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1. 发明授权

US07017274B2 Multi-turn angle transducer 有权
公开(公告)号：US07017274B2
公开(公告)日：2006-03-28
申请号：US10642428
申请日：2003-08-14
申请人： Willibald Stobbe
发明人： Willibald Stobbe
IPC分类号： G01B7/30 , G01D5/34
CPC分类号： G01D5/145 , G01D5/04
摘要： A multiturn angle measuring device (1) with a first dimensional standard (9) that is non-rotatably connected to an input shaft (2) and which is sampled by a first scanning unit (10) to determine the angular position of the input shaft. Additional dimensional standards (11, 12, 13) measure the number of turns of the input shaft (2) and are arranged in parallel to each other. The rotational speed of each additional dimensional standard (11, 12, 13) is reduced by means of a reduction gearing from the preceding dimensional standard (9, 11, 12). A scanning device (21, 22, 23) for the sampling of each dimensional standard (11, 12, 13) is arranged on a circuit board (6). To provide a multiturn shaft encoder able to measure a high number of turns, even at high rotational speeds and/or large diameter input shafts, with compact construction and comparatively few multiturn stages, the input drive gear (40) fixed to the input shaft (2) and the first driven transmission gear (41) have axes of rotation (D40, D41) that are not parallel to each other. The flanks of the teeth (Z40, Z41) of the input drive gear (40) and of the wheel (411) of the first driven transmission gear (41) are not parallel to the axes of rotation (D40, D41) of the respective gears (40, 41), and the number of teeth (Z40) of the input gear (40) is smaller than the number of teeth (Z41) of the wheel (411) of the first transmission gear (41). The following transmission gears are again arranged parallel to the input shaft, and the drive pinion (412) of the first transmission gear (41) and the driven wheel of the second transmission gear (31) have helical gears.

2. 发明申请

US20080177494A1 Process and device for the parameterization of measuring device 有权
标题翻译：测量装置参数化过程和装置
公开(公告)号：US20080177494A1
公开(公告)日：2008-07-24
申请号：US12010092
申请日：2008-01-18
申请人： Josef Siraky , Willibald Stobbe , Ralf Steinmann
发明人： Josef Siraky , Willibald Stobbe , Ralf Steinmann
IPC分类号： G06F19/00
CPC分类号： G01D3/022 , G01D5/244
摘要： In a measuring device, the measured data of a data recording component (10) are transmitted to an evaluating component via an output device (12). Parameters of the measuring device are stored in a memory (18). For the purpose of parameterization, parameters from the evaluating component can be stored in the memory (18) over a data cable for transmitting the measured data. To this end, the output device (12) for this data cable (Z) is operated at high impedance.
摘要翻译：在测量装置中，经由输出装置（12）将数据记录部件（10）的测量数据发送给评价部件。测量装置的参数被存储在存储器（18）中。为了参数化，来自评估组件的参数可以通过数据电缆存储在存储器（18）中，用于发送测量数据。为此，该数据电缆（Z）的输出装置（12）以高阻抗工作。

3. 发明授权

US08874401B2 Process and device for the parameterization of measuring device 有权
标题翻译：测量装置参数化过程和装置
公开(公告)号：US08874401B2
公开(公告)日：2014-10-28
申请号：US12010092
申请日：2008-01-18
申请人： Josef Siraky , Willibald Stobbe , Ralf Steinmann
发明人： Josef Siraky , Willibald Stobbe , Ralf Steinmann
IPC分类号： G06F15/00 , H03K17/00 , G01D5/244 , G01D3/02
CPC分类号： G01D3/022 , G01D5/244
摘要： In a measuring device, the measured data of a data recording component (10) are transmitted to an evaluating component via an output device (12). Parameters of the measuring device are stored in a memory (18). For the purpose of parameterization, parameters from the evaluating component can be stored in the memory (18) over a data cable for transmitting the measured data. To this end, the output device (12) for this data cable (Z) is operated at high impedance.
摘要翻译：在测量装置中，经由输出装置（12）将数据记录部件（10）的测量数据发送给评价部件。测量装置的参数被存储在存储器（18）中。为了参数化，来自评估组件的参数可以通过数据电缆存储在存储器（18）中，用于发送测量数据。为此，该数据电缆（Z）的输出装置（12）以高阻抗工作。

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