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1. 发明申请

WO2007005527A2 METHOD AND SYSTEM FOR MEASURING THE CURVATURE OF AN OPTICAL SURFACE 审中-公开
标题翻译：用于测量光学表面曲率的方法和系统
公开(公告)号：WO2007005527A2
公开(公告)日：2007-01-11
申请号：PCT/US2006/025383
申请日：2006-06-29
申请人： WAVEFRONT SCIENCES, INC. , ALTMAN, Zino , NEAL, Daniel, R. , COPLAND, Richard, J.
发明人： ALTMAN, Zino , NEAL, Daniel, R. , COPLAND, Richard, J.
IPC分类号： G01B11/24
CPC分类号： G01M11/025 , G01B11/25 , G01B11/255 , G01M11/0264
摘要： A system and method of measuring the curvature of a surface of a object operate by illuminating the object surface with a light pattern having a known size to produce a virtual reflected image from the object surface; measuring a size of the virtual reflected image produced by the object surface from the light pattern; and calculating a curvature of the object surface from the known size of the light pattern and the size of the virtual reflected image.
摘要翻译：通过用具有已知尺寸的光图案照射物体表面来产生物体表面的虚拟反射图像来测量物体表面的曲率的系统和方法; 从所述光图案测量由所述物体表面产生的虚拟反射图像的尺寸; 以及根据所述光图案的已知尺寸和所述虚拟反射图像的尺寸来计算所述物体表面的曲率。

2. 发明申请

WO2003102519A1 METHHOD AND SYSTEM FOR SENSING AND ANALYZING A WAVEFRONT OF AN OPTICALLY TRANSMISSIVE SYSTEM 审中-公开
标题翻译：用于传感和分析光传输系统的波形的甲基和系统
公开(公告)号：WO2003102519A1
公开(公告)日：2003-12-11
申请号：PCT/US2003/016972
申请日：2003-05-30
申请人： WAVEFRONT SCIENCES, INC. , NEAL, Daniel, R. , COPLAND, Richard, J. , RAMMAGE, Ron, R. , TOPA, Daniel, M. , HAMRICK, Daniel, R.
发明人： NEAL, Daniel, R. , COPLAND, Richard, J. , RAMMAGE, Ron, R. , TOPA, Daniel, M. , HAMRICK, Daniel, R.
IPC分类号： G01J1/00
CPC分类号： G01M11/0257 , G01J9/00 , G02B7/28 , G02B27/30 , G02B27/50
摘要： An enhanced dynamic range wavefront sensing system (100) includes a light source (110) disposed on a first side of an optically transmissive device (140), a wavefront sensor (180) disposed on a second side of an optically transmissive device, a relay imaging system (150, 170) disposed between the optically transmissive device and the wavefront sensor, and means for adjusting a distance between the light source and the optically transmissive device (120). Beneficially, the relay imaging system includes a range-limiting aperture (160) to insure that the wavefront sensor never goes out of range so that a feedback system (190) can be employed to move the light source one focal length away from the optically transmissive device.
摘要翻译：增强型动态范围波前感测系统（100）包括设置在光学透射装置（140）的第一侧上的光源（110），设置在光学透射装置的第二侧上的波前传感器（180）设置在光学透射装置和波前传感器之间的成像系统（150,170）以及用于调节光源和光学透射装置（120）之间的距离的装置。有利地，中继成像系统包括范围限制孔径（160），以确保波前传感器永远不超出范围，使得可以采用反馈系统（190）来将光源的一个焦距移动远离光学透射设备。

3. 发明申请

WO2002075367A2 TOMOGRAPHIC WAVEFRONT ANALYSIS SYSTEM AND METHOD OF MAPPING AN OPTICAL SYSTEM 审中-公开
标题翻译：图像波形分析系统和映射光学系统的方法
公开(公告)号：WO2002075367A2
公开(公告)日：2002-09-26
申请号：PCT/US2002/007573
申请日：2002-03-14
申请人： WAVEFRONT SCIENCES, INC. , NEAL, Daniel, R. , COPLAND, Richard, J.
发明人： NEAL, Daniel, R. , COPLAND, Richard, J.
IPC分类号： G02B
CPC分类号： G01M11/0264 , A61B3/1015 , G01J9/00
摘要： A method of measuring aberrations of a three-dimensional structure of an optical system, such as an eye, includes creating a plurality of light beams, optically imaging the light beams and projecting the light beams onto different locations in an optical system, receiving scattered light from each of the locations, and detecting individual wavefronts of the scattered light. The plurality of light beams may be created and projected simultaneously or sequentially. A system for measuring aberrations of a three-dimensional structure of an optical system includes a light source creating a plurality of light beams, an optical imaging system optically imaging the light beams and projecting the light beams onto different locations in the target optical system, and a wavefront sensor receiving scattered light from each of the locations and detecting individual wavefronts of the scattered light.
摘要翻译：测量诸如眼睛的光学系统的三维结构的像差的方法包括产生多个光束，光学地成像光束并将光束投射到光学系统中的不同位置，接收散射光从每个位置检测散射光的各个波前。可以同时或顺序地创建和投影多个光束。用于测量光学系统的三维结构的像差的系统包括产生多个光束的光源，对光束进行光学成像并将光束投影到目标光学系统中的不同位置的光学成像系统，以及波前传感器从每个位置接收散射光并检测散射光的各个波前。

4. 发明申请

WO2016089395A1 MODEL EYE PRODUCING A SPECKLE PATTERN HAVING A REDUCED BRIGHT-TO-DARK RATIO FOR USE WITH OPTICAL MEASUREMENT SYSTEM FOR CATARACT DIAGNOSTICS 审中-公开
标题翻译：产生具有降低亮度到深度比例的谱图的模型眼睛用于具有用于CATARACT诊断的光学测量系统
公开(公告)号：WO2016089395A1
公开(公告)日：2016-06-09
申请号：PCT/US2014/068412
申请日：2014-12-03
申请人： AMO WAVEFRONT SCIENCES, LLC. , COPLAND, Richard, J. , NEAL, Daniel, R. , RAYMOND, Thomas, D. , XIONG, Wei , PULASKI, Paul, D. , FARRER, Stephen, W. , VIDAL, Carmen, Canovas
发明人： COPLAND, Richard, J. , NEAL, Daniel, R. , RAYMOND, Thomas, D. , XIONG, Wei , PULASKI, Paul, D. , FARRER, Stephen, W. , VIDAL, Carmen, Canovas
IPC分类号： A61B3/00 , A61F9/008 , G09B23/34
CPC分类号： A61B3/00 , A61B3/0025 , A61B3/1015 , A61B2017/00716 , A61B2560/0233 , G09B23/34
摘要： A system includes a model eye and an optical measurement instrument, which includes: a corneal topography subsystem; a wavefront sensor subsystem; and an eye structure imaging subsystem. The subsystems may have a common fixation axis, and be operatively coupled to each other via a controller. The optical measurement instrument may perform measurements of the model eye to verify correct operation of the optical measurement instrument for measuring one or more characteristics of a subject's eye. The model eye may include an optically transmissive structure having a front curved surface and an opposite rear planar surface, and a material structure provided at the rear planar surface of the optically transmissive structure and having a characteristic to cause a speckle pattern of a portion of a coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2: 1.
摘要翻译：一种系统包括模型眼和光学测量仪器，其包括：角膜地形子系统; 波前传感器子系统; 和眼睛结构成像子系统。子系统可以具有共同的固定轴，并且经由控制器可操作地彼此耦合。光学测量仪器可以执行模型眼睛的测量，以验证用于测量受试者眼睛的一个或多个特征的光学测量仪器的正确操作。模型眼可以包括具有前曲面和相对的后平面的光学透射结构，以及设置在光学透射结构的后平面处的材料结构，并且具有导致一部分的散斑图案的特性相干光束被引导回光学透射结构的前曲面以具有小于2:1的亮暗比。

5. 发明申请

WO2003041609A3 SYSTEM AND METHOD FOR PERFOMING OPTICAL CORRECTIVE PROCEDURE WITH REAL-TIME FEEDBACK 审中-公开
公开(公告)号：WO2003041609A3
公开(公告)日：2003-05-22
申请号：PCT/US2002/035076
申请日：2002-11-01
申请人： WAVEFRONT SCIENCES, INC. , HEREKAR, Satish , COPLAND, Richard, James , NEAL, Davis , NEAL, Daniel, R.
发明人： HEREKAR, Satish , COPLAND, Richard, James , NEAL, Davis , NEAL, Daniel, R.
IPC分类号： A61B18/18
摘要： A real-time refractory control system includes a laser refractive surgery instrument (100) for modifying the refraction of the eye, an objective diagnostic apparatus (110) for measuring the refraction and aberrations of the eye, and an aperture-sharing element (120) to inject a refractive surgery beam and a monitoring diagnostic beam. An associated method of adjusting a refraction of an eye, includes: performing a procedure to modify the refraction of the eye; while the procedure is being performed, measuring the refraction an/or an aberration of the eye; and terminating the procedure when a change in the measured refraction and/or the measured aberration reaches a desired value.

6. 发明申请

WO2008058281A3 METHOD AND APPARATUS FOR OBTAINING THE DISTANCE FROM AN OPTICAL MEASUREMENT INSTRUMENT TO AND OBJECT UNDER TEST 审中-公开
公开(公告)号：WO2008058281A3
公开(公告)日：2008-05-15
申请号：PCT/US2007/084334
申请日：2007-11-09
申请人： WAVEFRONT SCIENCES, INC. , BAER, C., David , NEAL, Daniel, R. , COPLAND, Richard, James , NEAL, David, Austin
发明人： BAER, C., David , NEAL, Daniel, R. , COPLAND, Richard, James , NEAL, David, Austin
IPC分类号： G01B11/02
摘要： Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment, a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.

7. 发明申请

WO2003041609A2 SYSTEM AND METHOD FOR PERFOMING OPTICAL CORRECTIVE PROCEDURE WITH REAL-TIME FEEDBACK 审中-公开
标题翻译：用实时反馈来完成光学校正程序的系统和方法
公开(公告)号：WO2003041609A2
公开(公告)日：2003-05-22
申请号：PCT/US2002/035076
申请日：2002-11-01
申请人： WAVEFRONT SCIENCES, INC. , HEREKAR, Satish , COPLAND, Richard, James , NEAL, Davis , NEAL, Daniel, R.
发明人： HEREKAR, Satish , COPLAND, Richard, James , NEAL, Davis , NEAL, Daniel, R.
IPC分类号： A61F
CPC分类号： A61F9/00821 , A61B18/20 , A61B2017/00057 , A61B2018/00636 , A61F2009/00848 , A61F2009/00853 , A61F2009/00859 , A61F2009/00872 , A61F2009/0088
摘要： A real-time refractory control system includes a laser refractive surgery instrument for modifying the refraction of the eye, an objective diagnostic apparatus for measuring the refraction and aberrations of the eye, and an aperture-sharing element to inject a refractive surgery beam and a monitoring diagnostic beam. An associated method of adjusting a refraction of an eye, includes: performing a procedure to modify the refraction of the eye; while the procedure is being performed, measuring the refraction an/or an aberration of the eye; and terminating the procedure when a change in the measured refraction and/or the measured aberration reaches a desired value.
摘要翻译：实时耐火材料控制系统包括用于修改眼睛折射的激光屈光手术器具，用于测量眼睛的折射和像差的客观诊断装置，以及用于注射屈光手术束的孔径共享元件和监视诊断光束。调整眼睛折射的相关联的方法包括：执行改变眼睛折射的过程; 在执行该过程的同时，测量眼睛的折射和/或像差; 并且当测量的折射和/或测量的像差的变化达到期望值时终止该过程。

8. 发明公开

EP1194755A1 SUB-LENS SPATIAL RESOLUTION SHACK-HARTMANN WAVEFRONT SENSING 有权
标题翻译：具有更高比通过透镜装置给定的空间分辨能力夏克哈特曼WAVE前传感器
公开(公告)号：EP1194755A1
公开(公告)日：2002-04-10
申请号：EP00947095.6
申请日：2000-07-07
申请人： Wavefront Sciences Inc.
发明人： NEAL, Daniel, R. , MANSELL, Justin, D.
IPC分类号： G01J9/00
CPC分类号： G02B3/0056 , G01J9/00 , G02B3/0012 , G02B27/58
摘要： The spatial resolution of Hartmann-type sensors can be increased by moving a wavefront being sensed relative to the sensor by a non-integral number of apertures. The apertures may have a tilt on at least one side thereof. The lenslets themselves in a lenslet array may serve as the apertures or material may be provided on the lenslet array to create the apertures.

9. 发明申请

WO2010078070A3 SYSTEMS AND METHODS FOR MEASURING THE SHAPE AND LOCATION OF AN OBJECT 审中-公开
公开(公告)号：WO2010078070A3
公开(公告)日：2010-07-08
申请号：PCT/US2009/068631
申请日：2009-12-18
申请人： AMO WAVEFRONT SCIENCES,LLC , CAMPBELL, Charles, E. , FARRER, Stephen, W. , NEAL, Daniel, R. , POWERS, William, S. , RAYMOND, Thomas, D. , COPLAND, James
发明人： CAMPBELL, Charles, E. , FARRER, Stephen, W. , NEAL, Daniel, R. , POWERS, William, S. , RAYMOND, Thomas, D. , COPLAND, James
IPC分类号： A61B3/00
摘要： A system for determining the shape of an object and/or a distance of the object from the system includes a first plurality of light source, a second plurality of light sources, and a detector or detector array. The first plurality of light sources are disposed about a central axis and are separated from the central axis by radial distances defining an aperture in the first plurality of light sources. The system also includes an optical system adapted to provide light from the second plurality of light sources through the aperture to the object. The system may further include a computer configured to determine the shape of the object and/or the distance of the object from the system using light from the first and second plurality of light sources that is reflected from the object and received by the detector.

10. 发明公开

EP1896792A2 METHOD AND SYSTEM FOR MEASURING THE CURVATURE OF AN OPTICAL SURFACE 有权转让
标题翻译：方法和系统测量曲线的光学表面
公开(公告)号：EP1896792A2
公开(公告)日：2008-03-12
申请号：EP06799976.3
申请日：2006-06-29
申请人： Wavefront Sciences Inc.
发明人： ALTMAN, Zino , NEAL, Daniel, R. , COPLAND, Richard, J.
IPC分类号： G01B11/24
CPC分类号： G01M11/025 , G01B11/25 , G01B11/255 , G01M11/0264
摘要： A system and method of measuring the curvature of a surface of a object operate by illuminating the object surface with a light pattern having a known size to produce a virtual reflected image from the object surface; measuring a size of the virtual reflected image produced by the object surface from the light pattern; and calculating a curvature of the object surface from the known size of the light pattern and the size of the virtual reflected image.

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