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    • 8. 发明申请
    • METHOD AND APPARATUS FOR ANALYZING SUBSURFACES OF A TARGET MATERIAL
    • 用于分析目标材料表面的方法和装置
    • WO2013070397A1
    • 2013-05-16
    • PCT/US2012/060409
    • 2012-10-16
    • WELCH ALLYN, INC.
    • GOLDFAIN, ErvinLIA, Raymond A.
    • G01N21/17G01B9/02
    • A61B5/0066A61B5/0073A61B5/0075A61B5/0084G01B9/02091Y10T29/49002
    • A system that incorporates teachings of the present disclosure may include, for example, a method for aligning first and second light signals on an optical path directed to a target, where the first light signal provides a visualization of the target, and a portion of the second light signal reflects from at least one subsurface of the target. The method also includes aligning a first focal point of the first light signal and a second focal point of the second light signal, where the first focal point is at least in a first proximate location of the second focal point, and adjusting a first position of the first and second focal points to be in at least a second proximate location of the target without adjusting the at least first proximate location of the first focal point relative to the second focal point. Other embodiments are disclosed.
    • 结合本公开的教导的系统可以包括例如用于将第一和第二光信号对准在指向目标的光路上的方法,其中第一光信号提供目标的可视化,以及一部分 第二光信号从目标的至少一个地下反射。 该方法还包括对准第一光信号的第一焦点和第二光信号的第二焦点,其中第一焦点至少在第二焦点的第一近处位置,并且调整第二焦点 所述第一和第二焦点在所述目标的至少第二邻近位置中,而不相对于所述第二焦点调节所述第一焦点的所述至少第一近邻位置。 公开了其他实施例。