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1. 发明申请

US20070223156A1 CIRCUIT FOR PROTECTING DUT, METHOD FOR PROTECTING DUT, TESTING APPARATUS AND TESTING METHOD 失效
标题翻译：用于保护DUT的电路，用于保护被测物的方法，测试装置和测试方法
公开(公告)号：US20070223156A1
公开(公告)日：2007-09-27
申请号：US11689149
申请日：2007-03-21
申请人： Yasunori Kumagai , Dai Shinozaki , Shigekazu Komatsu , Katsuaki Sakamoto
发明人： Yasunori Kumagai , Dai Shinozaki , Shigekazu Komatsu , Katsuaki Sakamoto
IPC分类号： H02H9/00
CPC分类号： G01R31/2889 , G01R1/06766
摘要： A circuit for protecting a DUT is disposed in parallel with a DUT which is supplied with current via wirings and switchable between conducting and non-conducting state. The circuit is switchable between conducting and non-conducing state and switched from non-conducting state to conducting state as the DUT is switched from conducting state to non-conducting state.
摘要翻译：用于保护DUT的电路与被提供有电流经由布线并可在导通状态和非导通状态之间切换的DUT平行设置。该电路可在导通状态和非导通状态之间切换，并且在DUT从导通状态切换到非导通状态时，从非导通状态切换到导通状态。

2. 发明授权

US07701241B2 Circuit for protecting DUT, method for protecting DUT, testing apparatus and testing method 失效
标题翻译：用于保护DUT的电路，用于保护DUT的方法，测试装置和测试方法
公开(公告)号：US07701241B2
公开(公告)日：2010-04-20
申请号：US11689149
申请日：2007-03-21
申请人： Yasunori Kumagai , Dai Shinozaki , Shigekazu Komatsu , Katsuaki Sakamoto
发明人： Yasunori Kumagai , Dai Shinozaki , Shigekazu Komatsu , Katsuaki Sakamoto
IPC分类号： G01R31/26
CPC分类号： G01R31/2889 , G01R1/06766
摘要： A circuit for protecting a DUT is disposed in parallel with a DUT which is supplied with current via wirings and switchable between conducting and non-conducting state. The circuit is switchable between conducting and non-conducing state and switched from non-conducting state to conducting state as the DUT is switched from conducting state to non-conducting state.
摘要翻译：用于保护DUT的电路与被提供有电流经由布线并可在导通状态和非导通状态之间切换的DUT平行设置。该电路可在导通状态和非导通状态之间切换，并且在DUT从导通状态切换到非导通状态时，从非导通状态切换到导通状态。

3. 发明授权

US08468690B2 Holding member for use in test and method for manufacturing same 有权
标题翻译：用于测试的保持构件及其制造方法
公开(公告)号：US08468690B2
公开(公告)日：2013-06-25
申请号：US12744780
申请日：2008-11-05
申请人： Yasunori Kumagai , Shigekazu Komatsu
发明人： Yasunori Kumagai , Shigekazu Komatsu
IPC分类号： H05K3/30
CPC分类号： G01R31/2893 , Y10T29/4913 , Y10T156/1056
摘要： A holding member for use in a test includes a base made of silicon or glass and chips in which devices are formed is mountable thereon. Positioning members made of resist sheets are formed on the top surface of the base. A resist film is formed on the bottom surface of the base, and suction grooves (intersection portions, connection portions) and support members are formed in the resist film. Suction holes are formed in regions of the top surface of the base where the chips are mounted, wherein the suction holes are formed through the base and communicate with the suction groove.
摘要翻译：用于测试的保持构件包括由硅或玻璃制成的基座以及其上形成有器件的芯片。由抗蚀剂片制成的定位构件形成在基座的顶面上。在底座的底面上形成抗蚀剂膜，并且在抗蚀剂膜中形成有吸水槽（交叉部分，连接部分）和支撑构件。在安装有芯片的基座的顶面的区域中形成有吸入孔，其中，吸入孔形成为穿过底座并与抽吸槽连通。

4. 发明申请

US20110025344A1 HOLDING MEMBER FOR USE IN TEST AND METHOD FOR MANUFACTURING SAME 有权
标题翻译：用于测试的保持组件和用于制造它们的方法
公开(公告)号：US20110025344A1
公开(公告)日：2011-02-03
申请号：US12744780
申请日：2008-11-05
申请人： Yasunori Kumagai , Shigekazu Komatsu
发明人： Yasunori Kumagai , Shigekazu Komatsu
IPC分类号： H01H31/02 , B32B38/04
CPC分类号： G01R31/2893 , Y10T29/4913 , Y10T156/1056
摘要： A holding member for use in a test includes a base made of silicon or glass and chips in which devices are formed is mountable thereon. Positioning members made of resist sheets are formed on the top surface of the base. A resist film is formed on the bottom surface of the base, and suction grooves (intersection portions, connection portions) and support members are formed in the resist film. Suction holes are formed in regions of the top surface of the base where the chips are mounted, wherein the suction holes are formed through the base and communicate with the suction groove.
摘要翻译：用于测试的保持构件包括由硅或玻璃制成的基座以及其上形成有器件的芯片。由抗蚀剂片制成的定位构件形成在基座的顶面上。在底座的底面上形成抗蚀剂膜，并且在抗蚀剂膜中形成有吸水槽（交叉部分，连接部分）和支撑构件。在安装有芯片的基座的顶面的区域中形成有吸入孔，其中，吸入孔形成为穿过底座并与抽吸槽连通。

5. 发明授权

US09127358B2 Film forming apparatus 有权
标题翻译：成膜装置
公开(公告)号：US09127358B2
公开(公告)日：2015-09-08
申请号：US13347110
申请日：2012-01-10
申请人： Mitsuya Inoue , Yasunori Kumagai , Kippei Sugita
发明人： Mitsuya Inoue , Yasunori Kumagai , Kippei Sugita
IPC分类号： H01L21/306 , C23F1/00 , C23C16/448 , C23C14/54 , C23C16/455 , C23C16/52 , H01L21/02 , B05D1/00
CPC分类号： C23C16/4481 , B05D1/60 , C23C14/542 , C23C14/543 , C23C16/45561 , C23C16/52 , H01L21/02118 , H01L21/02263
摘要： A film forming apparatus for forming a polyimide film on a substrate installed within a film forming container. The apparatus includes: a first vaporizer configured to vaporize a first raw material in a solid state, and supply the vaporized first raw material gas to the substrate; a second vaporizer configured to vaporize a second raw material in a liquid state, and supply the vaporized second raw material gas to the substrate; a first pressure measurement unit configured to measure the internal pressure of the first vaporizer; a second pressure measurement unit configured to measure the internal pressure of the second vaporizer; and a controller configured to calculate a supply amount of the first and second raw material gases by the first and second pressure measurement units, respectively, and control the first and second vaporizers to supply the first and second raw material gases in a uniform amount.
摘要翻译：一种用于在安装在成膜容器内的基板上形成聚酰亚胺膜的成膜装置。该装置包括：第一蒸发器，被配置为以固态汽化第一原料，并将蒸发的第一原料气体供应到基板; 第二蒸发器，被配置为以液态汽化第二原料，并将蒸发的第二原料气体供给到所述基板; 第一压力测量单元，被配置为测量第一蒸发器的内部压力; 第二压力测量单元，被配置为测量第二蒸发器的内部压力; 以及控制器，被配置为分别计算第一和第二压力测量单元的第一和第二原料气体的供应量，并且控制第一和第二蒸发器以均匀的量供应第一和第二原料气体。

6. 发明申请

US20080150562A1 Inspection method, inspection apparatus and computer-readable storage medium storing program 失效
标题翻译：检查方法，检查装置和计算机可读存储介质存储程序
公开(公告)号：US20080150562A1
公开(公告)日：2008-06-26
申请号：US12003214
申请日：2007-12-20
申请人： Yasunori Kumagai , Ka Toh
发明人： Yasunori Kumagai , Ka Toh
IPC分类号： G01R31/02
CPC分类号： G01R31/2886 , G01R3/00
摘要： The present invention includes a fritting circuit applying a voltage between a probe pair composed of probes in pairs in contact with a substrate to cause a fritting phenomenon to establish an electrical conduction between at least one of the probe pair and the substrate; and a switching circuit electrically connecting the probe pair and the fritting circuit and capable of freely switching between polarities of a voltage applied between the probe pair. Voltage is applied twice between the probe pair in contact with the substrate to thereby perform fritting twice. In the two times of fritting, the polarities of the voltage applied between the probe pair are changed. According to the present invention, electrical conduction between the probes and the substrate can be obtained more stably.
摘要翻译：本发明包括熔接电路，其在由与基板接触成对的探针构成的探针对之间施加电压，以引起烧结现象，以在至少一个探针对和基底之间建立导电; 以及切换电路，电连接探针对和熔接电路，并且能够自由地切换在探针对之间施加的电压的极性。在与基板接触的探针对之间施加电压两次，从而进行两次烧结。在两次烧结中，探针对之间施加的电压的极性发生变化。根据本发明，可以更稳定地获得探针与基板之间的导电性。

7. 发明申请

US20100039130A1 INSPECTING METHOD, INSPECTING APPARATUS AND COMPUTER READABLE STORAGE MEDIUM HAVING PROGRAM STORED THEREIN 审中-公开
标题翻译：检查方法，检查装置和计算机可存储的存储库的可读存储介质
公开(公告)号：US20100039130A1
公开(公告)日：2010-02-18
申请号：US12441957
申请日：2007-12-21
申请人： Yasunori Kumagai , Ka Toh
发明人： Yasunori Kumagai , Ka Toh
IPC分类号： G01R31/02 , G01R1/06
CPC分类号： G01R31/2886 , H01L22/12
摘要： A probe card of an inspecting apparatus is provided with a flitting circuit to cause a flitting by applying voltages to a pair of probes being in contact with an electrode of a substrate to electrically conduct the probes to the substrate, and a switching circuit to electrically connect the probe pair to the flitting circuit to freely switch polarities of the voltages to be applied to the probe pair. The polarities of the voltages to be applied to the probes are changed every time a flitting operation is performed for the electrode of the substrate, so that a trouble of unevenness in quantity of an adhered material on the probes can be eliminated.
摘要翻译：检查装置的探针卡设置有通过向与衬底的电极接触的一对探针施加电压而引起飞逝的电路，以将探针导电到基板，并且将开关电路电连接该探头对与放电电路自由切换要施加到探头对的电压的极性。每当对基板的电极进行飞溅操作时，施加到探针的电压的极性改变，从而可以消除探针上的粘附材料的不均匀性的问题。

8. 发明授权

US07633309B2 Inspection method, inspection apparatus and computer-readable storage medium storing program for inspecting an electrical property of an object 失效
标题翻译：检查方法，检查装置和用于检查物体的电气特性的计算机可读存储介质存储程序
公开(公告)号：US07633309B2
公开(公告)日：2009-12-15
申请号：US12003214
申请日：2007-12-20
申请人： Yasunori Kumagai , Ka Toh
发明人： Yasunori Kumagai , Ka Toh
IPC分类号： G01R31/02
CPC分类号： G01R31/2886 , G01R3/00
摘要： An inspection apparatus includes a fritting circuit applying a voltage between a probe pair composed of probes in pairs in contact with a substrate to cause a fritting phenomenon to establish electrical conduction between the probes and the substrate; and a switching circuit electrically connecting the probe pair and the flitting circuit and capable of freely switching between polarities of a voltage applied between the probe pair. Voltage is applied twice between the probe pair in contact with the substrate to thereby perform fritting twice. In the two times of fritting, the polarities of the voltage applied between the probe pair are changed.
摘要翻译：检查装置包括：熔接电路，其在由与基板接触成对的探针构成的探针对之间施加电压，引起烧结现象，以在探针和基板之间建立导电; 以及切换电路，电连接探针对和闪烁电路，并且能够自由地切换在探针对之间施加的电压的极性。在与基板接触的探针对之间施加电压两次，从而进行两次烧结。在两次烧结中，探针对之间施加的电压的极性发生变化。

9. 发明授权

US5094469A Trailer hitch device for motor vehicles 失效
标题翻译：用于电动车的拖车设备
公开(公告)号：US5094469A
公开(公告)日：1992-03-10
申请号：US615885
申请日：1990-11-20
申请人： Akihito Yamamoto , Michihiro Kawamura , Yasunori Kumagai , Kenichi Sato
发明人： Akihito Yamamoto , Michihiro Kawamura , Yasunori Kumagai , Kenichi Sato
IPC分类号： B62D25/08 , B60D1/06 , B60D1/14 , B60D1/48 , B60R19/48
CPC分类号： B60R19/48 , B60D1/48
摘要： In a trailer hitch device for a motor vehicle wherein a trailer hitch is mounted on a member beam, the improvement comprising the fact that the member beam has both its ends respectively fixed to right and left rear bumper stays and is covered with a rear bumper face, and that the trailer hitch is fixed to the member beam and has its coupling bowl portion at its distal end protruded rearward of the vehicle body of the vehicle through an opening provided in the bumper face.

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