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1. 发明专利

JP2004085489A Thermal flowmeter 有权
公开(公告)号：JP2004085489A
公开(公告)日：2004-03-18
申请号：JP2002249693
申请日：2002-08-28
申请人： Yamatake Corp , 株式会社山武
发明人： HAYASHI YASUE , SEO MASAMI
IPC分类号： G01F1/696
摘要： PROBLEM TO BE SOLVED: To provide a thermal flowmeter capable of specifying a kind of gas automatically without needing operator's setting. SOLUTION: The thermal flow meter measures a gas flow as follows: a flow detecting circuit 22 outputs sensor output signal Vout representing the temperature difference between a temperature detected by a 1st temperature sensor Ru and that detected by a 2nd temperature sensor Rd of the flow sensor; a heater driving electric quantity detecting means 24a detects electric quantity supplied to a heater element Rh; a gas kind determining means 24b specifies the kind of gas flowing through a flow sensor based on a driving electric quantity; a flow calculating means 24c calculates the gas flow based on the sensor output Vout and the specified gas kind. COPYRIGHT: (C)2004,JPO

2. 发明专利

JP2010236972A Heater, and gas physical property value measuring system 有权
标题翻译：加热器和气体物理价值测量系统
公开(公告)号：JP2010236972A
公开(公告)日：2010-10-21
申请号：JP2009084038
申请日：2009-03-31
申请人： Yamatake Corp , 株式会社山武
发明人： OISHI YASUHARU , HAYASHI YASUE , MUTO HIROYUKI , KIYOTA MISAKO , MORIO SHUJI
IPC分类号： G01N25/18
摘要： PROBLEM TO BE SOLVED: To provide a heater capable of automatically detecting the abnormality of a heating resistor. SOLUTION: The heater includes the heating resistor 61, first and second temperature measuring resistor elements 62 and 63 respectively measuring the temperature of the atmospheric gas of the heating resistor 61 when the heating resistor 61 generates no heat as a standard temperature and the temperature of the atmospheric gas of the heating resistor 61 when the heating resistor 61 generates heat as a reference temperature, and a determining part for determining the occurrence of abnormality in the heating resistor 61 in the case that the ratio of the difference between the reference temperature and standard temperature of the heating resistor 61 to the difference between the heating temperature and standard temperature of the heating resistor 61 reaches a threshold value or above. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够自动检测加热电阻器的异常的加热器。解决方案：加热器包括加热电阻器61，第一和第二温度测量电阻器元件62和63，分别测量当加热电阻器61不产生热量作为标准温度时加热电阻器61的气氛气体的温度，当加热电阻器61产生热量作为基准温度时加热电阻器61的气氛气体的温度，以及用于确定加热电阻器61的异常发生的确定部件，在基准温度并且加热电阻器61的标准温度与加热电阻器61的加热温度和标准温度之差达到阈值以上。版权所有（C）2011，JPO＆INPIT

3. 发明专利

JP2010237005A Gas physical property value measuring system, gas physical property value measuring method, heat value calculating formula forming system, heat value calculating formula forming method, heat value calculating system, and heat value calculating method 有权
标题翻译：气体物理价值测量系统，气体物理性能测量方法，热值计算公式形成系统，热值计算公式形成方法，热值计算系统和热值计算方法
公开(公告)号：JP2010237005A
公开(公告)日：2010-10-21
申请号：JP2009084751
申请日：2009-03-31
申请人： Yamatake Corp , 株式会社山武
发明人： OISHI YASUHARU , HAYASHI YASUE , MUTO HIROYUKI , KIYOTA MISAKO , MORIO SHUJI
IPC分类号： G01N25/18 , G01N25/22
摘要： PROBLEM TO BE SOLVED: To provide a device capable of stably measuring the physical property value of gas.
SOLUTION: The gas physical property value measuring system includes: a plurality of microchips 8A, 8B and 8C respectively containing heating resistors; a drive circuit 303 for applying a plurality of different powers to the respective heating resistors of a plurality of the microchips 8A, 8B and 8C to generate heat from the respective heating resistors of a plurality of the microchips 8A, 8B and 8C at a plurality of different heating temperatures; and a radiation coefficient calculating module 301 for calculating the radiation coefficient of the gas on the basis of a plurality of power values, a plurality of heating temperature values, and the gas temperature value of the gas thermally equilibrated with a plurality of the respective heating resistors.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供能够稳定地测量气体的物理性能的装置。气体物性值测量系统包括：分别包含加热电阻器的多个微芯片8A，8B和8C; 驱动电路303，用于向多个微芯片8A，8B和8C的各个加热电阻施加多个不同的功率，以从多个微芯片8A，8B和8C的各个加热电阻器产生多个多个不同的加热温度; 以及辐射系数计算模块301，用于基于多个功率值，多个加热温度值和用多个各自的加热电阻热平衡的气体的气体温度值来计算气体的辐射系数。版权所有（C）2011，JPO＆INPIT

4. 发明专利

JP2010236890A System for measuring values of properties and method of measuring values of properties 有权
标题翻译：用于测量属性值的系统和测量属性值的方法
公开(公告)号：JP2010236890A
公开(公告)日：2010-10-21
申请号：JP2009082401
申请日：2009-03-30
申请人： Yamatake Corp , 株式会社山武
发明人： HAYASHI YASUE , OISHI YASUYA , AOSHIMA SHIGERU
IPC分类号： G01N25/18
摘要： PROBLEM TO BE SOLVED: To provide a system for measuring values of properties and a method of measuring values of properties that are less apt to be affected by noise, and to prevent measurement errors from occurring easily.
SOLUTION: The system 1 for measuring values of properties includes a sensor chip 4, including heat generation elements and detecting elements disposed in a fluid to be measured to obtain the values of properties of a fluid to be measured, based on the change in the temperature of the detecting elements, when the heat generation elements are allowed to generate heat. The system 1 for measuring values of properties includes a drive circuit 5 for generating heat by giving power to the heat-generating elements; and a central information processing unit 6 for detecting watt hours required for a fixed temperature change of the detecting elements, when the heat generation elements are allowed to generate heat, calculating the thermal conductivity of a fluid to be measured, based on temperature of the detecting element, and calculating the values of properties of the fluid to be measured, based on the detected watt hours and calculated thermal conductivity.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于测量性质的系统和测量不太受噪声影响的性能的值的测量方法，并且防止测量误差容易发生。解决方案：用于测量性能值的系统1包括传感器芯片4，其包括发热元件和设置在待测量流体中的检测元件，以获得基于该变化的待测量流体的性质的值在检测元件的温度下，当允许发热元件产生热量时。用于测量属性值的系统1包括用于通过向发热元件供电来产生热量的驱动电路5; 以及中央信息处理单元6，用于检测当发热元件被允许产生热量时，检测元件的固定温度变化所需的瓦特时间，基于检测温度计算被测量流体的热导率元素，并且基于检测到的瓦特小时和计算的热导率计算要测量的流体的性质的值。版权所有（C）2011，JPO＆INPIT

5. 发明专利

JP2007248220A Heat conductivity measuring method, its measuring instrument, and gas component ratio measuring instrument 有权
标题翻译：热传导测量方法，其测量仪器和气体成分比例测量仪器
公开(公告)号：JP2007248220A
公开(公告)日：2007-09-27
申请号：JP2006071106
申请日：2006-03-15
申请人： Yamatake Corp , 株式会社山武
发明人： HAYASHI YASUE , OISHI YASUHARU , AOSHIMA SHIGERU
IPC分类号： G01N25/18
摘要： PROBLEM TO BE SOLVED: To provide a heat conductivity measuring method which enables the simple measurement of the heat conductivity of a pure gas or a mixed gas regardless of the temperature of the gas, and a heat conductivity measuring instrument.
SOLUTION: The microheater provided on the thin-walled region (e.g., microbridge) formed to a sensor chip and positioned in an atmosphere gas is used and the heat conductivity of the atmosphere gas is calculated according to the radiation coefficient of the microheater calculated from the power applied to the microheater and the heater temperature at the time of application of power. The sensor chip is supported in the atmosphere gas through a heat insulating body and the resistance value of the auxiliary heater provided to the sensor chip is controlled constant while the temperature of the atmosphere gas in the vicinity of the periphery of the sensor chip is made constant. The heat conductivity of the atmosphere gas is calculated from the drive power of the microheater at this time.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够简单地测量纯气体或混合气体的导热率而不管气体温度和热导率测量仪器的热导率测量方法。
解决方案：使用在形成于传感器芯片并位于气氛气体中的薄壁区域（例如，微桥）上提供的微加热器，并且根据微型加热器的辐射系数计算气氛气体的导热率根据施加到微加热器的功率和施加电力时的加热器温度计算。传感器芯片通过绝热体被支撑在大气中，并且将设置在传感器芯片上的辅助加热器的电阻值控制在恒定，同时传感器芯片周围附近的气氛气体的温度恒定。此时，由微加热器的驱动力计算气氛气体的导热率。版权所有（C）2007，JPO＆INPIT

6. 发明专利

JP2004085490A Pressure gauge and thermal type flowmeter 有权
公开(公告)号：JP2004085490A
公开(公告)日：2004-03-18
申请号：JP2002249701
申请日：2002-08-28
申请人： Yamatake Corp , 株式会社山武
发明人： SEO MASAMI , HAYASHI YASUE
IPC分类号： G01F1/698 , G01L11/00
摘要： PROBLEM TO BE SOLVED: To provide a pressure gauge that has a small size, low cost, and simple constitution. SOLUTION: An ambient temperature sensor Rr detects the temperature of a gas. A heater element Rh generates heat so that the temperature of the element Rh may become higher than the temperature detected by means of the sensor Rr by a fixed temperature. A heater driving electric quantity detecting means 5a detects the driving electric quantity supplied to the heater element Rh. A pressure calculating means 5b finds the pressure of a gas which is in contact with the sensor Rr and element Rh based on the driving electric quantity. COPYRIGHT: (C)2004,JPO

7. 发明专利

JP2010237006A Gas physical property value measuring system, gas physical property value measuring method, heat value calculating formula forming system, heat value calculating formula forming method, heat value calculating system and heat value calculating method 有权
标题翻译：气体物理价值测量系统，气体物理性质值测量方法，热值计算公式形成系统，热值计算公式形成方法，热值计算系统和热值计算方法
公开(公告)号：JP2010237006A
公开(公告)日：2010-10-21
申请号：JP2009084778
申请日：2009-03-31
申请人： Yamatake Corp , 株式会社山武
发明人： OISHI YASUHARU , HAYASHI YASUE , MUTO HIROYUKI , KIYOTA MISAKO , MORIO SHUJI
IPC分类号： G01N25/18 , G01N25/22
摘要： PROBLEM TO BE SOLVED: To provide a device capable of stably measuring the physical property value of gas. SOLUTION: The gas physical property value measuring system includes: a microchip 8A containing a heating resistor; a drive circuit 303 applying a plurality of different powers to the heating resistor of the microchip 8A and generating heat from the heating resistor of the microchip 8A at a plurality of different heating temperatures; a radiation coefficient calculating module 301 calculating the radiation coefficient of the gas on the basis of a plurality of respective power values, a plurality of respective heating temperature values and the gas temperature value of the gas thermally equilibrated with the heating resistor; a sonic velocity sensor 262 detecting the sonic velocity of the gas; and a density calculating module 311 for calculating the density of the gas on the basis of the detected sonic velocity. The drive circuit 303 stops the feed of power to the heating resistor at least once during the generation of heat at a plurality of different heating temperatures from the heating resistor. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供能够稳定地测量气体的物理性能的装置。气体物性值测量系统包括：包含加热电阻器的微芯片8A; 驱动电路303向微芯片8A的加热电阻施加多个不同的功率，并且在多个不同的加热温度下从微芯片8A的加热电阻器产生热量; 辐射系数计算模块301基于多个相应的功率值，多个相应的加热温度值和与加热电阻器热平衡的气体的气体温度值来计算气体的辐射系数; 检测气体的声速的声速传感器262; 以及密度计算模块311，用于基于检测到的声速来计算气体的密度。驱动电路303在来自加热电阻器的多个不同的加热温度下产生热量期间停止向加热电阻器供电至少一次。版权所有（C）2011，JPO＆INPIT

8. 发明专利

JP2010237004A Gas physical property value measuring system 有权
标题翻译：气体物理价值测量系统
公开(公告)号：JP2010237004A
公开(公告)日：2010-10-21
申请号：JP2009084713
申请日：2009-03-31
申请人： Yamatake Corp , 株式会社山武
发明人： OISHI YASUHARU , HAYASHI YASUE , MUTO HIROYUKI , KIYOTA MISAKO , MORIO SHUJI
IPC分类号： G01N25/18
摘要： PROBLEM TO BE SOLVED: To provide a gas physical property value measuring system capable of accurately evaluating the measured physical property value of gas. SOLUTION: The gas physical property value measuring system includes: a microchip 8 including a heating resistor and a temperature measuring resistor element; a drive circuit 303 applying power to the heating resistor to generate heat from the heating resistor; a radiation coefficient calculating module 301 for calculating the radiation coefficient of the gas on the basis of a power value, the heating temperature value of the heating resistor, and the value of the equilibrium gas temperature of the gas thermally equilibrating with the heating resistor; and a radiation coefficient memory device 401 storing the calculated radiation coefficient in connection with the reference temperature of the gas measured by the temperature measuring resistor element when no power is applied to the heating resistor. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够精确地评价测定的气体物性值的气体物性值测量系统。气体物性值测量系统包括：包括加热电阻器和温度测量电阻器元件的微芯片8; 驱动电路303向加热电阻器施加电力以从加热电阻器产生热量; 辐射系数计算模块301，用于基于功率值，加热电阻器的加热温度值和与加热电阻器热平衡的气体的平衡气体温度的值来计算气体的辐射系数; 以及辐射系数存储装置401，当没有电力施加到加热电阻器时，存储与由温度测量电阻器元件测量的气体的参考温度相关的计算的辐射系数。版权所有（C）2011，JPO＆INPIT

9. 发明专利

JP2010236983A Sensor assembly, and instrument for measuring physical property value of fluid 审中-公开
标题翻译：传感器总成，以及用于测量流体物理属性值的仪器
公开(公告)号：JP2010236983A
公开(公告)日：2010-10-21
申请号：JP2009084287
申请日：2009-03-31
申请人： Yamatake Corp , 株式会社山武
发明人： OISHI YASUHARU , HAYASHI YASUE , MUTO HIROYUKI , KIYOTA MISAKO , MORIO SHUJI
IPC分类号： G01N25/18
摘要： PROBLEM TO BE SOLVED: To improve the measuring precision of the physical property value of a fluid such as natural gas.
SOLUTION: This sensor assembly includes a sensor unit 6 having a substrate 60, the insulator 65 arranged on the surface of the substrate 60 and the first resistor 61 provided on the insulator 65 and used for measuring the physical property value of the fluid coming into contact with the surface of the insulator 65 on the basis of the first drive power applied to the first resistor 61 and the temperature of the first resistor 61, the cover 7 provided to the sensor unit 6 so as to cover the insulator 65 while ensuring a space 72 permitting the fluid to flow along the surface of the insulator 65, and a second resistor 64 for controlling the temperature of at least one of the sensor unit 6 and the cover 7 corresponding to second drive power to be applied.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提高天然气等流体的物性值的测定精度。解决方案：该传感器组件包括具有衬底60的传感器单元6，布置在衬底60的表面上的绝缘体65和设置在绝缘体65上的第一电阻器61，用于测量流体的物理性质基于施加到第一电阻器61的第一驱动功率和第一电阻器61的温度，设置到传感器单元6的盖7以覆盖绝缘体65的方式与绝缘体65的表面接触，同时确保允许流体沿着绝缘体65的表面流动的空间72，以及用于控制对应于要施加的第二驱动功率的传感器单元6和盖7中的至少一个的温度的第二电阻器64。版权所有（C）2011，JPO＆INPIT

10. 发明专利

JP2010210555A System for measuring physical property value of gas, method for measuring physical property value of gas, system for forming heating value calculation expression, method for forming heating value calculation expression, system for calculating heating value and method for calculating heating value 有权
标题翻译：用于测量气体物理值的系统，用于测量气体物理值的方法，用于形成加热值计算表达的系统，形成加热值计算表达的方法，计算加热值的系统和计算加热值的方法
公开(公告)号：JP2010210555A
公开(公告)日：2010-09-24
申请号：JP2009059175
申请日：2009-03-12
申请人： Yamatake Corp , 株式会社山武
发明人： OISHI YASUHARU , HAYASHI YASUE , MUTO HIROYUKI , KIYOTA MISAKO , MORIO SHUJI
IPC分类号： G01N25/18 , G01N33/22
摘要： PROBLEM TO BE SOLVED: To provide a device capable of stably measuring a physical property value of a gas. SOLUTION: A system for measuring the physical property value of the gas includes: a microchip 8A having a heating resistor; a driving circuit 303 supplying a plurality of different powers to the heating resistor of the microchip 8A and making the microchip 8A generate heat at a plurality of different heating temperatures; and a heat radiation coefficient calculation module 301 for calculating a heat radiation coefficient of a gas based on the values of the plurality of powers, the values of the plurality of heating temperature, and the gas temperature of the gas thermally equilibrated with the heating resistor. The supply of power to the heating resistor is stopped at least once while the driving circuit 303 makes the heating resistor generate heat at the plurality of different heating temperatures. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供能够稳定地测量气体的物理特性值的装置。解决方案：用于测量气体的物理性质的系统包括：具有加热电阻器的微芯片8A; 驱动电路303，向微芯片8A的加热电阻提供多个不同的功率，并使微芯片8A在多个不同的加热温度下产生热量; 以及热辐射系数计算模块301，用于基于多个功率的值，多个加热温度的值和与该加热电阻器热平衡的气体的气体温度来计算气体的散热系数。至于加热电阻器的电力供应至少停止一次，而驱动电路303使加热电阻器在多个不同的加热温度下产生热量。版权所有（C）2010，JPO＆INPIT

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