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    • 4. 发明授权
    • System and method for frequency domain interferometric second harmonic spectroscopy
    • 用于频域干涉二次谐波光谱的系统和方法
    • US06411388B1
    • 2002-06-25
    • US09722998
    • 2000-11-27
    • Michael W. DownerPhilip T. Wilson
    • Michael W. DownerPhilip T. Wilson
    • G01J345
    • G01N21/8422G01J3/4338G01J3/453G01N21/9501
    • A method of spectroscopically analyzing amplitude and phase information of a particular sample (510) is disclosed, comprising providing a femtosecond laser source (502) positioned in an angularly distal relationship to the sample, generating from the laser source a primary light pulse (504) of substantial peak intensity and spectral bandwidth directed at the sample, and providing a reference medium (512) interposed between the light source and the sample, fixed in position with respect to the sample. A portion of the primary light pulse is directed through the reference medium generating a reference second harmonic signal (514) directed at the sample, which propagates collinearly with the primary light pulse towards the sample. A spectrometer (520) is provided, positioned in an angularly distal relationship to the sample and opposing the laser source, to receive second harmonic reflections of the primary pulse and reference signal (516 and 514, respectively) from said sample. The second harmonic reflections received are then analyzed.
    • 公开了一种光谱分析特定样品(510)的幅度和相位信息的方法,包括提供以与样品成角度远端关系定位的飞秒激光源(502),从激光源产生初级光脉冲(504) 提供针对样品的实质峰强度和光谱带宽,以及提供介于光源和样品之间的参考介质(512),固定在相对于样品的适当位置。 初级光脉冲的一部分被引导通过参考介质,产生指向样本的参考二次谐波信号(514),该参考二次谐波信号与初级光脉冲共线地向样本传播。 提供了一种分光计(520),其以与样品成角度的远端关系定位并与激光源相对,以接收来自所述样品的初级脉冲和参考信号(516和514)的二次谐波反射。 然后分析接收到的二次谐波反射。