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    • 9. 发明申请
    • Sample analyzer and sample analyzing method
    • 样品分析仪和样品分析方法
    • US20060210438A1
    • 2006-09-21
    • US11374109
    • 2006-03-14
    • Takaaki NagaiMasaharu ShibataNoriyoshi YoshidaShoichiro Asada
    • Takaaki NagaiMasaharu ShibataNoriyoshi YoshidaShoichiro Asada
    • G01N33/00
    • G01N15/14G01N15/147G01N2015/0069G01N2015/0073G01N2015/008G01N2015/0084G01N2015/1486G01N2035/0094G01N2035/1032
    • A sample analyzer capable of operating in a first measuring mode for measuring a sample and a second measuring mode for measuring a sample, comprising: a sample provider for providing a sample; a common reagent provider for providing a common reagent used in the first measuring mode and the second measuring mode; a special reagent provider for providing a special reagent used in the second measuring mode; a mode selector for selecting one of the first measuring mode and the second measuring mode; a measuring section for measuring the sample; and wherein in the first measuring mode, the sample provider and the common reagent provider operate so as to make a first mode sample comprising the sample and the common reagent, and the measuring section operates so as to measure the first mode sample, and in the second measuring mode, the sample provider, the common reagent provider and the special reagent provider operate so as to make a second mode sample comprising the sample, the common reagent and the special reagent, and the measuring section operates so as to measure the second mode sample, is disclosed. A sample analyzing method is also disclosed.
    • 一种能够在测量样品的第一测量模式下运行的样品分析仪和用于测量样品的第二测量模式,包括:用于提供样品的样品提供者; 用于提供在第一测量模式和第二测量模式中使用的常用试剂​​的常用试剂​​提供者; 用于提供在第二测量模式中使用的特殊试剂的专用试剂供应商; 模式选择器,用于选择第一测量模式和第二测量模式之一; 用于测量样品的测量部分; 并且其中在所述第一测量模式中,所述样本提供者和所述公共试剂提供者进行操作以便制作包含所述样本和所述公共试剂的第一模式样本,并且所述测量部分操作以测量所述第一模式样本,并且在 第二测量模式,样品提供者,常用试剂提供者和特殊试剂提供者进行操作,以便制备包含样品,普通试剂和特殊试剂的第二模式样品,并且测量部分操作以测量第二模式 样品被披露。 还公开了一种样品分析方法。