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    • 1. 发明专利
    • Internal structure inspecting method and internal structure inspecting device for pearl or precious stones
    • 内部结构检查方法和内部结构检查设备用于珍珠或石膏
    • JP2007248448A
    • 2007-09-27
    • JP2006329562
    • 2006-12-06
    • Yonghong HeHui MaHui Wangヘ ヨンホンHe Yonghongマ フイMa Huiワン フイWang Hui
    • WANG HUIHE YONGHONGMA HUI
    • G01B11/24G01B9/02G01B11/06
    • G01N21/4795G01B9/02091G01N21/87
    • PROBLEM TO BE SOLVED: To detect nondestructively a pearl internal structure using a photoelectric conversion, based on optical interference principle, signal collection, and scanning technique. SOLUTION: A method of inspecting an internal structure of accessories, such as pearls and precious stones, etc. comprises: a step of projecting a light on an arm for a reference which can reflect the light by carrying out spectroscopy of the light generated from a low-coherence optical source with a spectrometer to the first beam and the second beam, and for the first beam and the second beam, changing a sample arm for fixing a measured article and the optical distance, respectively; a step of regulating the optical distance so that an interference signal is generated, by making the reflected light from the arm for the reference interfere with the reflecting light from the measured article of the sample arm; a signal replacing step involving acquiring of a strong signal of one-dimensional reflecting light in the depth direction of the measured article, by converting the interference signal into an electrical signal and transferring the electrical signal to a signal analyzer while changing the optical distance and the arm for the reference; and a scanning step of acquiring an optical fault image which shows a two-dimensional internal structure of the measured article, by performing scanning on the measured article. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:基于光学干涉原理,信号采集和扫描技术,使用光电转换非破坏性地检测珍珠内部结构。 解决方案:检查诸如珍珠和宝石等附件的内部结构的方法包括:通过执行光的光谱法将光投射到臂上以用于参考的步骤,该参考可以反射光 从具有光谱仪的低相干光源到第一光束和第二光束,以及用于第一光束和第二光束,分别改变用于固定测量物品的样品臂和光学距离; 通过使来自臂的反射光作为参照来干扰来自被检测体的测定物的反射光,从而产生干涉信号的调节光学距离的步骤; 信号替换步骤,涉及通过将干扰信号转换为电信号并将电信号传送到信号分析器同时改变光学距离而获取在测量物品的深度方向上的一维反射光的强信号,并且 手臂参考; 以及扫描步骤,通过对所测量的物品进行扫描来获取示出所测量物品的二维内部结构的光学故障图像。 版权所有(C)2007,JPO&INPIT