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1. 发明申请

US20160341397A1 INSULATOR-COATED QUANTUM DOTS FOR USE IN LED LIGHTING AND DISPLAY DEVICES 审中-公开
标题翻译：用于LED照明和显示设备的绝缘体涂层量子点
公开(公告)号：US20160341397A1
公开(公告)日：2016-11-24
申请号：US15161017
申请日：2016-05-20
申请人： Weiwen Zhao , Nathan McLaughlin , Michael Jansen , Juanita Kurtin
发明人： Weiwen Zhao , Nathan McLaughlin , Michael Jansen , Juanita Kurtin
IPC分类号： F21V9/16 , B05D7/04 , F21V3/04 , C03C17/34 , B05D7/00 , H01L33/50 , C09K11/02 , C03C17/42
CPC分类号： B05D7/54 , B82Y20/00 , B82Y40/00 , C03C17/007 , C03C17/008 , C03C17/42 , C03C2217/42 , C03C2217/445 , C03C2217/48 , C09K11/025 , C09K11/883 , F21K9/232 , F21K9/64 , G02B5/00 , H01L33/502 , H01L2933/0041 , Y10S977/774 , Y10S977/89 , Y10S977/95
摘要： A method comprises coating a plurality of quantum dots with one or more insulating layers, dispensing the coated quantum dots in a sheet, and installing the coated quantum dots sheet in an light emitting diode (LED) lighting or electronic display device.
摘要翻译：一种方法包括用一个或多个绝缘层涂覆多个量子点，将涂覆的量子点分配在片材中，以及将涂覆的量子点片材安装在发光二极管（LED）照明或电子显示装置中。

2. 发明申请

US20140264073A1 PHOTOLUMINESCENCE QUANTUM YIELD (PLQY) TEST OF QUANTUM DOT (QD) FILMS 有权
标题翻译：量子点（QD）膜的光致发光量子（PLQY）测试
公开(公告)号：US20140264073A1
公开(公告)日：2014-09-18
申请号：US14205040
申请日：2014-03-11
申请人： Nathan McLaughlin , Jason King , Michael Jansen
发明人： Nathan McLaughlin , Jason King , Michael Jansen
IPC分类号： G01N21/64 , G01J3/443
CPC分类号： G01N21/6489 , G01J3/0254 , G01J3/027 , G01J3/443
摘要： Photoluminescence quantum yield (PLQY) testing of quantum dots is described. In one embodiment, a method involves heating a sample including quantum dots and illuminating the sample with a light source. The method involves measuring spectra of luminescence from the illuminated quantum dots of the sample at each of a plurality of temperatures. The method involves measuring each of the plurality of temperatures with a temperature sensor. The PLQY at each of the plurality of temperatures is computed based on the measured spectra. The method further involves computing a relationship between QD emission wavelength of the measured spectra and the plurality of temperatures measured with the temperature sensor. The relationship is used to determine the QD temperature corresponding to each of the PLQY computations. In one embodiment, an integrating sphere moves on a gantry over the samples.
摘要翻译：描述了量子点的光致发光量子产率（PLQY）测试。在一个实施例中，一种方法包括加热包括量子点的样品并用光源照射样品。该方法包括在多个温度中的每一个处测量来自样品的照射量子点的发光光谱。该方法包括用温度传感器测量多个温度中的每一个。基于测量的光谱计算多个温度中的每一个的PLQY。该方法还涉及计算测量光谱的QD发射波长与用温度传感器测量的多个温度之间的关系。该关系用于确定与每个PLQY计算相对应的QD温度。在一个实施例中，积分球在样本上的台架上移动。

3. 发明授权

US09091655B2 Photoluminescence quantum yield (PLQY) test of quantum dot (QD) films 有权
标题翻译：量子点（QD）膜的光致发光量子产率（PLQY）测试
公开(公告)号：US09091655B2
公开(公告)日：2015-07-28
申请号：US14205040
申请日：2014-03-11
申请人： Nathan McLaughlin , Jason King , Michael Jansen
发明人： Nathan McLaughlin , Jason King , Michael Jansen
IPC分类号： G01N21/64 , G01J3/443
CPC分类号： G01N21/6489 , G01J3/0254 , G01J3/027 , G01J3/443
摘要： Photoluminescence quantum yield (PLQY) testing of quantum dots is described. In one embodiment, a method involves heating a sample including quantum dots and illuminating the sample with a light source. The method involves measuring spectra of luminescence from the illuminated quantum dots of the sample at each of a plurality of temperatures. The method involves measuring each of the plurality of temperatures with a temperature sensor. The PLQY at each of the plurality of temperatures is computed based on the measured spectra. The method further involves computing a relationship between QD emission wavelength of the measured spectra and the plurality of temperatures measured with the temperature sensor. The relationship is used to determine the QD temperature corresponding to each of the PLQY computations. In one embodiment, an integrating sphere moves on a gantry over the samples.
摘要翻译：描述了量子点的光致发光量子产率（PLQY）测试。在一个实施例中，一种方法包括加热包括量子点的样品并用光源照射样品。该方法包括在多个温度中的每一个处测量来自样品的照射量子点的发光光谱。该方法包括用温度传感器测量多个温度中的每一个。基于测量的光谱计算多个温度中的每一个的PLQY。该方法还涉及计算测量光谱的QD发射波长与用温度传感器测量的多个温度之间的关系。该关系用于确定与每个PLQY计算相对应的QD温度。在一个实施例中，积分球在样本上的台架上移动。

4. 发明申请

US20150028876A1 METHOD AND APPARATUS FOR TESTING A LIGHTING DEVICE UNDER TEMPERATURE 审中-公开
标题翻译：用于测试温度下的照明装置的方法和装置
公开(公告)号：US20150028876A1
公开(公告)日：2015-01-29
申请号：US14340440
申请日：2014-07-24
申请人： Nathan McLaughlin , Benjamin Smith , Norbert Puetz
发明人： Nathan McLaughlin , Benjamin Smith , Norbert Puetz
IPC分类号： G01R31/44 , G01N21/21 , G01N21/25
CPC分类号： G01R31/44 , G01N21/21 , G01N21/255 , G01N2201/125 , G01R31/2635
摘要： An apparatus to measure and collect data relating to properties of light for a plurality of light-producing devices comprises a rail having a longitudinal axis along which the plurality of light-producing devices is aligned. A measurement tool is mounted on the rail and moved under motor control to measure the data for each of the plurality of light-producing devices.
摘要翻译：用于测量和收集关于多个发光装置的光的属性的数据的装置包括具有纵向轴线的轨道，多个发光装置沿着该纵向轴对准。测量工具安装在导轨上并在电动机控制下移动以测量多个发光装置中的每一个的数据。

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