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    • 4. 发明申请
    • Systems, control subsystems, and methods for projecting an electron beam onto a specimen
    • 系统,控制子系统以及将电子束投射到样品上的方法
    • US20070029506A1
    • 2007-02-08
    • US11198985
    • 2005-08-08
    • Marek ZywnoMarian MankosHarald HessShem-Tov Levi
    • Marek ZywnoMarian MankosHarald HessShem-Tov Levi
    • G01N23/00
    • H01J37/304B82Y10/00B82Y40/00H01J37/3174H01J2237/2817H01J2237/31766
    • Systems, control subsystems, and methods for projecting an electron beam onto a specimen are provided. One system includes a stage configured to move the specimen with a non-uniform velocity. The system also includes a projection subsystem configured to project the electron beam onto the specimen while the stage is moving the specimen at the non-uniform velocity. In addition, the system includes a control subsystem configured to alter one or more characteristics of the electron beam while the projection subsystem is projecting the electron beam onto the specimen based on the non-uniform velocity. One method includes moving the specimen with a non-uniform velocity and projecting the electron beam onto the specimen during movement of the specimen. In addition, the method includes altering one or more characteristics of the electron beam during projection of the electron beam onto the specimen based on the non-uniform velocity.
    • 提供了将电子束投射到试样上的系统,控制子系统和方法。 一个系统包括配置成以不均匀的速度移动样本的台。 该系统还包括一个投影子系统,配置成将电子束投射到样本上,同时舞台以不均匀的速度移动样本。 另外,该系统包括控制子系统,该控制子系统被配置为改变电子束的一个或多个特性,同时投影子系统基于非均匀速度将电子束投影到样本上。 一种方法包括以不均匀的速度移动样品并在样品移动期间将电子束投射到样品上。 另外,该方法包括在基于非均匀速度将电子束投影到样本上时改变电子束的一个或多个特性。
    • 5. 发明授权
    • Systems, control subsystems, and methods for projecting an electron beam onto a specimen
    • 系统,控制子系统以及将电子束投射到样品上的方法
    • US07342238B2
    • 2008-03-11
    • US11198985
    • 2005-08-08
    • Marek ZywnoMarian MankosHarald HessShem-Tov Levi
    • Marek ZywnoMarian MankosHarald HessShem-Tov Levi
    • G01N23/00
    • H01J37/304B82Y10/00B82Y40/00H01J37/3174H01J2237/2817H01J2237/31766
    • Systems, control subsystems, and methods for projecting an electron beam onto a specimen are provided. One system includes a stage configured to move the specimen with a non-uniform velocity. The system also includes a projection subsystem configured to project the electron beam onto the specimen while the stage is moving the specimen at the non-uniform velocity. In addition, the system includes a control subsystem configured to alter one or more characteristics of the electron beam while the projection subsystem is projecting the electron beam onto the specimen based on the non-uniform velocity. One method includes moving the specimen with a non-uniform velocity and projecting the electron beam onto the specimen during movement of the specimen. In addition, the method includes altering one or more characteristics of the electron beam during projection of the electron beam onto the specimen based on the non-uniform velocity.
    • 提供了将电子束投射到试样上的系统,控制子系统和方法。 一个系统包括配置成以不均匀的速度移动样本的台。 该系统还包括一个投影子系统,配置成将电子束投射到样本上,同时舞台以不均匀的速度移动样本。 另外,该系统包括控制子系统,该控制子系统被配置为改变电子束的一个或多个特性,同时投影子系统基于非均匀速度将电子束投影到样本上。 一种方法包括以不均匀的速度移动样品并在样品移动期间将电子束投射到样品上。 另外,该方法包括在基于非均匀速度将电子束投影到样本上时改变电子束的一个或多个特性。
    • 7. 发明授权
    • Phase control device
    • 相控装置
    • US06498545B1
    • 2002-12-24
    • US09230267
    • 1999-12-20
    • Shem-Tov Levi
    • Shem-Tov Levi
    • H01P118
    • H01Q3/34
    • A phase control device, for providing a plurality of phase values, for utilization by any system having a number of input/output ports with signals requiring control of their relative phases. The phase control device is constructed from phase shift elements electrically connected to a system of electrically interconnected switches separated off from the phase shift elements. The result is a reduction in the number of phase shift elements and switches as compared to conventional phase shifters and a simplification of the resulting architecture, a feature of significant importance in chip miniaturization.
    • 一种用于提供多个相位值的相位控制装置,用于具有多个输入/输出端口的任何系统的利用,该信号需要控制其相对相位的信号。 相位控制装置由电连接到从相移元件分离的电互连开关的系统的相移元件构成。 结果是与常规移相器相比,相移元件和开关的数量减少,并且最终架构的简化,这在芯片小型化方面具有重要意义。