2003-12-12
    • Shintaro WashizuYuki MatsunamiTakatoshi Kinoshita
    • Shintaro WashizuYuki MatsunamiTakatoshi Kinoshita
    • G01J3/45
    • G01N33/54373Y10T436/11
    • A target detection apparatus is provided which can detect and quantitatively measure various detection targets such as pathogens. For this purpose, the apparatus comprises an optical irradiation unit which irradiates light; an optical interference unit which can interact with the detection target, interferes with the light irradiated from the optical irradiation unit and radiates it as interference light and change the wavelength of the interference light after interaction with the detection target; and an wavelength change detecting unit which detects the wavelength change of the interference light radiated by the optical interference unit. The wavelength change detecting unit preferably measures spectrums before and after wavelength change of the interference light, and their differential spectrum. Also provided is a target detection substrate comprising a film-like material on a substrate which, when interacting with a detection target, changes the wavelength of the interference light.
    • 提供了可以检测和定量测量各种检测目标如病原体的目标检测装置。 为此,该装置包括照射光的光照射单元; 能够与检测对象物相互作用的光干涉单元,干涉从光照射单元照射的光并将其照射为干涉光,并在与检测对象物相互作用后改变干涉光的波长; 以及波长变化检测单元,其检测由所述光学干涉单元辐射的干涉光的波长变化。 波长变化检测单元优选地测量干涉光的波长变化前后的光谱及其差分光谱。 还提供了一种目标检测基板,其包括在基板上的膜状材料,当与检测对象相互作用时,改变干涉光的波长。