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    • 1. 发明申请
    • Operational range designation and enhancement in optical readout of temperature
    • 光学读出温度的操作范围指定和增强
    • US20060088076A1
    • 2006-04-27
    • US10970985
    • 2004-10-25
    • Yoram LubianikerLavi SecundoAharon Agranat
    • Yoram LubianikerLavi SecundoAharon Agranat
    • G01J5/00
    • G01J5/60G01J5/0003G01J2005/0077
    • Methods for addressing a designated temperature operational range in a measurement that uses an optical readout of temperature and for enhancing that range are disclosed. The range is enhanced through providing at least one active detector with a periodic response, operative to provide a detector temperature through an electric field-dependent optical readout, and performing at least two measurements of the detector temperature to obtain a non-degenerate reading of an object temperature. The at least two measurements may include three same wavelength/different electric field measurements or two same electric field/different wavelength measurements. The operational range is addressed by using at least one pixel and an associated dummy detector, identifying a center temperature Tcenter of an object temperature range, calculating a pixel temperature T* correlated with Tcenter, calculating an electric field E*, which, once applied to the dummy detector, yields a light intensity reading that is half a maximal intensity value, and optically reading each pixel temperature.
    • 公开了在使用光学读出温度并用于增强该范围的测量中寻址指定温度操作范围的方法。 通过提供具有周期性响应的至少一个有源检测器来增强范围,其可操作以通过依赖于电场的光学读出来提供检测器温度,以及对检测器温度进行至少两次测量以获得非退化读数 物体温度。 至少两个测量可以包括三个相同的波长/不同的电场测量或两个相同的电场/不同的波长测量。 通过使用至少一个像素和相关联的虚拟检测器来识别操作范围,识别物体温度范围的中心温度中心,计算与T < / SUB>,计算一次施加到虚拟检测器的电场E *产生最大强度值的一半的光强度读数,并且光学读取每个像素温度。
    • 2. 发明授权
    • Thermal imaging system and method
    • 热成像系统及方法
    • US07119334B2
    • 2006-10-10
    • US10698463
    • 2003-11-03
    • Lavi SecundoYoram Lubianiker
    • Lavi SecundoYoram Lubianiker
    • G01J5/00
    • G02F1/0327G02F1/0147H04N5/33
    • Systems and methods for thermal sensing and imaging using the electro-optic effect. A thermal detection system comprises a temperature sensing element that includes an electro-optic (EO) material layer having a length axis and characterized by a temperature dependent index of refraction, an electrical mechanism for inducing a chance in the index of refraction, a laser beam propagating lengthwise through EO layer for probing the refraction index change, and a light intensity meter for measuring a laser beam intensity change caused by the temperature dependent refraction index change. Thermal imaging is obtained by using a pixel array of such thermal sensing elements. The intensity reading may be done in either a cross-polarizer or a Mach Zehnder Interferometry reading configuration.
    • 使用电光效应的热感测和成像系统和方法。 热检测系统包括温度感测元件,其包括具有长度轴的电光(EO)材料层,并且其特征在于温度依赖折射率,用于引起折射率的电机构,激光束 用于探测折射率变化的纵向传播通过EO层;以及光度计,用于测量由温度依赖折射率变化引起的激光束强度变化。 通过使用这种热感测元件的像素阵列来获得热成像。 强度读数可以在交叉偏振器或马赫曾德尔干涉仪读数配置中进行。
    • 3. 发明申请
    • Thermal imaging system and method
    • 热成像系统及方法
    • US20050092924A1
    • 2005-05-05
    • US10698463
    • 2003-11-03
    • Lavi SecundoYoram Lubianiker
    • Lavi SecundoYoram Lubianiker
    • G01J5/00G01N20060101G02F1/01G02F1/03H04N5/33
    • G02F1/0327G02F1/0147H04N5/33
    • Systems and methods for thermal sensing and imaging using the electro-optic effect. A thermal detection system comprises a temperature sensing element that includes an electro-optic (EO) material layer having a length axis and characterized by a temperature dependent index of refraction, an electrical mechanism for inducing a chance in the index of refraction, a laser beam propagating lengthwise through EO layer for probing the refraction index change, and a light intensity meter for measuring a laser beam intensity change caused by the temperature dependent refraction index change. Thermal imaging is obtained by using a pixel array of such thermal sensing elements. The intensity reading may be done in either a cross-polarizer or a Mach Zehnder Interferometry reading configuration.
    • 使用电光效应的热感测和成像系统和方法。 热检测系统包括温度感测元件,其包括具有长度轴的电光(EO)材料层,并且其特征在于温度依赖折射率,用于引起折射率的电机构,激光束 用于探测折射率变化的纵向传播通过EO层;以及光度计,用于测量由温度依赖折射率变化引起的激光束强度变化。 通过使用这种热感测元件的像素阵列来获得热成像。 强度读数可以在交叉偏振器或马赫曾德尔干涉仪读数配置中进行。