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    • 2. 发明授权
    • Systems and methods for x-ray phase contrast imaging using arrays of x-ray focusing elements
    • 使用x射线聚焦元件阵列进行X射线相位成像的系统和方法
    • US09575015B2
    • 2017-02-21
    • US14673304
    • 2015-03-30
    • Yongjin SungRajiv Gupta
    • Yongjin SungRajiv Gupta
    • G01N23/04G21K1/06G01N23/20
    • G01N23/04G01N23/20075G01N2223/303G21K1/06G21K2201/067G21K2207/005
    • Systems and methods for performing x-ray phase-contrast imaging using a conventional x-ray source and detector are provided. An array of x-ray focusing elements it provided and used to focus x-ray onto a pattern of multiple different focal spots. When an object is introduced into the beam path, the focal spots will be displaced based on the x-rays being refracted by the object. A refraction angle map is produced and used to generate a phase contrast image, such as an image that indicates the electron density distribution in the object. Multi-spectral imaging can be achieved by utilizing the chromatic aberration of the array of x-ray focusing elements and sweeping the detector through different focal planes associated with different x-ray energy levels or sweeping the peak voltage of the x-ray source for a fixed object-to-detector distance.
    • 提供了使用常规x射线源和检测器执行X射线相位对比成像的系统和方法。 它提供并用于将x射线聚焦到多个不同焦点的图案上的x射线聚焦元件阵列。 当物体被引入光束路径时,焦斑将基于被物体折射的X射线而移位。 产生折射角度图并用于产生相位对比图像,例如指示物体中的电子密度分布的图像。 可以通过利用x射线聚焦元件阵列的色差并通过与不同X射线能级相关联的不同焦平面扫描检测器来实现多光谱成像,或扫描X射线源的峰值电压 固定的物体到检测器的距离。
    • 3. 发明申请
    • Systems and Methods For X-Ray Phase Contrast Imaging Using Arrays Of X-Ray Focusing Elements
    • 使用X射线聚焦元件阵列进行X射线相位对比成像的系统和方法
    • US20150340113A1
    • 2015-11-26
    • US14673304
    • 2015-03-30
    • Yongjin SungRajiv Gupta
    • Yongjin SungRajiv Gupta
    • G21K1/06G01N23/04
    • G01N23/04G01N23/20075G01N2223/303G21K1/06G21K2201/067G21K2207/005
    • Systems and methods for performing x-ray phase-contrast imaging using a conventional x-ray source and detector are provided. An array of x-ray focusing elements it provided and used to focus x-ray onto a pattern of multiple different focal spots. When an object is introduced into the beam path, the focal spots will be displaced based on the x-rays being refracted by the object. A refraction angle map is produced and used to generate a phase contrast image, such as an image that indicates the electron density distribution in the object. Multi-spectral imaging can be achieved by utilizing the chromatic aberration of the array of x-ray focusing elements and sweeping the detector through different focal planes associated with different x-ray energy levels or sweeping the peak voltage of the x-ray source for a fixed object-to-detector distance.
    • 提供了使用常规x射线源和检测器执行X射线相位对比成像的系统和方法。 它提供并用于将x射线聚焦到多个不同焦点的图案上的x射线聚焦元件阵列。 当物体被引入光束路径时,焦斑将基于被物体折射的X射线而移位。 产生折射角度图并用于产生相位对比图像,例如指示物体中的电子密度分布的图像。 可以通过利用x射线聚焦元件阵列的色差并通过与不同X射线能级相关联的不同焦平面扫描检测器来实现多光谱成像,或扫描X射线源的峰值电压 固定的物体到检测器的距离。