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1. 发明申请

US20070244659A1 METHOD OF ALIGNING PROBE FOR EDDY CURRENT INSPECTION 有权
标题翻译：用于EDDY电流检测的校准方法
公开(公告)号：US20070244659A1
公开(公告)日：2007-10-18
申请号：US11466503
申请日：2006-08-23
申请人： Ui Won Suh , Richard C. Knepfle
发明人： Ui Won Suh , Richard C. Knepfle
IPC分类号： G06F19/00
CPC分类号： G01N27/9006
摘要： A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.
摘要翻译：一种使用探针装置进行涡流检测的系统和方法。触摸探针提供了一个简单的方法来保持样品的紧密接触，同时保持正确的位置处的正常角度和压力。使用触摸探头进一步减少了涡流检测的总时间。探针将探头对准要检查的样品，以减少测量误差并提高生产率。

2. 发明授权

US06907358B2 Eddy current inspection method 有权
标题翻译：涡流检测方法
公开(公告)号：US06907358B2
公开(公告)日：2005-06-14
申请号：US10355810
申请日：2003-01-30
申请人： Ui Won Suh , Clifford Sneed, Jr.
发明人： Ui Won Suh , Clifford Sneed, Jr.
IPC分类号： G01B7/28 , G01N27/90 , G06F19/00
CPC分类号： G01N27/902 , G01B7/285
摘要： A specimen is mounted in a multiaxis machine. An eddy current probe is also mounted in the machine for multiaxis movement relative to the specimen. The probe is aligned in situ with a target in the specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of the specimen. Eddy current inspection of the target may then be conducted by moving the probe along multiple inspection sites of the target corresponding with the specimen model.
摘要翻译：样品安装在多轴机器中。涡流探头也安装在机器中，用于相对于试样的多轴运动。通过与试样的数值模型相对应的多个对准部位，将探头与样品中的靶材直接接触而与原位置对准。然后可以通过沿对应于样本模型的目标的多个检查位置移动探针来进行靶的涡流检查。

3. 发明授权

US06914215B2 Real time laser shock peening quality assurance by natural frequency analysis 失效
标题翻译：通过固有频率分析实时激光冲击硬化质量保证
公开(公告)号：US06914215B2
公开(公告)日：2005-07-05
申请号：US10608763
申请日：2003-06-27
申请人： Brian Michael Davis , Robert David McClain , Ui Won Suh , Seetha Ramaiah Mannava
发明人： Brian Michael Davis , Robert David McClain , Ui Won Suh , Seetha Ramaiah Mannava
IPC分类号： B23K26/03 , C21D10/00 , F01D5/28 , F01D21/00 , G01N29/12 , G01N29/24 , B23K26/00
CPC分类号： G01N29/12 , B23K26/03 , B23K31/125 , C21D10/005 , F01D5/286 , F01D21/003 , G01N29/2418 , G01N2291/0423 , G01N2291/0426
摘要： A real time method for quality control testing of a laser shock peening process of production workpieces by analysis of natural frequency shifts during the laser shock peening process. One particular embodiment includes laser shock peening surface of the production workpiece by firing a plurality of laser beam pulses on the surface and forming a plurality of corresponding plasmas, each one of the plasmas pulses having a duration in which the plasma causes a region having deep compressive residual stresses to form beneath the surface, measuring at least one natural frequency of the workpiece for each of the laser beam pulses, calculating natural frequency shifts from a baseline natural frequency for the measured natural frequencies for at least a portion of the laser beam pulses, and using the natural frequency shifts for accepting or rejecting the workpiece with respect to pass or fail criteria.
摘要翻译：通过分析激光冲击硬化过程中的固有频率偏移，对生产工件的激光冲击硬化过程进行质量控制测试的实时方法。一个具体实施例包括通过在表面上激发多个激光束脉冲并形成多个对应的等离子体来生产工件的激光冲击硬化表面，每个等离子体脉冲具有持续时间，其中等离子体引起具有深度压缩的区域残余应力在表面下形成，测量每个激光束脉冲的工件的至少一个固有频率，从针对至少一部分激光束脉冲的测量固有频率的基线固有频率计算固有频率偏移，并根据通过或不合格标准使用固有频率偏移来接收或拒绝工件。

4. 发明授权

US06570125B2 Simultaneous offset dual sided laser shock peening with oblique angle laser beams 失效
公开(公告)号：US06570125B2
公开(公告)日：2003-05-27
申请号：US09945284
申请日：2001-08-31
申请人： Ui Won Suh , Seetharamaiah Mannava , Todd Jay Rockstroh
发明人： Ui Won Suh , Seetharamaiah Mannava , Todd Jay Rockstroh
IPC分类号： B23K2600
CPC分类号： B23K26/0608 , B23K26/0604 , B23K26/0736 , C21D10/005 , F01D5/286
摘要： A method to laser shock peen articles such as a gas turbine engine rotor blade with first and second oblique laser beams to form pairs of longitudinally spaced apart first and second laser shock peened elliptical spots that are on opposite sides of the article or blade and transversely offset from each other. The oblique laser beams are fired at a portion of the leading or trailing edges of the blade at first and second oblique angles with respect to opposite surfaces of the edge. Another method laser shock peens the leading and trailing edges of gas turbine engine integrally bladed rotors and disks that are blocked by other rows of blades by firing the laser beams at compound angles such that the beams are aimed at the first and second oblique angles with respect to the surfaces of the edge and at a third oblique angle with respect to a rotor axis.

5. 发明授权

US08013599B2 Methods and apparatus for testing a component 有权
标题翻译：用于测试组件的方法和设备
公开(公告)号：US08013599B2
公开(公告)日：2011-09-06
申请号：US10993467
申请日：2004-11-19
申请人： Ui Won Suh , Gigi Olive Gambrell , John William Ertel , William Stewart McKnight
发明人： Ui Won Suh , Gigi Olive Gambrell , John William Ertel , William Stewart McKnight
IPC分类号： G01N27/82
CPC分类号： G01B7/28 , G01N27/902 , G01N27/9033
摘要： A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication, and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.
摘要翻译：一种用于检查具有包括局部最小值和局部最大值的表面轮廓的部件的方法。该方法包括将涡流探针定位在部件的表面附近以产生第一位置指示，将涡流探针定位在部件的表面附近以产生与第一位置指示不同的第二位置指示，以及在第一和第二位置指示之间插值以确定部件表面的一部分的轮廓。

6. 发明授权

US07948233B2 Omnidirectional eddy current array probes and methods of use 失效
标题翻译：全向涡流阵列探头和使用方法
公开(公告)号：US07948233B2
公开(公告)日：2011-05-24
申请号：US12246637
申请日：2008-10-07
申请人： Aparna Chakrapani Sheila-Vadde , Ui Won Suh , Changting Wang
发明人： Aparna Chakrapani Sheila-Vadde , Ui Won Suh , Changting Wang
IPC分类号： G01N27/72 , G01N27/82 , G01R33/12
CPC分类号： G01N27/9033
摘要： Omnidirectional eddy current array probes for detecting flaws in a conductive test object generally includes semi-circular wave shaped continuous drive lines in two rows disposed in two layers that are multiplexed for omnidirectional inspection without blind spots. The semicircular wave shaped continuous drive lines are superimposed to form pseudo-circular drive lines, wherein each row of drive lines is offset laterally by a distance preferably equal to a quarter wavelength of the wave pattern. For only parallel and perpendicular flaws, the drive multiplexing is not needed and each row will have only one set of drive lines. In alternate embodiments, there can be square-shaped, oval shaped, rectangular-shaped or other shaped wave patterns as well. Also disclosed are methods for sensing surface flaws and compensating their response.
摘要翻译：用于检测导电测试对象中的瑕疵的全向涡流阵列探针通常包括两行中的两排波浪状的连续驱动线，它们被多路复用用于无盲点的全向检测。半圆形波形连续驱动线被叠加形成伪圆形驱动线，其中每行驱动线横向偏移优选等于波形图的四分之一波长的距离。对于只有平行和垂直的缺陷，不需要驱动复用，每行只有一组驱动线。在替代实施例中，也可以是方形，椭圆形，矩形或其它形状的波形图案。还公开了用于感测表面缺陷并补偿其响应的方法。

7. 发明授权

US07817845B2 Multi-frequency image processing for inspecting parts having complex geometric shapes 失效
标题翻译：用于检查具有复杂几何形状的零件的多频图像处理
公开(公告)号：US07817845B2
公开(公告)日：2010-10-19
申请号：US11617859
申请日：2006-12-29
申请人： Ui Won Suh , Gigi Olive Gambrell , William Stewart McKnight , Preeti Pisupati , Peyush Kumar Mishra , Sandeep Kumar Dewangan , Changting Wang
发明人： Ui Won Suh , Gigi Olive Gambrell , William Stewart McKnight , Preeti Pisupati , Peyush Kumar Mishra , Sandeep Kumar Dewangan , Changting Wang
IPC分类号： G06K9/00 , G01R11/02
CPC分类号： G01N27/9046 , G01N27/902 , G06K9/4604
摘要： A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.
摘要翻译：公开了一种用于检测具有复杂几何形状的部件上的小裂纹和其他异常的方法。该方法包括涡流检测，包括从多频涡流信号中收集的数据。相位分析用于组合多频数据，增强原始检查图像的信噪比。然后使用时空滤波器对图像进行再处理，以与涡流缺陷信号的频率分量相关联，以分离与通常由边缘效应信号隐藏的边缘处的裂纹和其他缺陷相关的信号。

8. 发明申请

US20100085045A1 Omnidirectional Eddy Current Array Probes and Methods of Use 失效
标题翻译：全向涡流阵列探头和使用方法
公开(公告)号：US20100085045A1
公开(公告)日：2010-04-08
申请号：US12246637
申请日：2008-10-07
申请人： Aparna Chakrapani Sheila-Vadde , Ui Won Suh , Changting Wang
发明人： Aparna Chakrapani Sheila-Vadde , Ui Won Suh , Changting Wang
IPC分类号： G01N27/90
CPC分类号： G01N27/9033
摘要： Omnidirectional eddy current array probes for detecting flaws in a conductive test object generally includes semi-circular wave shaped continuous drive lines in two rows disposed in two layers that are multiplexed for omnidirectional inspection without blind spots. The semicircular wave shaped continuous drive lines are superimposed to form pseudo-circular drive lines, wherein each row of drive lines is offset laterally by a distance preferably equal to a quarter wavelength of the wave pattern. For only parallel and perpendicular flaws, the drive multiplexing is not needed and each row will have only one set of drive lines. In alternate embodiments, there can be square-shaped, oval shaped, rectangular-shaped or other shaped wave patterns as well. Also disclosed are methods for sensing surface flaws and compensating their response.
摘要翻译：用于检测导电测试对象中的瑕疵的全向涡流阵列探针通常包括两行中的两排波浪状的连续驱动线，它们被多路复用用于无盲点的全向检测。半圆形波形连续驱动线被叠加形成伪圆形驱动线，其中每行驱动线横向偏移优选等于波形图的四分之一波长的距离。对于只有平行和垂直的缺陷，不需要驱动复用，每行只有一组驱动线。在替代实施例中，也可以是方形，椭圆形，矩形或其它形状的波形图案。还公开了用于感测表面缺陷并补偿其响应的方法。

9. 发明授权

US08269489B2 System and method for eddy current inspection of parts with complex geometries 有权
标题翻译：对具有复杂几何形状的零件进行涡流检测的系统和方法
公开(公告)号：US08269489B2
公开(公告)日：2012-09-18
申请号：US12277942
申请日：2008-11-25
申请人： Changting Wang , Yury Alexeyevich Plotnikov , Ui Won Suh , William Stewart McKnight
发明人： Changting Wang , Yury Alexeyevich Plotnikov , Ui Won Suh , William Stewart McKnight
IPC分类号： G01N27/82
CPC分类号： G01N27/82 , G01N27/9013
摘要： An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.
摘要翻译：提供了检查零件的检查系统。检查系统包括符合部件的三维形状轮廓的涡流传感器的多维阵列。检查系统还包括耦合到多维阵列的控制器，其中控制器被配置为通过涡电流传感器的电连接将电子扫描到涡流仪器。检查系统还包括耦合到涡流仪器的处理器，其中处理器被配置为分析来自涡流仪器和控制器的输出以完成对部件的检查。

10. 发明授权

US07436992B2 Methods and apparatus for testing a component 失效
标题翻译：用于测试组件的方法和设备
公开(公告)号：US07436992B2
公开(公告)日：2008-10-14
申请号：US10909198
申请日：2004-07-30
申请人： Ui Won Suh , Gigi Olive Gambrell , John William Ertel , William Stewart McKnight
发明人： Ui Won Suh , Gigi Olive Gambrell , John William Ertel , William Stewart McKnight
IPC分类号： G06K9/00 , G01N27/82 , H04N7/18
CPC分类号： G01N27/9013 , G01N27/9046 , G01N27/9073
摘要： A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.
摘要翻译：检查元件的方法。该方法包括产生要检查的部件的扫描方案，将侧安装探针耦合到涡流检查系统，将涡流引入到部件中，测量部件中的涡流以产生多个扫描数据，以及分析所述扫描数据以生成被检测部件的至少一个图像。

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