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1. 发明申请

WO0147215A1 PORTABLE TELEPHONE 审中-公开
标题翻译：便携式电话
公开(公告)号：WO0147215A1
公开(公告)日：2001-06-28
申请号：PCT/JP0008829
申请日：2000-12-13
申请人： YAMAHA CORP , IIDA SHUNICHI
发明人： IIDA SHUNICHI
IPC分类号： H04M1/00 , H04B7/26 , H04M1/60 , H04Q7/38 , G10K15/04
CPC分类号： H04M1/6008
摘要： When a musical piece is designated and reproduction conditions are inputted through an input section (18) so that the tune may be the background music superposed on the speech, a portable telephone (1) controls a tune reproducing section (26) to reproduce the designated melody in the order according to the reproduction conditions based on the inputted setting. Since specified musical pieces are reproduced in a specified order during speech, the intenTion of the speaker to terminate the call can be implied to the company.
摘要翻译：当指定音乐作品并且通过输入部分（18）输入再现条件使得曲调可以是叠加在语音上的背景音乐时，便携式电话（1）控制乐曲再现部分（26）再现指定的根据输入的设置根据再现条件按顺序旋转。由于在演讲期间以指定的顺序再现了特定的乐曲，所以终止通话的演讲者的意图可以暗示给公司。

2. 发明专利

AU1888701A Portable telephone 未知
公开(公告)号：AU1888701A
公开(公告)日：2001-07-03
申请号：AU1888701
申请日：2000-12-13
申请人： YAMAHA CORP
发明人： IIDA SHUNICHI
IPC分类号： H04M1/00 , H04B7/26 , H04M1/60 , H04Q7/38 , G10K15/04

3. 发明专利

JPH09298221A SEMICONDUCTOR TEST DEVICE 失效
公开(公告)号：JPH09298221A
公开(公告)日：1997-11-18
申请号：JP11090796
申请日：1996-05-01
申请人： YAMAHA CORP
发明人： IIDA SHUNICHI
IPC分类号： G01R31/26 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To realize a semiconductor test device which is capable of improving a semiconductor in reliability while emitting test items by a method wherein items other than representative items are tested under the conditions that the test result of representative test item is closer to a desired value than a first reference value out of two or more reference values. SOLUTION: Test items closely correlative to each other are grouped (S12 ) through a semiconductor device, and representative test items are selected out of test item groups (S14 ). Test items which are liable to vary widely with devices, easily tested, and very closely correlative to other test items are selected as representative test items. The reference values of the selected representative test items are set, the range of test value of each test item closest to a desired value is represented by a, and ranges of test value are represented by b, c, and d in descending order of approximation to a desired value (S16 ). Two sets of boundaries between the ranges of test values are called a reference value. The range b of test value is close enough to a design target value and reliable enough when the other test items of the same group are cleared.

4. 发明专利

JPH0945738A SEMICONDUCTOR INTEGRATED CIRCUIT TEST METHOD AND APPARATUS AND WAFER PROBER 失效
公开(公告)号：JPH0945738A
公开(公告)日：1997-02-14
申请号：JP19781095
申请日：1995-08-02
申请人： YAMAHA CORP
发明人： IIDA SHUNICHI
IPC分类号： G01R31/26 , G01R1/06 , G01R1/073 , G01R31/28 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To avoid deterioration of the yield caused by an improper probe pressure by adjusting for optimum probe pressure, without incurring the load on the operator in the probe test of a semiconductor integrated circuit. SOLUTION: LSI tester 100 has a controller 101 which adjusts the height of a wafer support table 205 when it lifts to provide various probe pressures at which the probe test of a specified number of IC chips is executed to obtain their respective fraction defectives. One probe pressure which provides the lowest fraction defective on the record is selected and applied to following probe tests.

5. 发明专利

JPH10288649A METHOD AND DEVICE FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT 失效
公开(公告)号：JPH10288649A
公开(公告)日：1998-10-27
申请号：JP9759997
申请日：1997-04-15
申请人： YAMAHA CORP
发明人： IIDA SHUNICHI
IPC分类号： G01R31/26 , G01R31/28
摘要： PROBLEM TO BE SOLVED: To detect a failure than cannot be detected by a functional test by performing a DC test simultaneously in the cycle of the functional test. SOLUTION: An IC tester 1 has a plurality of test channels CH (CH1-CH6) for inputting and outputting test data for an LSI 2, a data pattern generation part 12 for generating test data, a comparator CMP for reading output data from the LSI 2 into a specific channel in the test channel CH and comparing it with expectation value data, and a judgment part 13 for making a judgment based on the comparison result. In this case, I/V conversion elements 3 (3a and 3b) for detecting a current that flows to an aimed pin that is being subjected to a functional test are provided, and the detected current value is taken into a free tester channel in a plurality of tester channels CH, thus judging whether or not the DC characteristics of the aimed pin is acceptable.

6. 发明专利

JP2005315605A Testing arrangement and testing method for semiconductor device 审中-公开
标题翻译：半导体器件的测试布置和测试方法
公开(公告)号：JP2005315605A
公开(公告)日：2005-11-10
申请号：JP2004130914
申请日：2004-04-27
申请人： Yamaha Corp , ヤマハ株式会社
发明人： IIDA SHUNICHI
IPC分类号： G01R31/30 , G01R31/28
摘要： PROBLEM TO BE SOLVED: To provide a testing arrangement and testing method for semiconductor device capable of easily conducting strength evaluation of electromagnetic sensitivity of an LSI simple body against an electric wave.
SOLUTION: An antenna elevator 7 moves an antenna for a near field irradiation 4 to a specific position overhead of a tested LSI2 based on the direction of a controller 15. The antenna for the near field irradiation 4 irradiates a wave based on the signal generated by a signal generator 5. The test pattern generated by the test pattern generator 10 is input in the tested LSI2 and the output pattern output from the tested LSI2 is input in a comparator 12. The comparator 12 compares the output pattern with an expected value pattern output from an expected value pattern generator 11 and outputs signal showing the comparison results to the controller 15. The controller 15 judged the existence of error functioning of the tested LSI2 from the signal. When there are error functioning of the tested LSI2, the controller 15 contains the strength of the wave at the moment in a memory 17.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：解决的问题：提供能够容易地对LSI简单体的电磁敏感度进行电波强度评估的半导体装置的测试装置和测试方法。解决方案：天线电梯7基于控制器15的方向将近场照射4的天线移动到被测试的LSI2的特定位置开销。用于近场照射的天线4照射基于信号发生器5产生的信号。由测试图形发生器10产生的测试图案被输入到测试LSI2中，并且在比较器12中输入从测试LSI2输出的输出模式。比较器12将输出模式与预期的从期望值图案生成器11输出的值图案，并将表示比较结果的信号输出到控制器15.控制器15根据信号判断测试LSI2的误差功能的存在。当测试的LSI2出现故障时，控制器15包含存储器17中此刻的波的强度。版权所有：（C）2006，JPO＆NCIPI

7. 发明专利

JP2001281303A SEMICONDUCTOR INTEGRATED CIRCUIT TESTING DEVICE, CALIBRATION METHOD FOR IT, AND RECORDING MEDIUM 失效
公开(公告)号：JP2001281303A
公开(公告)日：2001-10-10
申请号：JP2000089816
申请日：2000-03-28
申请人： YAMAHA CORP
发明人： IIDA SHUNICHI
IPC分类号： G01R31/26 , G01R31/28 , G01R31/316 , G01R35/00
摘要： PROBLEM TO BE SOLVED: To suppress a relative error of a voltage set value fed to each pin of a measured device within the resolution range of a measurement system. SOLUTION: The semiconductor integrated circuit testing device is provided with a common-use direct current measurement part 16 measuring an actual voltage value, which is fed from a specific related circuit in the semiconductor integrated circuit testing device connected to respective pins of a measured device 100 to the respective pin, for every pin during inspection of the measured device, a ROM 12 storing a voltage preset value fed to each pin of the measured device during the inspection time, and a CPU 10 finding an error between a voltage measurement value measured by means of the direct current measurement part 16 and fed to each pin and the preset value for every pin, performing feedback so that a voltage value having the opposite polarity to the error polarity and serving as a correction value is impressed to a pin having an error above an allowance value in the measured device and setting a supply voltage so as to lower the error below the allowance value.

8. 发明专利

JP2001177605A PORTABLE TELEPHONE SET 失效
公开(公告)号：JP2001177605A
公开(公告)日：2001-06-29
申请号：JP36196099
申请日：1999-12-20
申请人： YAMAHA CORP
发明人： IIDA SHUNICHI
IPC分类号： H04M1/00 , H04B7/26 , H04M1/60 , H04Q7/38
摘要： PROBLEM TO BE SOLVED: To provide a portable telephone set capable of implying a speaker's intention to an opposite party during a call. SOLUTION: The telephone set has an input 18 for designating a piece of music to be reproduced at the time of incoming call and designating the reproducing condition of the piece of music, a voice processing part 24 having an encoding means and a decoding means, a communication means for transmitting the output signal of the encoding means and supplying a received signal to the decoding means, a piece of music reproducing part 26 for reproducing a piece of music data to generate a musical sound signal and a CPU 10 for controlling the piece of music reproducing means so as to reproduce a prescribed piece of music in a prescribed order at the time of a incoming call based on the designation of the piece of music and the reproducing condition of the piece of music set by the input means.

9. 发明专利

JPH1026655A TESTING APPARATUS FOR LSI 失效
公开(公告)号：JPH1026655A
公开(公告)日：1998-01-27
申请号：JP18256996
申请日：1996-07-11
申请人： YAMAHA CORP
发明人： IIDA SHUNICHI
IPC分类号： G01R31/26 , G01R31/28
摘要： PROBLEM TO BE SOLVED: To obtain a testing apparatus, for an LSI, by which a multipin LSI can be tested in the small number of test pins and which is low-cost. SOLUTION: A plurality of test patterns are set in such a way that output pins (pout) 1, 2, 3, 4 from which an expected value is to be obtained for every test pattern do not compete, and the output pins 1, 2, 3, 4 from which expected outputs are obtained by the respective test patterns are changed over by an output changeover part 25 so as to be fetches by one test pin. As a result, even when the number of pins at a test is small as a whole, a multipin LSI can be tested.

10. 发明专利

JP2005207868A Testing apparatus for semiconductor device 审中-公开
标题翻译：半导体器件的测试装置
公开(公告)号：JP2005207868A
公开(公告)日：2005-08-04
申请号：JP2004014282
申请日：2004-01-22
申请人： Yamaha Corp , ヤマハ株式会社
发明人： IIDA SHUNICHI
IPC分类号： G01R31/30
摘要： PROBLEM TO BE SOLVED: To provide a testing apparatus for semiconductor device, capable of easily evaluating the magnitude of electromagnetic susceptibility with respect to noise in LSI single body.
SOLUTION: The testing apparatus, for measuring the electromagnetic susceptibility of semiconductor device to noise, is constituted so that an electromagnetic probe scanner 5 moves the electromagnetic probe 3 on a wiring pattern, extending from a tested terminal of the tested LSI2; and noise is generated from the electromagnetic probe 3, based on the instruction of a controller 18. The test pattern, generated by a test pattern generator 10, is input in the LSI2 to be tested, the output pattern from the tested LSI2 is input in a comparator 12, the comparator 12 compares the output pattern and an expected value pattern output from an expected value pattern generator 11 and output a signal, indicating the result of the comparison, to a controller 18. The controller 18 existence the presence of the misoperations of the tested LSI2, based on the signal. When there is a misoperation in the LSI2 to be tested, the controller 18 is to contain the electromagnetic-field strength generated by the electromagnetic probe 3, in a memory 17.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种用于半导体器件的测试装置，能够容易地评估LSI单体中的噪声对电磁敏感度的大小。解决方案：用于测量半导体器件对噪声的电磁敏感性的测试装置被构造成使得电磁探测器5将电磁探头3移动到从被测试的LSI2的测试端延伸的布线图案上; 并根据控制器18的指示从电磁探头3产生噪声。由测试图形发生器10产生的测试图形被输入到要测试的LSI2中，来自测试LSI2的输出模式被输入比较器12，比较器12比较输出模式和从期望值模式发生器11输出的期望值模式，并将指示比较结果的信号输出到控制器18.控制器18存在错误操作的测试LSI2。当要测试的LSI2中存在误操作时，控制器18将电磁探头3产生的电磁场强度存储在存储器17中。（C）2005年，JPO＆NCIPI

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