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    • 3. 发明授权
    • Semiconductor memory test pattern generating apparatus
    • 半导体存储器测试图形生成装置
    • US4402081A
    • 1983-08-30
    • US195079
    • 1980-10-08
    • Yoshichika IchimiyaTsuneta SudoMasao Shimizu
    • Yoshichika IchimiyaTsuneta SudoMasao Shimizu
    • G01R31/28G01R31/3181G01R31/3183G01R31/319G11C29/10G11C29/56G06F11/00
    • G11C29/56G01R31/31921G01R31/31813
    • A semiconductor memory test pattern generating apparatus in which an instruction memory is read out, assigning an address by a program counter, and instructions thus read out are decoded and executed to generate a test pattern. A start address and a stop address and index data indicating the number of times of executing an area defined by the start and stop addresses are stored in a loop memory. During the operation of the program counter the start and stop addresses and the index data are read out from the loop memory and loaded in a register group. When the program counter coincides with the loaded stop address, the setting of the program counter to the loaded start address is executed by the number of times indicated by the loaded index data, and in the last execution the next address of the loop memory is read out.
    • 一种半导体存储器测试图形生成装置,其中读出指令存储器,通过程序计数器分配地址和由此读出的指令被解码和执行以产生测试图案。 指示由起始和停止地址定义的区域执行次数的起始地址和停止地址和索引数据被存储在循环存储器中。 在程序计数器的操作期间,从循环存储器中读出起始和停止地址和索引数据,并加载到寄存器组中。 当程序计数器与加载的停止地址一致时,程序计数器对加载的起始地址的设置由加载的索引数据指示的次数执行,在最后一次执行中循环存储器的下一个地址被读取 出来