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1. 发明授权

US06777656B2 Near-field spectrometer having background spectral information 失效
标题翻译：近场光谱仪具有背景光谱信息
公开(公告)号：US06777656B2
公开(公告)日：2004-08-17
申请号：US10238627
申请日：2002-09-11
申请人： Yoshihito Narita , Fuminori Sato , Tohru Sakamaki , Tsutomu Inoue , Shigeyuki Kimura , Norihito Hujiwara
发明人： Yoshihito Narita , Fuminori Sato , Tohru Sakamaki , Tsutomu Inoue , Shigeyuki Kimura , Norihito Hujiwara
IPC分类号： G02B704
CPC分类号： G01J3/28 , G01Q60/22
摘要： The near-field spectrometer 10 comprises a Z-axis scanner 18, 20 for bringing a sample 24 and the tip of a probe 12 close to each other at a predetermined distance within a near-field 26 region when obtaining near-field spectral information and separating them from each other at a predetermined distance outside a near-field 26 region when obtaining back ground spectral information, and a data processor 22 for obtaining the true near-field spectral information free from the background by subtracting the background spectral information from the near-field spectral information, characterized in that a background information collector, during the separation of the sample 24 and the tip of the probe 12 at a predetermined distance outside the near-field 26 region, obtains the background spectral information for the corresponding portion to be measured.
摘要翻译：近场光谱仪10包括Z轴扫描器18,20，用于当获得近场光谱信息时，使样本24和探针12的尖端以近场26区域内的预定距离彼此靠近，当获得背景光谱信息时，在近场26区域外的预定距离处彼此分离它们;以及数据处理器22，用于通过从近处获得背景光谱信息来从背景中获得没有背景的真实近场光谱信息场地光谱信息，其特征在于，背景信息采集器在样品24和探针12的尖端在远场26区域外的预定距离分离期间获得用于相应部分的背景光谱信息测量。

2. 发明授权

US07235807B2 Near field analysis apparatus having irradiation-side guide light and light-collection-side guide light 有权
标题翻译：近场分析装置具有照射侧引导灯和集光侧引导光
公开(公告)号：US07235807B2
公开(公告)日：2007-06-26
申请号：US11316402
申请日：2005-12-22
申请人： Yoshihito Narita , Shigeyuki Kimura , Fuminori Sato , Atsushi Yamada
发明人： Yoshihito Narita , Shigeyuki Kimura , Fuminori Sato , Atsushi Yamada
IPC分类号： G01N21/86
CPC分类号： G01Q60/22
摘要： A near field analysis apparatus comprising: an irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the irradiation-side adjustable optical system; a light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the light-collection-side adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the irradiation-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the light-collection-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.
摘要翻译：一种近场分析装置，包括：照射光学系统，包括用于调节其光轴的位置或角度的照射侧可调节光学系统，并且经由照射侧可调节光学系统将照射侧引导光照射到调整表面上 ; 光收集光学系统，包括用于调节其光轴的位置或角度的采光侧可调光学系统，以及经由采光侧可调节光学系统将光收集侧引导光照射到调节表面上 ; 照射侧调节装置，用于调节照射侧可调节光学系统的位置或角度，使得在调节表面观察到的引导光点相匹配; 以及采集侧调整装置，其用于调整所述收光侧可调光学系统的位置或角度，使得在所述调整面观察到的所述引导光的光斑匹配。

3. 发明申请

US20060131493A1 Near field analysis apparatus 有权
标题翻译：近场分析仪
公开(公告)号：US20060131493A1
公开(公告)日：2006-06-22
申请号：US11316402
申请日：2005-12-22
申请人： Yoshihito Narita , Shigeyuki Kimura , Fuminori Sato , Atsushi Yamada
发明人： Yoshihito Narita , Shigeyuki Kimura , Fuminori Sato , Atsushi Yamada
IPC分类号： H01J40/14
CPC分类号： G01Q60/22
摘要： A near field analysis apparatus comprising: an irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the irradiation-side adjustable optical system; a light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the light-collection-side adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the irradiation-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the light-collection-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.
摘要翻译：一种近场分析装置，包括：照射光学系统，包括用于调节其光轴的位置或角度的照射侧可调节光学系统，并且经由照射侧可调节光学系统将照射侧引导光照射到调整表面上 ; 光收集光学系统，包括用于调节其光轴的位置或角度的采光侧可调光学系统，以及经由采光侧可调节光学系统将光收集侧引导光照射到调节表面上 ; 照射侧调节装置，用于调节照射侧可调节光学系统的位置或角度，使得在调节表面观察到的引导光点相匹配; 以及采集侧调整装置，其用于调整所述收光侧可调光学系统的位置或角度，使得在所述调整面观察到的所述引导光的光斑匹配。

4. 发明申请

US20060238758A1 Near-field polarized-light measurement apparatus 有权
标题翻译：近场偏振光测量装置
公开(公告)号：US20060238758A1
公开(公告)日：2006-10-26
申请号：US11398096
申请日：2006-04-05
申请人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita , Mutsumi Senuma
发明人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita , Mutsumi Senuma
IPC分类号： G01J4/00
CPC分类号： G01J4/00 , G01N21/21 , G01Q30/02 , G01Q60/22
摘要： A near-field polarized-light measurement apparatus 10 comprises a near-field probe 14, an analyzer 18, a detector 22, and an analyzer-rotating unit 20. The near-field probe 14 has at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detector 22 detects light transmitted through the sample via the analyzer 18. The analyzer-rotating unit 20 rotates the analyzer 18 about an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzer 18 with the analyzer-rotating unit 20.
摘要翻译：近场偏振光测量装置10包括近场探针14，分析器18，检测器22和分析仪旋转单元20。近场探头14在其前端处具有小于用于测量的光的波长的开口，并且从该开口产生线偏振的近场光，并用近场光照射样本。检测器22通过分析器18检测透过样品的光。分析器旋转单元20使分析器18围绕光轴旋转，以改变其透射轴的角度。通过用分析器旋转单元20旋转分析器18来测量样品的旋光度。

5. 发明授权

US06812449B2 Probe opening fabricating apparatus, and near-field optical microscope using the same 有权
标题翻译：探头开口制造装置和使用其的近场光学显微镜
公开(公告)号：US06812449B2
公开(公告)日：2004-11-02
申请号：US10796088
申请日：2004-03-10
申请人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita
发明人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita
IPC分类号： H01J4014
CPC分类号： G01Q60/22
摘要： An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source 116; reflection means 140, light detection means 124; press means 128, 130 pressing a probe tip against said reflection means; storage means 142; calculation means 144 figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means 126 controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.
摘要翻译：提供了一种用于在近场光学显微镜的掩模尖端处产生具有期望尺寸的开口的开口制造装置和使用其的近场光学显微镜。该装置包括：光源116; 反射装置140，光检测装置124; 按压装置128,130将探针尖端压靠在所述反射装置上; 存储装置142; 计算装置144根据存储在所述存储装置中的校准信息计算用于从所述开口获取所需开口的反射光的光量; 以及按压控制装置126，控制所述探头尖靠在所述反射装置上，以便使所述反射光的光量等于由所述计算装置计算出的量。探头开口制造装置能够以高再现性容易地制造所需尺寸的开口。

6. 发明授权

US06784414B2 Probe opening fabricating apparatus, and near-field optical microscope using the same 有权
公开(公告)号：US06784414B2
公开(公告)日：2004-08-31
申请号：US10208749
申请日：2002-08-01
申请人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita
发明人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita
IPC分类号： H01J4014
CPC分类号： G01Q60/22
摘要： An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source 116; reflection means 140; light detection means 124; press means 128, 130 pressing a probe tip against said reflection means; storage means 142; calculation means 144 figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means 126 controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.

7. 发明授权

US06803558B2 Probe opening fabricating apparatus, and near-field optical microscope using the same 有权
公开(公告)号：US06803558B2
公开(公告)日：2004-10-12
申请号：US10796089
申请日：2004-03-10
申请人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita
发明人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita
IPC分类号： H01J4014
CPC分类号： G01Q60/22
摘要： An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source 116; reflection means 140; light detection means 124; press means 128, 130 pressing a probe tip against said reflection means; storage means 142; calculation means 144 figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means 126 controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.

8. 发明授权

US07586606B2 Near-field polarized-light measurement apparatus 有权
标题翻译：近场偏振光测量装置
公开(公告)号：US07586606B2
公开(公告)日：2009-09-08
申请号：US11398096
申请日：2006-04-05
申请人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita , Mutsumi Senuma
发明人： Tsutomu Inoue , Fuminori Sato , Yoshihito Narita , Mutsumi Senuma
IPC分类号： G01J4/00
CPC分类号： G01J4/00 , G01N21/21 , G01Q30/02 , G01Q60/22
摘要： A near-field polarized-light measurement apparatus 10 comprises a near-field probe 14, an analyzer 18, a detector 22, and an analyzer-rotating unit 20. The near-field probe 14 has at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detector 22 detects light transmitted through the sample via the analyzer 18. The analyzer-rotating unit 20 rotates the analyzer 18 about an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzer 18 with the analyzer-rotating unit 20.
摘要翻译：近场偏振光测量装置10包括近场探针14，分析器18，检测器22和分析器旋转单元20.近场探针14的尖端处具有小于用于测量的光的波长，并从该开口产生线偏振的近场光，并用近场光照射样本。检测器22通过分析器18检测透过样品的光。分析器旋转单元20使分析器18围绕光轴旋转，以改变其透射轴的角度。通过用分析器旋转单元20旋转分析器18来测量样品的旋光度。

9. 发明授权

US06710331B2 Near-field microscope 有权
标题翻译：近场显微镜
公开(公告)号：US06710331B2
公开(公告)日：2004-03-23
申请号：US09986012
申请日：2001-11-07
申请人： Yoshihito Narita , Shigeyuki Kimura
发明人： Yoshihito Narita , Shigeyuki Kimura
IPC分类号： H01J314
CPC分类号： G01Q60/22 , G01Q10/06 , G01Q30/06 , Y10S977/862
摘要： A near-field microscope comprising: a probe for scattering a near-field light; light emitting device including a light source for emitting light to a sample or said probe; and light sampling device for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising: control device for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling device; inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling device; and computing device for computing a measurement result obtained by subtracting a noise from said light intensity.
摘要翻译：一种近场显微镜，包括：用于散射近场光的探针; 发光器件包括用于向样品或所述探针发射光的光源; 以及用于采样和检测包括由所述探针散射的样品的信息的光的光取样装置，所述显微镜包括：用于将所述样品或探针与由所述发光产生的近场光的场隔开的控制装置，在近场光场中的浅的位置处的样品或探针，从而通过所述光采样装置检测噪声; 将所述样品或探针深深地插入由所述发光产生的近场光的场中，从而由所述光采样装置检测光强度; 以及用于计算通过从所述光强减去噪声而获得的测量结果的计算装置。

10. 发明授权

US06617569B2 Probe opening forming apparatus and near-field optical microscope using the same 有权
标题翻译：探针开口成型装置及使用其的近场光学显微镜
公开(公告)号：US06617569B2
公开(公告)日：2003-09-09
申请号：US09860643
申请日：2001-05-21
申请人： Yoshihito Narita , Tsutomu Inoue , Susumu Teruyama , Toshiharu Saiki , Shuji Mononobe , Motoichi Ohtsu
发明人： Yoshihito Narita , Tsutomu Inoue , Susumu Teruyama , Toshiharu Saiki , Shuji Mononobe , Motoichi Ohtsu
IPC分类号： H01J516
CPC分类号： G01Q60/22
摘要： A probe opening forming apparatus 139 comprising: light detecting means 140 for detecting a quantity of a light transmitted from a tip portion of the probe through a light of the source 116, which is on contact with the tip portion of the probe; storage means 142 for previously storing information about relation of the quantity of the light transmitted from the tip portion of the probe and the size of the opening; calculating means 144 for obtaining the value of the light quantity for obtaining an opening having a desirable size based on the information stored in the storage means 142; and pressing control means 126 for controlling the press of the tip portion of the probe against the light detecting means through the pressing means 114 such that a light quantity detected by the light detecting means 140 is equal to the light quantity calculated from the calculating means 144.
摘要翻译：探针开口形成装置139，包括：光检测装置140，用于通过与探针的尖端部分接触的源116的光来检测从探针的末端部分透射的光量; 存储装置142，用于预先存储关于从探头的尖端部分传播的光量与开口尺寸的关系的信息; 计算装置144，用于基于存储在存储装置142中的信息获得用于获得具有期望尺寸的开口的光量的值; 以及按压控制装置126，用于通过按压装置114控制探针的顶端部分对光检测装置的按压，使得由光检测装置140检测的光量等于从计算装置144计算的光量。

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