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    • 1. 发明授权
    • Method of treating exhaust gas
    • 废气处理方法
    • US5254797A
    • 1993-10-19
    • US981983
    • 1992-11-24
    • Yoshinori ImotoKatsunosuke HaraMasakatsu HiraokaKunio SanoAkira Inoue
    • Yoshinori ImotoKatsunosuke HaraMasakatsu HiraokaKunio SanoAkira Inoue
    • B01D53/86A62D3/00C01B7/00F23G5/00
    • B01D53/8668B01D53/8662
    • A catalyst composition including component A and component B, the component A being a carrier, preferably having a honeycomb structure, and being a single-component oxide or a multi-component composite oxide of at least one metal of titanium, silicon and zirconium, and the component B being a catalyst component deposited on the carrier of component A and being at least one member selected from the group of noble metals and other specifically limited metals and their oxides, is very effective for decomposing and removing poisonous organic chlorine compounds, such as dioxin and the like, or poisonous organic chlorine compound-forming substances contained in an exhaust gas exhausted from an incinerator of an incineration plant provided with the incinerator and a dust collector. In addition, and the generation of the poisonous organic chlorine compound from the incineration plant can be prevented.
    • 包含组分A和组分B的催化剂组合物,组分A是载体,优选具有蜂窝结构,并且是至少一种钛,硅和锆的金属的单组分氧化物或多组分复合氧化物,以及 组分B是沉积在组分A的载体上的催化剂组分,并且是选自贵金属和其它特别有限的金属及其氧化物中的至少一种,对于分解和除去有毒的有机氯化合物是非常有效的,例如 二恶英等,或从设置有焚化炉的焚烧厂的焚化炉排出的排气中含有的有机的含氯化合物形成物质和集尘器。 此外,可以防止来自焚烧装置的有机有机氯化合物的产生。
    • 10. 发明授权
    • Probing test apparatus
    • 探测试验机
    • US5703494A
    • 1997-12-30
    • US553013
    • 1995-11-03
    • Kunio Sano
    • Kunio Sano
    • G01R1/073G01R1/067H01L21/66G01R31/02
    • G01R1/06705
    • A probing test apparatus comprising a probe card having a plurality of probes and first terminals contacted with and electrically connected to conductive pads of a circuit, a test head having a signal transmitting circuit through which the test signal is transmitted to the probes, a performance board having second terminals electrically connected to the signal transmitting circuit, a contact ring interposed between the performance board and the probe card and whose impedance has been adjusted, a plurality of first-type pogopins each having a pair of pin members contacting the first and second terminals to transmit the test signal to the probes, and a plurality of second-type pogopins each having a pair of pin members contacting the first and second terminals, the second-type pogopins being arranged in the contact ring, surrounding each first-type pogopin in a plane perpendicular to the axes of the pin members, and electrically connected to the first terminal grounded.
    • 一种探测测试装置,包括具有多个探针的探针和与电路的导电焊盘接触并电连接到电路的导电焊盘的探针卡,具有信号传输电路的测试头,测试信号通过该测试头传输到探头,演奏板 具有电连接到所述信号传输电路的第二端子,插入在所述性能板和所述探针卡之间并且阻抗已被调节的接触环,多个第一类型的pogopins,每个具有一对与所述第一和第二端子 将测试信号传输到探针,以及多个第二种类的pogopins,每个具有一对针构件接触第一和第二端子,第二类型的pogopins布置在接触环中,围绕每个第一类型的pogopin 垂直于销构件的轴线的平面,并且电连接到第一端子接地。