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    • 3. 发明授权
    • Method for thermally treating substrates
    • 基板热处理方法
    • US06919538B2
    • 2005-07-19
    • US10433253
    • 2001-11-28
    • Jakob SzekereschPeter DressUwe DietzeWerner Saule
    • Jakob SzekereschPeter DressUwe DietzeWerner Saule
    • H05B3/00H01L21/00H01L21/02H01L21/027F27B5/14
    • H01L21/67248
    • To increase the temperature homogeneity on the surface of a substrate that is to be thermally treated, a method for thermally treating substrates is provided, according to which the substrate is heated by several separately controllable heating elements. A desired-value profile is predefined for each of said heating elements. The method comprises the following steps: locally-analysed measurement of the temperature of the surface of the substrate that faces away from the heating elements, during the thermal treatment; determination of the temperature inhomogeneities occurring on the substrate surface; definition of new desired-value profiles based on said temperature inhomogeneities; and preparation of the new desired-value profiles for subsequent treatments.
    • 为了提高待热处理的基板的表面上的温度均匀性,提供了一种热处理基板的方法,根据该方法,基板被几个可单独控制的加热元件加热。 为每个所述加热元件预定义期望值曲线。 该方法包括以下步骤:在热处理期间局部分析测量衬底表面远离加热元件的温度; 确定在基板表面上发生的温度不均匀性; 基于所述温度不均匀性定义新的期望值曲线; 并为后续处理准备新的期望值曲线。