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1. 发明授权

US06841405B2 Photomask for test wafers 失效
标题翻译：用于测试晶片的光掩模
公开(公告)号：US06841405B2
公开(公告)日：2005-01-11
申请号：US10269268
申请日：2002-10-10
申请人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Aritoshi Sugimoto , Kazuyuki Tsunokuni
发明人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Aritoshi Sugimoto , Kazuyuki Tsunokuni
IPC分类号： G01R31/28 , H01L21/00
CPC分类号： G01R31/2812 , G01R31/2818
摘要： A manufacturing method of an electronic device is to improve test efficiency using test structure and improve yield. The manufacturing method performs test using a first lead wire disposed on an insulating layer formed on a substrate and a second lead wire electrically connected to the substrate and disposed on the insulating layer and manages the electronic device on the basis of results of the test to manufacture the electronic device. The manufacturing method includes a step of testing whether the first lead wire is disconnected or not by measuring an electric resistance between both ends of the first lead wire and a step of testing whether the first and second lead wires are short-circuited or not by measuring an electric resistance between the first lead wire and the substrate.
摘要翻译：电子设备的制造方法是使用测试结构提高测试效率并提高产量。该制造方法使用设置在形成于基板上的绝缘层上的第一引线和与基板电连接并设置在绝缘层上的第二引线进行测试，并基于制造试验的结果来管理电子设备电子设备。该制造方法包括通过测量第一引线的两端之间的电阻和通过测量第一和第二引线是否短路的步骤来测试第一引线是否断开的步骤第一引线与基板之间的电阻。

2. 发明授权

US06895346B2 Method for test conditions 失效
标题翻译：测试条件的方法
公开(公告)号：US06895346B2
公开(公告)日：2005-05-17
申请号：US10269127
申请日：2002-10-10
申请人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Kazuyuki Tsunokuni , Aritoshi Sugimoto
发明人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Kazuyuki Tsunokuni , Aritoshi Sugimoto
IPC分类号： G01R31/28 , G06F19/00 , H01L21/00
CPC分类号： G01R31/2812 , G01R31/2818
摘要： A manufacturing method of an electronic device is to improve test efficiency using test structure and improve yield. The manufacturing method performs test using a first lead wire disposed on an insulating layer formed on a substrate and a second lead wire electrically connected to the substrate and disposed on the insulating layer and manages the electronic device on the basis of results of the test to manufacture the electronic device. The manufacturing method includes a step of testing whether the first lead wire is disconnected or not by measuring an electric resistance between both ends of the first lead wire and a step of testing whether the first and second lead wires are short-circuited or not by measuring an electric resistance between the first lead wire and the substrate.
摘要翻译：电子设备的制造方法是使用测试结构提高测试效率并提高产量。该制造方法使用设置在形成于基板上的绝缘层上的第一引线和与基板电连接并设置在绝缘层上的第二引线进行测试，并基于制造试验的结果来管理电子设备电子设备。该制造方法包括通过测量第一引线的两端之间的电阻和通过测量第一和第二引线是否短路的步骤来测试第一引线是否断开的步骤第一引线与基板之间的电阻。

3. 发明授权

US06771077B2 Method of testing electronic devices indicating short-circuit 失效
标题翻译：测试表示短路的电子设备的方法
公开(公告)号：US06771077B2
公开(公告)日：2004-08-03
申请号：US10126263
申请日：2002-04-19
申请人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Aritoshi Sugimoto , Kazuyuki Tsunokuni
发明人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Aritoshi Sugimoto , Kazuyuki Tsunokuni
IPC分类号： G01R3102
CPC分类号： G01R31/2812 , G01R31/2818
摘要： A manufacturing method of an electronic device is to improve test efficiency using test structure and improve yield. The manufacturing method performs test using a first lead wire disposed on an insulating layer formed on a substrate and a second lead wire electrically connected to the substrate and disposed on the insulating layer and manages the electronic device on the basis of results of the test to manufacture the electronic device. The manufacturing method includes a step of testing whether the first lead wire is disconnected or not by measuring an electric resistance between both ends of the first lead wire and a step of testing whether the first and second lead wires are short-circuited or not by measuring an electric resistance between the first lead wire and the substrate.
摘要翻译：电子设备的制造方法是使用测试结构提高测试效率并提高产量。该制造方法使用设置在形成于基板上的绝缘层上的第一引线和与基板电连接并设置在绝缘层上的第二引线进行测试，并基于制造试验的结果来管理电子设备电子设备。该制造方法包括通过测量第一引线的两端之间的电阻和通过测量第一和第二引线是否短路的步骤来测试第一引线是否断开的步骤第一引线与基板之间的电阻。

4. 发明授权

US06770496B2 Method of testing electronic devices 失效
标题翻译：电子设备测试方法
公开(公告)号：US06770496B2
公开(公告)日：2004-08-03
申请号：US10269411
申请日：2002-10-10
申请人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Aritoshi Sugimoto , Kazuyuki Tsunokuni
发明人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Aritoshi Sugimoto , Kazuyuki Tsunokuni
IPC分类号： H01L2166
CPC分类号： G01R31/2812 , G01R31/2818
摘要： A manufacturing method of an electronic device is to improve test efficiency using test structure and improve yield. The manufacturing method performs test using a first lead wire disposed on an insulating layer formed on a substrate and a second lead wire electrically connected to the substrate and disposed on the insulating layer and manages the electronic device on the basis of results of the test to manufacture the electronic device. The manufacturing method includes a step of testing whether the first lead wire is disconnected or not by measuring an electric resistance between both ends of the first lead wire and a step of testing whether the first and second lead wires are short-circuited or not by measuring an electric resistance between the first lead wire and the substrate.
摘要翻译：电子设备的制造方法是使用测试结构提高测试效率并提高产量。该制造方法使用设置在形成于基板上的绝缘层上的第一引线和与基板电连接并设置在绝缘层上的第二引线进行测试，并基于制造试验的结果来管理电子设备电子设备。该制造方法包括通过测量第一引线的两端之间的电阻和通过测量第一和第二引线是否短路的步骤来测试第一引线是否断开的步骤第一引线与基板之间的电阻。

5. 发明授权

US06780660B2 System for testing electronic devices 失效
标题翻译：电子设备测试系统
公开(公告)号：US06780660B2
公开(公告)日：2004-08-24
申请号：US10269199
申请日：2002-10-10
申请人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Aritoshi Sugimoto , Kazuyuki Tsunokuni
发明人： Yuichi Hamamura , Takaaki Kumazawa , Hisao Asakura , Aritoshi Sugimoto , Kazuyuki Tsunokuni
IPC分类号： H01L2166
CPC分类号： G01R31/2812 , G01R31/2818
摘要： A manufacturing method of an electronic device is to improve test efficiency using test structure and improve yield. The manufacturing method performs test using a first lead wire disposed on an insulating layer formed on a substrate and a second lead wire electrically connected to the substrate and disposed on the insulating layer and manages the electronic device on the basis of results of the test to manufacture the electronic device. The manufacturing method includes a step of testing whether the first lead wire is disconnected or not by measuring an electric resistance between both ends of the first lead wire and a step of testing whether the first and second lead wires are short-circuited or not by measuring an electric resistance between the first lead wire and the substrate.
摘要翻译：电子设备的制造方法是使用测试结构提高测试效率并提高产量。该制造方法使用设置在形成于基板上的绝缘层上的第一引线和与基板电连接并设置在绝缘层上的第二引线进行测试，并基于制造试验的结果来管理电子设备电子设备。该制造方法包括通过测量第一引线的两端之间的电阻和通过测量第一和第二引线是否短路的步骤来测试第一引线是否断开的步骤第一引线与基板之间的电阻。

6. 发明授权

US06704495B1 Audio-video device reproducing apparatus 有权
标题翻译：音频 - 视频设备再现设备
公开(公告)号：US06704495B1
公开(公告)日：2004-03-09
申请号：US09246960
申请日：1999-02-09
申请人： Takaaki Kumazawa , Genichi Yamada , Ko Hamano , Tadashi Maeoka , Yoshihiro Fujimoto , Takamichi Nakagawa
发明人： Takaaki Kumazawa , Genichi Yamada , Ko Hamano , Tadashi Maeoka , Yoshihiro Fujimoto , Takamichi Nakagawa
IPC分类号： H04N5781
CPC分类号： H04N21/41407 , G11B33/025 , G11B33/10 , H04N5/85 , H04N21/4325
摘要： An audio-video playback device in which a plane formed by the right sides of the device body and a plane formed by the right side of the monitor portion are on a substantially same plane, and the plane is substantially orthogonal to the rotation axis (R-R) of rotatably supporting portions. The center of gravity of the device body is located toward the right side, whereby the stable side-down setting of the device in the manner that the right sides (1R and 2R) face downward is realized. While, operation switches and the like are not disposed on the right sides, a user lying down can operate the device and watch natural display images and listen to natural sounds if the device is sidewards.
摘要翻译：一种音频视频播放装置，其中由装置主体的右侧形成的平面和由监视器部分的右侧形成的平面在大致相同的平面上，并且该平面基本上与旋转轴线（RR ）可旋转地支撑部分。装置主体的重心位于右侧，从而实现装置的右侧（1R和2R）朝下的方式的稳定的侧向下降设定。而在右侧没有设置操作开关等的情况下，躺下的用户可以操作设备并观看自然的显示图像，并且如果设备是侧向的话则收听自然的声音。

7. 发明申请

US20060053070A1 Parts table management system, parts table preparation method and program 审中-公开
标题翻译：零件表管理系统，零件表的准备方法和程序
公开(公告)号：US20060053070A1
公开(公告)日：2006-03-09
申请号：US11218764
申请日：2005-09-06
申请人： Takaaki Kumazawa
发明人： Takaaki Kumazawa
IPC分类号： G06F17/00
CPC分类号： G06F17/50 , G06F2217/38 , G06Q10/087
摘要： The system comprises a design information management unit for storing the parts information including each part number to identify a product and a part of the product corresponding to the part number and the quantity of the product and a child part of the part, the subsidiary part information including each subsidiary part number for identifying the subsidiary part and the corresponding subsidiary part number and quantity of the child part of the subsidiary part, and the relating information including each combination of a part number and a part category with the corresponding subsidiary part number. The design information management unit, by specifying the part number and the subsidiary part number corresponding to the part number and the part category for identifying the designated product, prepares a parts table indicating the part number for identifying the designated product, the specified part number and the specified subsidiary part number with the quantity thereof.
摘要翻译：该系统包括设计信息管理单元，用于存储包括每个部件号的部件信息，以识别对应于产品的部件号和产品数量和部件的子部分的产品和部分产品，辅助部件信息包括用于确定子公司部分的每个附属部件号以及子部件的子部件的相应子部件号和数量，以及包括部件号和部件类别的每个组合的相关信息以及相应的辅助部件号。设计信息管理单元通过指定与部件号相对应的部件号和辅助部件号以及用于识别指定产品的部件类别，准备表示用于识别指定产品的部件号的部件表，指定部件号和具有其数量的指定附属部件号。

8. 发明授权

US07899567B2 Method and program for selecting product to be inspected 有权
标题翻译：选择待检查产品的方法和程序
公开(公告)号：US07899567B2
公开(公告)日：2011-03-01
申请号：US12109769
申请日：2008-04-25
申请人： Masataka Tanaka , Takaaki Kumazawa , Masayuki Ichinohe
发明人： Masataka Tanaka , Takaaki Kumazawa , Masayuki Ichinohe
IPC分类号： G06F19/00 , G01N37/00
CPC分类号： G05B19/41875 , G05B2219/32203 , Y02P80/40 , Y02P90/20 , Y02P90/22 , Y02P90/265
摘要： An inspection-required product selection method and program for minimizing the number of investigation steps at the time of a defect occurrence for a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the information on the material lots used for a product lot scheduled for production for a predetermined future period and the number of the product lots inspected during the same period. The number of the material lots not included in the product lots to be inspected is totalized for each product lot, and the statistical values are calculated for all the conceivable combinations of the product lots. The combination of the product lots optimizing the statistical values is selected for inspection.
摘要翻译：公开了一种检查要求的产品选择方法和程序，用于在放置在市场上的产品的缺陷发生时最小化调查步骤的数量。根据预定未来期间预定生产的产品批次的材料批次和同期检验的产品批次的数量，假定要检查的产品批次的组合。对于每个产品批次，不包括待检查的产品批次的材料批次数量，并对所有可能的产品批次组合计算统计值。选择优化统计值的产品批次的组合进行检查。

9. 发明申请

US20080208473A1 METHOD FOR CALCULATING ENVIRONMENTAL LOAD, PROGRAM FOR CALCULATING ENVIRONMENTAL LOAD, AND METHOD FOR CONVERTING UNITS 有权
标题翻译：计算环境负荷的方法，计算环境负荷的计划和转换单位的方法
公开(公告)号：US20080208473A1
公开(公告)日：2008-08-28
申请号：US11943966
申请日：2007-11-21
申请人： Takaaki Kumazawa , Noriaki Yamamoto , Yoshiharu Sekiya
发明人： Takaaki Kumazawa , Noriaki Yamamoto , Yoshiharu Sekiya
IPC分类号： G06F19/00
CPC分类号： G06Q10/06 , Y02P90/84
摘要： A technology is provided in which it is not necessary to modify a system on a production side, and in which man-hours required for registering an environmental load value on a supplier side are not increased, in cases of an item having a mismatch between units, in a process of adding up the environmental load values of a post-production product. The technology includes generating correction information for calculating the environmental load that is registered by the supplier at design time, and calculating the environmental load value at design time by using the correction information. In cases of calculating the environmental load value of a product actually produced from a designed product, the environmental load value is calculated using the correction information generated at design time.
摘要翻译：提供了一种技术，其中不需要修改生产方的系统，并且在不具有在单元之间不匹配的项目的情况下，在供应方侧注册环境负荷值所需的工时不增加的技术在加工后期制作产品的环境负荷值的过程中。该技术包括生成用于计算在设计时由供应商注册的环境负荷的校正信息，以及通过使用校正信息来计算设计时的环境负荷值。在计算从设计产品实际产生的产品的环境负荷值的情况下，使用在设计时生成的校正信息来计算环境负荷值。

10. 发明授权

US07840361B2 Method for calculating environmental load, program for calculating environmental load, and method for converting units 有权
标题翻译：环境负荷计算方法，环境负荷计算方法以及转换单位的方法
公开(公告)号：US07840361B2
公开(公告)日：2010-11-23
申请号：US11943966
申请日：2007-11-21
申请人： Takaaki Kumazawa , Noriaki Yamamoto , Yoshiharu Sekiya
发明人： Takaaki Kumazawa , Noriaki Yamamoto , Yoshiharu Sekiya
IPC分类号： G01N31/00
CPC分类号： G06Q10/06 , Y02P90/84
摘要： A technology is provided in which it is not necessary to modify a system on a production side, and in which man-hours required for registering an environmental load value on a supplier side are not increased, in cases of an item having a mismatch between units, in a process of adding up the environmental load values of a post-production product. The technology includes generating correction information for calculating the environmental load that is registered by the supplier at design time, and calculating the environmental load value at design time by using the correction information. In cases of calculating the environmental load value of a product actually produced from a designed product, the environmental load value is calculated using the correction information generated at design time.
摘要翻译：提供了一种技术，其中不需要修改生产方的系统，并且在不具有在单元之间不匹配的项目的情况下，在供应方侧注册环境负荷值所需的工时不增加的技术在加工后期制作产品的环境负荷值的过程中。该技术包括生成用于计算在设计时由供应商注册的环境负荷的校正信息，以及通过使用校正信息来计算设计时的环境负荷值。在计算从设计产品实际产生的产品的环境负荷值的情况下，使用在设计时生成的校正信息来计算环境负荷值。

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