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    • 1. 发明授权
    • Near field optical microscope and probe for near field optical microscope
    • 近场光学显微镜和近场光学显微镜探针
    • US06469288B1
    • 2002-10-22
    • US09571442
    • 2000-05-15
    • Yasuo SasakiHiroko Sasaki
    • Yasuo SasakiHiroko Sasaki
    • G02B704
    • G01Q60/06G01Q20/02Y10S977/862
    • A near-field optical microscope comprises an illumination part, a probe, a light detection part, and a scanning part. The illumination part illuminates a sample surface with light. The probe is provided at a position near the sample surface illuminated with the light. The light detection part detects light scattered by the probe. The scanning part scans the sample and a top end of the probe relatively to each, other. The top end of the probe is a top end of an extending part extending in one direction from a body of the probe. In the side of the top end of the extending part, the extending part is at most three times or less as thick as a top end diameter, over a length of a wavelength of the illuminating light. The near-field optical microscope further comprises means for vibrating the probe in a lengthwise direction of the extending part.
    • 近场光学显微镜包括照明部,探针,光检测部和扫描部。 照明部分用光照亮样品表面。 探针设置在靠近被光照射的样品表面的位置处。 光检测部检测由探针散射的光。 扫描部分相对于每个扫描部分扫描样品和探头的顶端。 探针的顶端是从探头的主体沿一个方向延伸的延伸部分的顶端。 在延伸部分的顶端侧,在照明光的波长长度上,延伸部分至多为顶端直径的三倍或更小。 近场光学显微镜还包括用于在延伸部分的长度方向上振动探针的装置。
    • 2. 发明授权
    • Near field optical microscope
    • 近场光学显微镜
    • US06545276B1
    • 2003-04-08
    • US09550255
    • 2000-04-14
    • Hiroko Sasaki
    • Hiroko Sasaki
    • H01J3100
    • G01Q60/22Y10S977/862
    • A light illumination portion illuminates light to a sample surface. A probe has a tip which is smaller than the wavelength of light illuminated by the light illumination portion, the tip is provided near the sample surface to which the light is illuminated, and scatters the light. A light detection portion detects light scattered by the probe. A scanning portion relatively scans the sample and the tip of the probe. A near field optical microscope has a constitution such that plasmon resonance is generated during scattering by the probe. Another light illumination portion illuminates light to the surface of a sample. Another probe has a tip provided near to the sample, and the tip of the probe generates scattered light originating in light illuminated by the light illumination portion. Another light detection portion detects light scattered by the probe. An illumination light modulation portion modulates the wavelength of the light illuminated by the light illumination portion at a predetermined frequency. An extraction portion extracts components at the predetermined frequency of the illumination light modulation portion from an output of the light detection portion.
    • 光照射部分将光照射到样品表面。 探针具有小于由光照射部照射的光的波长的尖端,尖端设置在被照射的样品表面附近,并且散射光。 光检测部检测由探针散射的光。 扫描部分相对地扫描样品和探针的尖端。 近场光学显微镜具有在探针散射期间产生等离子体共振的结构。 另一个光照射部分将光照射到样品的表面。 另一个探针具有靠近样品提供的尖端,并且探针的尖端产生源自由光照射部分照射的光的散射光。 另一光检测部分检测由探针散射的光。 照明光调制部以预定频率调制由光照射部照射的光的波长。 提取部分从光检测部分的输出提取照明光调制部分的预定频率处的分量。