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1. 发明申请

US20110261348A1 Optical Calibration and Testing Device for Machine Tools 失效
标题翻译：机床光学校准和测试装置
公开(公告)号：US20110261348A1
公开(公告)日：2011-10-27
申请号：US13075249
申请日：2011-03-30
申请人： Wen-Yuh Jywe , Chia-Hung Wu , I-Ching Chen , Tung-Hui Hsu , Ren-Chieh Fung , Teng-Yu Yang
发明人： Wen-Yuh Jywe , Chia-Hung Wu , I-Ching Chen , Tung-Hui Hsu , Ren-Chieh Fung , Teng-Yu Yang
IPC分类号： G01B11/02
CPC分类号： G01B11/272 , G01B11/26
摘要： An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.
摘要翻译：用于机床的光学校准和测试装置包括光源单元，分束器和至少一个光电检测器。光源发射激光束击中光束分离器，并被分成两束。一个垂直于光源单元的基础，另一个与基座平行，以测试机床的直线度，倾斜角度，垂直度，垂直列倾斜度，垂直列平行度和导杆倾斜度。如果没有测试错误，则测试光点的位置与初始光斑的位置一致。如果有错误，则测试光斑的位置会根据错误而有所不同。

2. 发明授权

US08542358B2 Optical calibration and testing device for machine tools 失效
标题翻译：机床光学校准和测试装置
公开(公告)号：US08542358B2
公开(公告)日：2013-09-24
申请号：US13075249
申请日：2011-03-30
申请人： Wen-Yuh Jywe , Chia-Hung Wu , I-Ching Chen , Tung-Hui Hsu , Ren-Chieh Fung , Teng-Yu Yang
发明人： Wen-Yuh Jywe , Chia-Hung Wu , I-Ching Chen , Tung-Hui Hsu , Ren-Chieh Fung , Teng-Yu Yang
IPC分类号： G01B11/00 , G01B11/26
CPC分类号： G01B11/272 , G01B11/26
摘要： An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.
摘要翻译：用于机床的光学校准和测试装置包括光源单元，分束器和至少一个光电检测器。光源发射激光束击中光束分离器，并被分成两束。一个垂直于光源单元的基础，另一个与基座平行，以测试机床的直线度，倾斜角度，垂直度，垂直列倾斜度，垂直列平行度和导杆倾斜度。如果没有测试错误，则测试光点的位置与初始光斑的位置一致。如果有错误，则测试光斑的位置会根据错误而有所不同。

3. 发明申请

US20110102778A1 Geometric Error Measuring Device 有权
标题翻译：几何误差测量装置
公开(公告)号：US20110102778A1
公开(公告)日：2011-05-05
申请号：US12612400
申请日：2009-11-04
申请人： Wen-Yuh Jywe , Teng-Yu Yang , Tung-Hui Hsu
发明人： Wen-Yuh Jywe , Teng-Yu Yang , Tung-Hui Hsu
IPC分类号： G01B11/27
CPC分类号： G01B11/002
摘要： A geometric error measuring device includes a measuring module and at least one (quadrant) photodiode. The measuring module has an emitting deice, which may emit at least one light ray; the photodiode may receive the incident ray. Also, the trajectory of the incident ray is parallel with the direction of measurement. If there is no geometric error, the position of the incident light ray will coincide with the position of the measured light ray. If there is a geometric error, the position of the measured light ray will not coincide with the position of the incident light ray. After the data are processed and calculated, geometric errors in straightness, squareness and rotational angles (pitch, yaw and roll) may be obtained. These geometric errors may then be corrected in the setup of a machine.
摘要翻译：几何误差测量装置包括测量模块和至少一个（象限）光电二极管。测量模块具有可发射至少一个光线的发射导体; 光电二极管可以接收入射光线。此外，入射光线的轨迹与测量方向平行。如果没有几何误差，则入射光线的位置与被测光线的位置一致。如果存在几何误差，则测量光线的位置与入射光线的位置不一致。在处理和计算数据之后，可以获得平直度，矩形度和旋转角度（俯仰，偏航和滚动）的几何误差。然后可以在机器的设置中校正这些几何误差。

4. 发明授权

US08325333B2 Geometric error measuring device 有权
标题翻译：几何误差测量装置
公开(公告)号：US08325333B2
公开(公告)日：2012-12-04
申请号：US12612400
申请日：2009-11-04
申请人： Wen-Yuh Jywe , Teng-Yu Yang , Tung-Hui Hsu
发明人： Wen-Yuh Jywe , Teng-Yu Yang , Tung-Hui Hsu
IPC分类号： G01B11/26
CPC分类号： G01B11/002
摘要： A geometric error measuring device includes a measuring module and at least one (quadrant) photodiode. The measuring module has an emitting deice, which may emit at least one light ray; the photodiode may receive the incident ray. Also, the trajectory of the incident ray is parallel with the direction of measurement. If there is no geometric error, the position of the incident light ray will coincide with the position of the measured light ray. If there is a geometric error, the position of the measured light ray will not coincide with the position of the incident light ray. After the data are processed and calculated, geometric errors in straightness, squareness and rotational angles (pitch, yaw and roll) may be obtained. These geometric errors may then be corrected in the setup of a machine.
摘要翻译：几何误差测量装置包括测量模块和至少一个（象限）光电二极管。测量模块具有可发射至少一个光线的发射导体; 光电二极管可以接收入射光线。此外，入射光线的轨迹与测量方向平行。如果没有几何误差，则入射光线的位置与被测光线的位置一致。如果存在几何误差，则测量光线的位置与入射光线的位置不一致。在处理和计算数据之后，可以获得平直度，矩形度和旋转角度（俯仰，偏航和滚动）的几何误差。然后可以在机器的设置中校正这些几何误差。

5. 发明授权

US07852478B1 Detecting assembly for a multi-axis machine tool 有权
标题翻译：检测多轴机床的组件
公开(公告)号：US07852478B1
公开(公告)日：2010-12-14
申请号：US12708481
申请日：2010-02-18
申请人： Wen-Yuh Jywe , Chien-Hung Liu , Tung-Hui Hsu , Chia-Ming Hsu
发明人： Wen-Yuh Jywe , Chien-Hung Liu , Tung-Hui Hsu , Chia-Ming Hsu
IPC分类号： G01B11/00
CPC分类号： G01B11/03 , B23Q17/24 , B23Q2230/002
摘要： A detecting assembly for multi-axis machine tools having a spindle and a turntable and has a detector, a lens device and a computer. The detector is connected to the spindle and has a mounting frame and two detecting segments. The mounting frame is connected to the spindle and has a connecting rod, a bottom board and multiple mounting boards. The detecting segments are mounted on the mounting boards and each has a light source and a sensor. The lens device is mounted on the turntable, extends into the detector and has a supporting shaft and a spherical lens. The spherical lens is mounted on an upper end of the supporting shaft to align light emitted from the light sources with corresponding sensors via the spherical lens. The computer is electrically connected to the detector to receive signals of the detecting segments of the detector and has a signal processor.
摘要翻译：一种用于具有主轴和转台的多轴机床的检测组件，并具有检测器，透镜装置和计算机。检测器连接到主轴，并具有安装框架和两个检测段。安装框架连接到主轴，并具有连杆，底板和多个安装板。检测段安装在安装板上，每个具有光源和传感器。透镜装置安装在转台上，延伸到检测器中，并具有支撑轴和球面透镜。球面透镜安装在支撑轴的上端，以通过球面透镜将来自光源的光与对应的传感器对准。计算机电连接到检测器以接收检测器的检测段的信号，并具有信号处理器。

6. 发明申请

US20100060906A1 Means for Measuring a Working Machine's Structural Deviation from Five Reference Axes 有权
标题翻译：用于测量工作机械与五个参考轴的结构偏差的方法
公开(公告)号：US20100060906A1
公开(公告)日：2010-03-11
申请号：US12206026
申请日：2008-09-08
申请人： Wen-Yuh Jywe , Chien-Hung Liu , Yi-Tsung Li , Tung-Hsien Hsieh , Tung-Hui Hsu , Hung-Shu Wang
发明人： Wen-Yuh Jywe , Chien-Hung Liu , Yi-Tsung Li , Tung-Hsien Hsieh , Tung-Hui Hsu , Hung-Shu Wang
IPC分类号： G01B11/00
CPC分类号： G01B11/272 , B23Q17/24 , B23Q2230/002
摘要： Means for measuring a working machine's structural deviation from five reference axes includes a main sensing body bonded with a main axis of the working machine (or controlled to revolve), and a lighting unit set around the main sensing body to circle about the main sensing body with a fixed radius (or the lighting unit radiates a light on the main sensing body from that radial distance and circles along with the main sensing body) such that as soon as the main sensing body has detected an optical signal, it is converted to an error signal informing of the working machine's structural deviation in two or three dimensional displacement.
摘要翻译：用于测量工作机械与五个参考轴的结构偏差的装置包括与工作机的主轴（或控制旋转）结合的主感测体，以及围绕主感测体围绕主感测体环绕的照明单元具有固定半径（或者照明单元从该径向距离辐射主感测体上的光并与主感测体一起旋转），使得一旦主感测体检测到光信号，就将其转换为误差信号通知工作机械在二维或三维位移中的结构偏差。

7. 发明授权

US07773234B2 Means for measuring a working machine's structural deviation from five reference axes 有权
标题翻译：用于测量工作机械与五个参考轴的结构偏差的手段
公开(公告)号：US07773234B2
公开(公告)日：2010-08-10
申请号：US12206026
申请日：2008-09-08
申请人： Wen-Yuh Jywe , Chien-Hung Liu , Yi-Tsung Li , Tung-Hsien Hsieh , Tung-Hui Hsu , Hung-Shu Wang
发明人： Wen-Yuh Jywe , Chien-Hung Liu , Yi-Tsung Li , Tung-Hsien Hsieh , Tung-Hui Hsu , Hung-Shu Wang
IPC分类号： G01B11/14
CPC分类号： G01B11/272 , B23Q17/24 , B23Q2230/002
摘要： Means for measuring a working machine's structural deviation from five reference axes includes a main sensing body bonded with a main axis of the working machine (or controlled to revolve), and a lighting unit set around the main sensing body to circle about the main sensing body with a fixed radius (or the lighting unit radiates a light on the main sensing body from that radial distance and circles along with the main sensing body) such that as soon as the main sensing body has detected an optical signal, it is converted to an error signal informing of the working machine's structural deviation in two or three dimensional displacement.
摘要翻译：用于测量工作机械与五个参考轴的结构偏差的装置包括与工作机的主轴（或控制旋转）结合的主感测体，以及围绕主感测体围绕主感测体环绕的照明单元具有固定半径（或者照明单元从该径向距离辐射主感测体上的光并与主感测体一起旋转），使得一旦主感测体检测到光信号，就将其转换为误差信号通知工作机械在二维或三维位移中的结构偏差。

8. 发明申请

US20120156320A1 MANUFACTURING-PROCESS EQUIPMENT 失效
标题翻译：制造过程设备
公开(公告)号：US20120156320A1
公开(公告)日：2012-06-21
申请号：US12971466
申请日：2010-12-17
申请人： Wen-Yuh Jywe , Jing-Chung Shen , Chin-Tien Yang , Chien-Hung Liu , Jau-Jiu Ju , Chia-Hung Wu , Chun-Chieh Huang , Lili Duan , Yuan-Chin Lee
发明人： Wen-Yuh Jywe , Jing-Chung Shen , Chin-Tien Yang , Chien-Hung Liu , Jau-Jiu Ju , Chia-Hung Wu , Chun-Chieh Huang , Lili Duan , Yuan-Chin Lee
IPC分类号： B29C59/16 , B29C37/00
CPC分类号： B23K26/0853
摘要： A manufacturing-process equipment has a platform assembly, a measurement feedback assembly and a laser-working assembly. The platform assembly has a base and a hybrid-moving platform. The base has a mounting frame. The hybrid-moving platform is mounted on the base and has a long-stroke moving stage and a piezo-driven micro-stage. The long-stroke moving stage has a benchmark set and a driving device. The piezo-driven micro-stage is connected to the long-stroke moving stage and has a working platform. The measurement feedback assembly is securely mounted on the platform assembly and has a laser interferometer, a reflecting device and a signal-receiving device. The laser-working assembly is mounted on the platform assembly, is electrically connected to the measurement feedback assembly and has a laser direct-writing head, a controlling interface device and a positioning interface device.
摘要翻译：制造过程设备具有平台组件，测量反馈组件和激光加工组件。平台组件具有基座和混合动力平台。底座有一个安装架。混合动力平台安装在基座上，具有长行程移动台和压电驱动微型平台。长冲程移动台具有基准组和驱动装置。压电驱动微型平台连接到长行程移动台，并具有工作平台。测量反馈组件牢固地安装在平台组件上，并具有激光干涉仪，反射装置和信号接收装置。激光加工组件安装在平台组件上，电连接到测量反馈组件，并具有激光直写头，控制接口装置和定位接口装置。

9. 发明授权

US08575791B2 Manufacturing-process equipment 失效
标题翻译：制造加工设备
公开(公告)号：US08575791B2
公开(公告)日：2013-11-05
申请号：US12971466
申请日：2010-12-17
申请人： Wen-Yuh Jywe , Jing-Chung Shen , Chin-Tien Yang , Chien-Hung Liu , Jau-Jiu Ju , Chia-Hung Wu , Chun-Chieh Huang , Lili Duan , Yuan-Chin Lee
发明人： Wen-Yuh Jywe , Jing-Chung Shen , Chin-Tien Yang , Chien-Hung Liu , Jau-Jiu Ju , Chia-Hung Wu , Chun-Chieh Huang , Lili Duan , Yuan-Chin Lee
IPC分类号： G01B11/02 , H02K41/02
CPC分类号： B23K26/0853
摘要： A manufacturing-process equipment has a platform assembly, a measurement feedback assembly and a laser-working assembly. The platform assembly has a base and a hybrid-moving platform. The base has a mounting frame. The hybrid-moving platform is mounted on the base and has a long-stroke moving stage and a piezo-driven micro-stage. The long-stroke moving stage has a benchmark set and a driving device. The piezo-driven micro-stage is connected to the long-stroke moving stage and has a working platform. The measurement feedback assembly is securely mounted on the platform assembly and has a laser interferometer, a reflecting device and a signal-receiving device. The laser-working assembly is mounted on the platform assembly, is electrically connected to the measurement feedback assembly and has a laser direct-writing head, a controlling interface device and a positioning interface device.
摘要翻译：制造过程设备具有平台组件，测量反馈组件和激光加工组件。平台组件具有基座和混合动力平台。底座有一个安装架。混合动力平台安装在基座上，具有长行程移动台和压电驱动微型平台。长冲程移动台具有基准组和驱动装置。压电驱动微型平台连接到长行程移动台，并具有工作平台。测量反馈组件牢固地安装在平台组件上，并具有激光干涉仪，反射装置和信号接收装置。激光加工组件安装在平台组件上，电连接到测量反馈组件，并具有激光直写头，控制接口装置和定位接口装置。

10. 发明授权

US08477321B2 Optical parallelism measurement device 失效
标题翻译：光学平行度测量装置
公开(公告)号：US08477321B2
公开(公告)日：2013-07-02
申请号：US13102137
申请日：2011-05-06
申请人： Wen-Yuh Jywe , Chia-Hung Wu , Yun-Feng Teng
发明人： Wen-Yuh Jywe , Chia-Hung Wu , Yun-Feng Teng
IPC分类号： G01B11/14
CPC分类号： G01B11/272
摘要： A high precision, rapidly operable optical parallelism measurement device includes a light source module, a light beam splitting module and at least two photoelectric detectors. The light source module has a light source and a light beam splitting element such that the light source module is able to produce two light beams perpendicular to each other. One of them is parallel to the moving direction, and is received by one of the detectors, while the other beam is split into two beams perpendicular to each other by the light beam splitting module. One beam is parallel to the former parallel by moving beam and is received by the other detector. With this scheme, the measurement can be performed by means of those perpendicular and parallel light beams without being affected by the structure of the machine platen to cause errors. The device can be manufactured with low cost and high precision. It is very compact in size and easy to carry and build up for rapid measurement.
摘要翻译：高精度，快速可操作的光学平行度测量装置包括光源模块，光束分离模块和至少两个光电探测器。光源模块具有光源和光束分离元件，使得光源模块能够产生彼此垂直的两个光束。它们中的一个与移动方向平行，并且被其中一个检测器接收，而另一个光束被光束分离模块分成两个彼此垂直的光束。一个光束通过移动光束平行于前者并行，并被另一个检测器接收。利用该方案，可以通过这些垂直和平行的光束进行测量，而不受机器压板的结构的影响，导致错误。该装置可以以低成本和高精度制造。它的尺寸非常紧凑，便于携带和建立快速测量。

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