专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07729884B2 Compactor independent direct diagnosis of test hardware 有权
标题翻译：压缩机独立直接诊断测试硬件
公开(公告)号：US07729884B2
公开(公告)日：2010-06-01
申请号：US11267221
申请日：2005-11-04
申请人： Yu Huang , Wu-Tung Cheng , Janusz Rajski
发明人： Yu Huang , Wu-Tung Cheng , Janusz Rajski
IPC分类号： G06F11/30 , G06F11/00
CPC分类号： G01R31/318547 , G06F11/267 , G06F11/27
摘要： Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In one exemplary embodiment, a failure log is received including entries indicative of compressed test responses to chain patterns and compressed test responses to scan patterns. A faulty scan chain in the circuit-under-test is identified based at least in part on one or more of the entries indicative of the compressed test responses to chain patterns. One or more faulty scan cell candidates in the faulty scan chain are identified based at least in part on one or more of the entries indicative of the compressed test responses to scan patterns. The one or more identified scan cell candidates can be reported. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media storing lists of fault candidates identified by any of the disclosed methods are also provided.
摘要翻译：本文公开了用于执行故障诊断的方法，装置和系统。在一个示例性实施例中，接收到故障日志，包括指示针对链图案的压缩测试响应的条目和对扫描模式的压缩测试响应。至少部分地基于指示压缩的测试对链模式的测试响应的一个或多个条目来识别被测电路中的有缺陷的扫描链。至少部分地基于指示对扫描模式的压缩测试响应的一个或多个条目来识别故障扫描链中的一个或多个错误的扫描小区候选。可以报告一个或多个识别的扫描单元候选。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的计算机可读介质。同样，还提供了存储通过任何所公开的方法识别的故障候选列表的计算机可读介质。

2. 发明申请

US20060111873A1 Compactor independent direct diagnosis of test hardware 有权
标题翻译：压缩机独立直接诊断测试硬件
公开(公告)号：US20060111873A1
公开(公告)日：2006-05-25
申请号：US11267221
申请日：2005-11-04
申请人： Yu Huang , Wu-Tung Cheng , Janusz Rajski
发明人： Yu Huang , Wu-Tung Cheng , Janusz Rajski
IPC分类号： G21C17/00
CPC分类号： G01R31/318547 , G06F11/267 , G06F11/27
摘要： Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In one exemplary embodiment, a failure log is received comprising entries indicative of compressed test responses to chain patterns and compressed test responses to scan patterns. A faulty scan chain in the circuit-under-test is identified based at least in part on one or more of the entries indicative of the compressed test responses to chain patterns. One or more faulty scan cell candidates in the faulty scan chain are identified based at least in part on one or more of the entries indicative of the compressed test responses to scan patterns. The one or more identified scan cell candidates can be reported. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media storing lists of fault candidates identified by any of the disclosed methods are also provided.
摘要翻译：本文公开了用于执行故障诊断的方法，装置和系统。在一个示例性实施例中，接收到故障日志，其包括指示对链模式的压缩测试响应的条目和对扫描模式的压缩测试响应。至少部分地基于指示压缩的测试对链模式的测试响应的一个或多个条目来识别被测电路中的有缺陷的扫描链。至少部分地基于指示对扫描模式的压缩测试响应的一个或多个条目来识别故障扫描链中的一个或多个错误的扫描小区候选。可以报告一个或多个识别的扫描单元候选。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的计算机可读介质。同样，还提供了存储通过任何所公开的方法识别的故障候选列表的计算机可读介质。

3. 发明授权

US08280688B2 Compactor independent direct diagnosis of test hardware 有权
标题翻译：压缩机独立直接诊断测试硬件
公开(公告)号：US08280688B2
公开(公告)日：2012-10-02
申请号：US12790049
申请日：2010-05-28
申请人： Yu Huang , Wu-Tung Cheng , Janusz Rajski
发明人： Yu Huang , Wu-Tung Cheng , Janusz Rajski
IPC分类号： G06F11/30 , G06F11/00
CPC分类号： G01R31/318547 , G06F11/267 , G06F11/27
摘要： Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In one exemplary embodiment, a failure log is received comprising entries indicative of compressed test responses to chain patterns and compressed test responses to scan patterns. A faulty scan chain in the circuit-under-test is identified based at least in part on one or more of the entries indicative of the compressed test responses to chain patterns. One or more faulty scan cell candidates in the faulty scan chain are identified based at least in part on one or more of the entries indicative of the compressed test responses to scan patterns. The one or more identified scan cell candidates can be reported. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media storing lists of fault candidates identified by any of the disclosed methods are also provided.
摘要翻译：本文公开了用于执行故障诊断的方法，装置和系统。在一个示例性实施例中，接收到故障日志，其包括指示对链模式的压缩测试响应的条目和对扫描模式的压缩测试响应。至少部分地基于指示压缩的测试对链模式的测试响应的一个或多个条目来识别被测电路中的有缺陷的扫描链。至少部分地基于指示对扫描模式的压缩测试响应的一个或多个条目来识别故障扫描链中的一个或多个错误的扫描小区候选。可以报告一个或多个识别的扫描单元候选。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的计算机可读介质。同样，还提供了存储通过任何所公开的方法识别的故障候选列表的计算机可读介质。

4. 发明授权

US07239978B2 Compactor independent fault diagnosis 有权
标题翻译：压实机独立故障诊断
公开(公告)号：US07239978B2
公开(公告)日：2007-07-03
申请号：US10925230
申请日：2004-08-23
申请人： Wu-Tung Cheng , Kun-Han Tsai , Yu Huang , Nagesh Tamarapalli , Janusz Rajski
发明人： Wu-Tung Cheng , Kun-Han Tsai , Yu Huang , Nagesh Tamarapalli , Janusz Rajski
IPC分类号： G06F11/30 , G01R31/28
CPC分类号： G01R31/318547 , G06F11/267
摘要： Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In certain disclosed embodiments, methods for diagnosing faults from compressed test responses are provided. For example, in one exemplary embodiment, a circuit description of an at least partially scan-based circuit-under-test and a compactor for compacting test responses captured in the circuit-under-test is received. A transformation function performed by the compactor to the test responses captured in the circuit-under-test is determined. A diagnostic procedure for evaluating uncompressed test responses is modified into a modified diagnostic procedure that incorporates the transformation function therein. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media comprising lists of fault candidates identified by any of the disclosed methods or circuit descriptions created or modified by the disclosed methods are provided.
摘要翻译：本文公开了用于执行故障诊断的方法，装置和系统。在某些公开的实施例中，提供了用于从压缩测试响应诊断故障的方法。例如，在一个示例性实施例中，接收至少部分基于扫描的测试电路和压实器的电路描述，用于压缩在待测电路中捕获的测试响应。确定由压实机对被测电路中捕获的测试响应执行的变换功能。用于评估未压缩测试响应的诊断程序被修改为并入其中的变换功能的修改的诊断过程。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的计算机可读介质。同样地，提供了包括通过由所公开的方法创建或修改的任何公开的方法或电路描述所识别的故障候选列表的计算机可读介质。

5. 发明授权

US08438438B2 Enhanced diagnosis with limited failure cycles 有权
公开(公告)号：US08438438B2
公开(公告)日：2013-05-07
申请号：US12948460
申请日：2010-11-17
申请人： Yu Huang , Wu-Tung Cheng , Nagesh Tamarapalli , Randy Klingenberg , Janusz Rajski
发明人： Yu Huang , Wu-Tung Cheng , Nagesh Tamarapalli , Randy Klingenberg , Janusz Rajski
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/318569
摘要： Chain or logic diagnosis resolution can be enhanced in the presence of limited failure cycles using embodiments of the various methods, systems, and apparatus described herein. For example, pattern sets can be ordered according to a diagnosis coverage figure, which can be used to measure chain or logic diagnosability of the pattern set. Per-pin based diagnosis techniques can also be used to analyze limited failure data.

6. 发明授权

US08301414B2 Compactor independent fault diagnosis 有权
标题翻译：压实机独立故障诊断
公开(公告)号：US08301414B2
公开(公告)日：2012-10-30
申请号：US11772648
申请日：2007-07-02
申请人： Wu-Tung Cheng , Kun-Han Tsai , Yu Huang , Nagesh Tamarapalli , Janusz Rajski
发明人： Wu-Tung Cheng , Kun-Han Tsai , Yu Huang , Nagesh Tamarapalli , Janusz Rajski
IPC分类号： G06F11/30 , G01R31/28
CPC分类号： G01R31/318547 , G06F11/267
摘要： Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In certain disclosed embodiments, methods for diagnosing faults from compressed test responses are provided. For example, in one exemplary embodiment, a circuit description of an at least partially scan-based circuit-under-test and a compactor for compacting test responses captured in the circuit-under-test is received. A transformation function performed by the compactor to the test responses captured in the circuit-under-test is determined. A diagnostic procedure for evaluating uncompressed test responses is modified into a modified diagnostic procedure that incorporates the transformation function therein. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media comprising lists of fault candidates identified by any of the disclosed methods or circuit descriptions created or modified by the disclosed methods are provided.
摘要翻译：本文公开了用于执行故障诊断的方法，装置和系统。在某些公开的实施例中，提供了用于从压缩测试响应诊断故障的方法。例如，在一个示例性实施例中，接收至少部分基于扫描的测试电路和压实器的电路描述，用于压缩在待测电路中捕获的测试响应。确定由压实机对被测电路中捕获的测试响应执行的变换功能。用于评估未压缩测试响应的诊断程序被修改为并入其中的变换功能的修改的诊断过程。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的计算机可读介质。同样地，提供了包括通过由所公开的方法创建或修改的任何公开的方法或电路描述所识别的故障候选列表的计算机可读介质。

7. 发明申请

US20110126064A1 ENHANCED DIAGNOSIS WITH LIMITED FAILURE CYCLES 有权
标题翻译：增强诊断有缺陷的循环
公开(公告)号：US20110126064A1
公开(公告)日：2011-05-26
申请号：US12948460
申请日：2010-11-17
申请人： Yu Huang , Wu-Tung Cheng , Nagesh Tamarapalli , Janusz Rajski , Randy Klingenberg
发明人： Yu Huang , Wu-Tung Cheng , Nagesh Tamarapalli , Janusz Rajski , Randy Klingenberg
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/3177 , G01R31/318569
摘要： Chain or logic diagnosis resolution can be enhanced in the presence of limited failure cycles using embodiments of the various methods, systems, and apparatus described herein. For example, pattern sets can be ordered according to a diagnosis coverage figure, which can be used to measure chain or logic diagnosability of the pattern set. Per-pin based diagnosis techniques can also be used to analyze limited failure data.
摘要翻译：使用本文描述的各种方法，系统和装置的实施例，可以在存在有限故障循环的情况下增强链或逻辑诊断分辨率。例如，可以根据诊断覆盖率对图案集进行排序，这可以用于测量图案集的链或逻辑诊断。基于引脚的诊断技术也可用于分析有限的故障数据。

8. 发明授权

US07840862B2 Enhanced diagnosis with limited failure cycles 有权
标题翻译：增强诊断有限的故障周期
公开(公告)号：US07840862B2
公开(公告)日：2010-11-23
申请号：US11510079
申请日：2006-08-25
申请人： Yu Huang , Wu-Tung Cheng , Nagesh Tamarapalli , Randy Klingenberg , Janusz Rajski
发明人： Yu Huang , Wu-Tung Cheng , Nagesh Tamarapalli , Randy Klingenberg , Janusz Rajski
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/318569
摘要： Chain or logic diagnosis resolution can be enhanced in the presence of limited failure cycles using embodiments of the various methods, systems, and apparatus described herein. For example, pattern sets can be ordered according to a diagnosis coverage figure, which can be used to measure chain or logic diagnosability of the pattern set. Per-pin based diagnosis techniques can also be used to analyze limited failure data.
摘要翻译：使用本文描述的各种方法，系统和装置的实施例，可以在存在有限故障循环的情况下增强链或逻辑诊断分辨率。例如，可以根据诊断覆盖率对图案集进行排序，这可以用于测量图案集的链或逻辑诊断。基于引脚的诊断技术也可用于分析有限的故障数据。

9. 发明申请

US20070283202A1 COMPACTOR INDEPENDENT FAULT DIAGNOSIS 有权
标题翻译：压力计独立故障诊断
公开(公告)号：US20070283202A1
公开(公告)日：2007-12-06
申请号：US11772648
申请日：2007-07-02
申请人： Wu-Tung Cheng , Kun-Han Tsai , Yu Huang , Nagesh Tamarapalli , Janusz Rajski
发明人： Wu-Tung Cheng , Kun-Han Tsai , Yu Huang , Nagesh Tamarapalli , Janusz Rajski
IPC分类号： G01R31/28
CPC分类号： G01R31/318547 , G06F11/267
摘要： Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In certain disclosed embodiments, methods for diagnosing faults from compressed test responses are provided. For example, in one exemplary embodiment, a circuit description of an at least partially scan-based circuit-under-test and a compactor for compacting test responses captured in the circuit-under-test is received. A transformation function performed by the compactor to the test responses captured in the circuit-under-test is determined. A diagnostic procedure for evaluating uncompressed test responses is modified into a modified diagnostic procedure that incorporates the transformation function therein. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media comprising lists of fault candidates identified by any of the disclosed methods or circuit descriptions created or modified by the disclosed methods are provided.
摘要翻译：本文公开了用于执行故障诊断的方法，装置和系统。在某些公开的实施例中，提供了用于从压缩测试响应诊断故障的方法。例如，在一个示例性实施例中，接收至少部分基于扫描的测试电路和压实器的电路描述，用于压缩在待测电路中捕获的测试响应。确定由压实机对被测电路中捕获的测试响应执行的变换功能。用于评估未压缩测试响应的诊断程序被修改为并入其中的变换功能的修改的诊断过程。还提供了包括用于使计算机执行任何所公开的方法的计算机可执行指令的计算机可读介质。同样地，提供了包括通过由所公开的方法创建或修改的任何公开的方法或电路描述所识别的故障候选列表的计算机可读介质。

10. 发明申请

US20070220381A1 Enhanced diagnosis with limited failure cycles 有权
标题翻译：增强诊断有限的故障周期
公开(公告)号：US20070220381A1
公开(公告)日：2007-09-20
申请号：US11510079
申请日：2006-08-25
申请人： Yu Huang , Wu-Tung Cheng , Nagesh Tamarapalli , Randy Klingenberg , Janusz Rajski
发明人： Yu Huang , Wu-Tung Cheng , Nagesh Tamarapalli , Randy Klingenberg , Janusz Rajski
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/318569
摘要： Chain or logic diagnosis resolution can be enhanced in the presence of limited failure cycles using embodiments of the various methods, systems, and apparatus described herein. For example, pattern sets can be ordered according to a diagnosis coverage figure, which can be used to measure chain or logic diagnosability of the pattern set. Per-pin based diagnosis techniques can also be used to analyze limited failure data.
摘要翻译：使用本文描述的各种方法，系统和装置的实施例，可以在存在有限故障循环的情况下增强链或逻辑诊断分辨率。例如，可以根据诊断覆盖率对图案集进行排序，这可以用于测量图案集的链或逻辑诊断。基于引脚的诊断技术也可用于分析有限的故障数据。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式