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    • 5. 发明授权
    • NVM PMOS-cell with one erased and two programmed states
    • NVM PMOS单元具有一个擦除和两个编程状态
    • US07113427B1
    • 2006-09-26
    • US11076711
    • 2005-03-09
    • Yuri MirgorodskiPeter J. HopperVladislav VashchenkoPhilipp Lindorfer
    • Yuri MirgorodskiPeter J. HopperVladislav VashchenkoPhilipp Lindorfer
    • G11C16/04
    • G11C11/5628G11C16/12G11C16/3459H01L27/115H01L29/7881
    • NVM cell for storing three levels of charge: one erased and two programmed states. The cell comprises a transistor structure providing a gate current versus gate voltage curve having a shape with a flat region or a second peak. To provide such a structure, one embodiment combines two parallel transistors having different threshold voltages, and another embodiment uses one transistor with variable doping. The gate current curve provides two programming zones. Programming the first state includes applying a voltage across a channel, ramping up a gate voltage in the first programming zone, followed by ramping it back down. Programming the second state comprises applying a voltage across a channel, ramping up a gate voltage past the first programming zone and into the second programming zone, followed by ramping it back down. Ramping the voltage back down may optionally be preceded by turning off the voltage across the channel.
    • 用于存储三个电荷电平的NVM单元:一个擦除和两个编程状态。 该单元包括提供具有平坦区域或第二峰值的形状的栅极电流对栅极电压曲线的晶体管结构。 为了提供这样的结构,一个实施例组合了具有不同阈值电压的两个并联晶体管,另一实施例使用一个具有可变掺杂的晶体管 栅极电流曲线提供两个编程区域。 对第一状态进行编程包括在一个通道上施加电压,使第一个编程区中的栅极电压升高,然后将其向下斜坡。 对第二状态进行编程包括在通道上施加电压,将栅极电压升高到第一编程区并进入第二编程区,然后将其向下斜坡。 可以选择先将电压降低,然后关闭通道上的电压。
    • 10. 发明授权
    • Ultra low leakage MOSFET transistor
    • 超低漏电MOSFET晶体管
    • US07202538B1
    • 2007-04-10
    • US10647604
    • 2003-08-25
    • Peter J. HopperPhilipp LindorferVladislav VashchenkoRobert Drury
    • Peter J. HopperPhilipp LindorferVladislav VashchenkoRobert Drury
    • H01L29/94
    • H01L29/4238H01L21/28123H01L21/823481H01L21/823878H01L29/0692
    • A MOSFET transistor structure is formed in a substrate of semiconductor material having a first conductivity type. The MOSFET transistor structure includes an active region that is surrounded by a perimeter isolation dielectric material formed in the substrate to define a continuous sidewall interface between the sidewall dielectric material and the active region. Spaced-apart source and drain regions are formed in the active region and are also spaced-apart from the sidewall interface. A conductive gate electrode that is separated from the substrate channel region by intervening gate dielectric material includes a first portion that extends over the substrate channel region and a second portion that extends continuously over the entire sidewall interface between the isolation dielectric material and the active region. Thus, an enclosed ring is maintained around the entire composite perimeter, thereby completely avoiding regions of high trap density and, thus, preventing any current path for gate induced drain leakage (GIDL) to occur.
    • 在具有第一导电类型的半导体材料的衬底中形成MOSFET晶体管结构。 MOSFET晶体管结构包括由形成在衬底中的周边隔离电介质材料围绕以限定侧壁电介质材料和有源区域之间的连续侧壁界面的有源区域。 间隔开的源极和漏极区域形成在有源区中并且也与侧壁界面间隔开。 通过介入栅极电介质材料与衬底沟道区分离的导电栅电极包括在衬底沟道区上延伸的第一部分和在隔离电介质材料与有源区之间的整个侧壁界面上连续延伸的第二部分。 因此,围绕整个复合材料周边保持封闭的环,从而完全避免高陷阱密度的区域,并因此防止发生栅极引起漏极泄漏(GIDL)的任何电流路径。