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    • 1. 发明授权
    • Microscope
    • 显微镜
    • US07564624B2
    • 2009-07-21
    • US11569914
    • 2005-06-22
    • Volker LeimbachHeinrich Ulrich
    • Volker LeimbachHeinrich Ulrich
    • G02B21/06G02B21/00
    • G02B21/06G02B21/0032G02B21/0052
    • The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding fiber. The inventive microscope also comprises an objective lens disposed in the illumination beam path and is characterized in that a fiber multiplexer connected to the first and second light-guiding fibers, receiving the light from the light source and selectively allowing the light from the first or second light source to pass is disposed in the illumination beam path.
    • 本发明涉及一种显微镜,包括至少一个第一和第二光源,连接到第一光源的第一导光纤维和连接到第二光源的第二导光纤维,其中由相应光源发射的光 可注射到连接的导光纤维中。 本发明的显微镜还包括设置在照明光束路径中的物镜,其特征在于,连接到第一和第二导光纤维的光纤多路复用器,接收来自光源的光并选择性地允许来自第一或第二光导纤维的光 通过的光源设置在照明光束路径中。
    • 4. 发明申请
    • Microscope
    • 显微镜
    • US20070176085A1
    • 2007-08-02
    • US11569914
    • 2005-06-22
    • Volker LeimbachHeinrich Ulrich
    • Volker LeimbachHeinrich Ulrich
    • H01J40/14
    • G02B21/06G02B21/0032G02B21/0052
    • The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding fiber. The inventive microscope also comprises an objective lens disposed in the illumination beam path and is characterized in that a fiber multiplexer connected to the first and second light-guiding fibers, receiving the light from the light source and selectively allowing the light from the first or second light source to pass is disposed in the illumination beam path.
    • 本发明涉及一种显微镜,包括至少一个第一和第二光源,连接到第一光源的第一导光纤维和连接到第二光源的第二导光纤维,其中由相应光源发射的光 可注射到连接的导光纤维中。 本发明的显微镜还包括设置在照明光束路径中的物镜,其特征在于,连接到第一和第二导光纤维的光纤多路复用器,接收来自光源的光并选择性地允许来自第一或第二光导纤维的光 通过的光源设置在照明光束路径中。
    • 6. 发明授权
    • 4Pi microscope
    • 4Pi显微镜
    • US07453578B2
    • 2008-11-18
    • US10573696
    • 2004-09-27
    • Volker LeimbachReiner Rygiel
    • Volker LeimbachReiner Rygiel
    • G01B11/02
    • G02B21/0056G02B26/001
    • A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.
    • 一种具有干涉仪的4Pi显微镜,其中两个透镜(31,33)以使得它们在样品平面(35)的不同侧面上彼此相对的方式排列; 还包括用于将照射光(3)注入到干涉仪中和/或用于从干涉仪中排出检测光(41)并偏转包含反射装置(51)的检测光束路径的光学元件(19) 其将由光学元件放出的照明光反射回干涉仪和/或允许偏转到偏转光束上的检测光通过,也将未被偏转到检测光束路径上的其他放电检测光反射到干涉仪中。
    • 9. 发明申请
    • 4Pi microscope
    • 4Pi显微镜
    • US20070052972A1
    • 2007-03-08
    • US10573696
    • 2004-09-27
    • Volker LeimbachReiner Rygiel
    • Volker LeimbachReiner Rygiel
    • G01B11/02
    • G02B21/0056G02B26/001
    • A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.
    • 一种具有干涉仪的4Pi显微镜,其中两个透镜(31,33)以使得它们在样品平面(35)的不同侧面上彼此相对的方式排列; 还包括用于将照射光(3)注入到干涉仪中和/或用于从干涉仪中排出检测光(41)并偏转包含反射装置(51)的检测光束路径的光学元件(19) 其将由光学元件放出的照明光反射回干涉仪和/或允许偏转到偏转光束上的检测光通过,也将未被偏转到检测光束路径上的其他放电检测光反射到干涉仪中。