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    • 1. 发明申请
    • X-RAY FLUORESCENCE SYSTEM WITH APERTURED MASK FOR ANALYZING PATTERNED SURFACES
    • 用于分析图形表面的带有掩模的X射线荧光体系
    • WO2005015189A2
    • 2005-02-17
    • PCT/US2004/026073
    • 2004-08-12
    • X-RAY OPTICAL SYSTEMS, INC.TECHNOS CO., LTDCHEN, ZewuTERADA, Shinichi
    • CHEN, ZewuTERADA, Shinichi
    • G01N23/00
    • G01N23/223G01N2223/076
    • Measurement technique and apparatus for examining a region of a patterned surface such as an integrated circuit (IC). Excitation x-ray, neutron, particle-beam or gamma ray radiation is directed toward a two-dimensional sample area of the IC. Emissions (e.g., x-ray fluorescence - XRF) from the sample area are detected. A mask is placed in a planar radiation path formed by the source, detector and the sample area, and in one embodiment moveable relative to the sample area. The mask includes an elongate aperture to substantially confine the excitation radiation directed to the sample area, and the emissions from the sample area, to the planar radiation path when arranged parallel to a first axis of the two-dimensional sample area. The invention allows predictive measurement of feature characteristics in active circuit regions of the IC, using sample areas outside of these regions.
    • 用于检查诸如集成电路(IC)的图案化表面的区域的测量技术和装置。 激发X射线,中子,粒子束或伽马射线辐射指向IC的二维样本区域。 检测来自样品区域的排放(例如x射线荧光XRF)。 掩模被放置在由源,检测器和样品区域形成的平面辐射路径中,并且在一个实施例中可相对于样品区域移动。 当平行于二维样本区域的第一轴线布置时,掩模包括细长孔,以基本上限制被引导到样品区域的激发辐射,以及从样品区域到平面辐射路径的发射。 本发明允许使用这些区域之外的采样区域来预测测量IC的有源电路区域中的特征特征。
    • 2. 发明申请
    • PORTABLE AND ON-LINE X-RAY ANALYZER
    • 便携式和在线X射线分析仪
    • WO2006060347A1
    • 2006-06-08
    • PCT/US2005/043013
    • 2005-11-29
    • X-RAY OPTICAL SYSTEMS, INC.CHEN, ZewuGIBSON, Walter
    • CHEN, ZewuGIBSON, Walter
    • G01N23/223
    • G01N23/223G01N33/18G01N33/1813G01N2223/076G21K2201/064
    • An x-ray fluorescence technique for detecting, e.g., the level of arsenic in a sample of water or body fluid. Arsenic and lead are expected to fluoresce in a first energy band and lead is expected to also fluoresce separately in a second energy band. An excitation path directs x-rays toward the sample; a first detection path detects x-ray fluorescence of the first energy band from the sample; and a second detection path detects x-ray fluorescence of the second energy band from the sample. The level of arsenic can be obtained by analyzing the x-ray fluorescence from both detection paths, and using a constant, e. g., the intensity ratio of PbL α1, to PbL β1 , which relates the level of lead in the second energy band to the level of lead in the first energy band. The excitation path and each detection path may each include a monochromating optic to transmit the desired x-ray energy band, e.g., a doubly curved optic.
    • 用于检测例如水或体液样品中的砷水平的x射线荧光技术。 预计砷和铅将在第一个能带中发出荧光,预计在第二个能带中铅也将分别发荧光。 激发路径将X射线引向样品; 第一检测路径检测来自样品的第一能带的X射线荧光; 并且第二检测路径检测来自样品的第二能带的x射线荧光。 通过分析来自两个检测路径的X射线荧光,并使用常数e,可获得砷的含量。 例如,PbLa1a1与PbL1β1的强度比,其将第二能带中的铅的水平与第一能带中的铅的水平相关联。 激发路径和每个检测路径可以各自包括单色光学器件,以传输期望的x射线能带,例如双曲面光学元件。
    • 10. 发明申请
    • MONOCHROMATIC X-RAY MICRO BEAM FOR TRACE ELEMENT MAPPING
    • 单色X射线微光束跟踪元素映射
    • WO2007019053A1
    • 2007-02-15
    • PCT/US2006/028890
    • 2006-07-26
    • X-RAY OPTICAL SYSTEMS, INC.CHEN, ZewuGAO, NingGIBSON, Walter
    • CHEN, ZewuGAO, NingGIBSON, Walter
    • G21K1/06G01N23/223
    • G01N23/223B82Y10/00G01N2223/076G21K1/06G21K2201/061G21K2201/062G21K2201/064
    • An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.
    • 一种用于在x射线分析下激发样本的X射线系统或方法,使用弯曲单色光学器件将来自x射线源的单色x射线束引导到第一焦点区域。 第二光学器件位于单色X射线束内并接收单色X射线束,并将聚焦的X射线束引导到样品上的第二焦点区域。 检测器位于样品附近以由于聚焦的X射线束而从样品收集辐射。 弯曲单色光学器件在第一焦点区域处产生大于由第二焦点区域处的第二光学器件产生的光束尺寸的光束尺寸,因此,使用第二光学元件,样品上的光束尺寸因此减小。 公开了双折射单色光学器件和多毛细管光学器件作为光学器件的可能实现。