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    • 6. 发明授权
    • Sputtering target and its manufacturing method
    • 溅射靶及其制造方法
    • US06409965B1
    • 2002-06-25
    • US09666241
    • 2000-09-21
    • Takahiro NagataManabu SasakiHitoshi KimuraNorio Yokoyama
    • Takahiro NagataManabu SasakiHitoshi KimuraNorio Yokoyama
    • C22C3200
    • C23C14/3414
    • An ingot is made from a used target of 30 weight % or more, and new metals of the same components, and recycled alloy powder is made by a gas atomizing process. Magnetic permeability is controlled not to exceed 2 by adjusting the content of rare earth metals in rare earth alloy powder to be at least 35 weight %. By blending the recycled alloy powder with other powder to produce alloy powder containing at least 50 weight % of rare earth alloy powder having a magnetic permeability not higher than 2 and containing at least 65 weight % of rare earth alloy powder. By sintering the alloy powder under pressure and thereafter cutting top, bottom and side surfaces of the sintered material, a target having a magnetic permeability not higher than 2 and having a thickness not less than 8 mm is fabricated.
    • 铸锭由30重量%以上的使用靶材制成,相同成分的新金属,再生合金粉末由气体雾化法制成。 通过将稀土类合金粉末中的稀土金属的含量调整至少35重量%,将磁导率控制在2以下。 通过将再循环合金粉末与其它粉末混合,制造含有至少50重量%的磁导率不高于2的稀土合金粉末并含有至少65重量%的稀土合金粉末的合金粉末。 通过在压力下烧结合金粉末,然后切割烧结材料的顶部,底部和侧面,制造具有不高于2的磁导率并且厚度不小于8mm的靶。
    • 7. 发明授权
    • Change-over circuit for tester implemented by using diode-bridge type
analog switches
    • 使用二极管桥式模拟开关实现的测试仪转换电路
    • US5276355A
    • 1994-01-04
    • US665623
    • 1991-03-06
    • Takahiro Nagata
    • Takahiro Nagata
    • G01R31/26G01R31/28G01R31/319H03K17/76G01R1/30G01R11/02
    • G01R31/31926G01R31/2886G01R31/31924Y10T307/696Y10T307/76
    • A change-over circuit for use in a tester for changing over a load and a driver to be connected to a device under test is implemented by using diode-bridge type analog switches which include a first diode-bridge type analog switch connected as collector loads for first and second transistors, a second diode-bridge type analog switch connected as collector loads for third and fourth transistors, respectively. The driver is connected to an input of the first diode-bridge type analog switch. The load circuit is connected to an input of the second diode-bridge type analog switch. The first and second diode-bridge type analog switches are so interconnected as to perform a differential operation in response to an ON/OFF control signal applied to the fourth transistor from the first transistor for thereby changing over the current and capacitive loads and the driver to be coupled to the device under test which is connected to outputs of the first and second diode-bridge type analog switches. The current and capacitive loads can both be turned on and off through differential cooperation of the first and second diode-bridge type analog switches to thereby allow the current and capacitive loads to be connected simultaneously or separately only when the driver is disabled or inhibited. Inexpensive and simplified switch circuit is thus provided.
    • 用于切换负载的测试仪的转换电路和要连接到被测器件的驱动器通过使用二极管桥式模拟开关实现,该模拟开关包括作为集电极负载连接的第一二极管桥式模拟开关 对于第一和第二晶体管,分别连接第三和第四晶体管的集电极负载的第二二极管桥式模拟开关。 驱动器连接到第一个二极管桥式模拟开关的输入。 负载电路连接到第二二极管桥式模拟开关的输入端。 第一和第二二极管桥式模拟开关被互连,以响应于从第一晶体管施加到第四晶体管的ON / OFF控制信号执行差分操作,从而将电流和电容负载和驱动器切换到 耦合到被连接到第一和第二二极管桥型模拟开关的输出的被测器件。 电流和容性负载都可以通过第一和第二二极管桥式模拟开关的差分协作来接通和断开,从而允许电流和容性负载同时或分开连接,只有当驾驶员被禁用或禁止时。 因此提供了廉价且简化的开关电路。