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1. 发明授权

US5216244A Accessory and crystalline element for attenuated total reflection infrared spectroscopy 失效
标题翻译：衰减全反射红外光谱的附件和结晶元件
公开(公告)号：US5216244A
公开(公告)日：1993-06-01
申请号：US726332
申请日：1991-07-05
申请人： Yasuo Esaki , Kyoko Yokokawa , Toshimi Araga
发明人： Yasuo Esaki , Kyoko Yokokawa , Toshimi Araga
IPC分类号： G01N21/55
CPC分类号： G01N21/552 , G01N2201/0636
摘要： The accessary for attenuated total reflection infrared spectroscopy comprises a condenser mirror, a crystalline element, a sample-supporting portion holding the crystalline element, an objective mirror, and a slit. The crystalline element has an incident surface, a totally reflecting surface, and an exit surface. A sample to be investigated is contacted with the totally reflecting surface The focused point of the infrared radiation from the condenser mirror is at the point of measurement on the totally reflecting surface of the crystalline element The focus of the objective mirror can be brought to the point of measurement on the sample surface. A point analysis, line analysis, or area surface on the order of 10 .mu.m can be made while observing the sample with the naked eye with the objective mirror. The invention further includes improvements in the mechanism for automatically adjusting the focus of the objective mirror when the measurement point is changed. Another improvement is that the crystalline element has the reflecting surfaces oriented individually so that the optical axis of the incident radiation rays can agree with the optical axis of the outgoing radiation rays. A further improvement is that a scale for determining a measurement point is engraved on the totally reflecting surface of the crystalline element.
摘要翻译：用于衰减全反射红外光谱的附件包括聚光镜，结晶元件，保持结晶元件的样品支撑部分，物镜和狭缝。结晶元件具有入射表面，全反射表面和出射表面。待研究的样品与全反射面接触来自聚光镜的红外辐射的聚焦点在结晶元件的全反射面上的测量点物镜的焦点可以达到点的样品表面上的测量。可以用目镜用肉眼观察样品，进行10μm数量级的点分析，线分析或面积。本发明还包括当测量点改变时自动调节物镜的焦点的机构的改进。另一个改进是结晶元件具有单独取向的反射表面，使得入射辐射线的光轴可以与出射辐射线的光轴一致。进一步的改进是，用于确定测量点的刻度刻在结晶元件的全反射表面上。

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