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1. 发明申请

WO2011105847A3 APPARATUS FOR ANALYZING CANCER CELLS USING CELL SURFACE MICROSTRUCTURE ANALYSIS 审中-公开
标题翻译：用于分析细胞表面微结构分析的癌细胞的装置
公开(公告)号：WO2011105847A3
公开(公告)日：2012-01-19
申请号：PCT/KR2011001325
申请日：2011-02-25
申请人： UNIV CHOSUN IACF , LEE KUN HO , KANG CHI JUNG , SHIN SANG MO , KIM YU JIN
发明人： LEE KUN HO , KANG CHI JUNG , SHIN SANG MO , KIM YU JIN
IPC分类号： G01N33/483 , C12N5/09 , G01B5/28
CPC分类号： G01Q30/04
摘要： The present invention relates to an apparatus for analyzing cancer cells using cell surface microstructure analysis, and more particularly, to an apparatus for analyzing cancer cells, comprising: an atomic force microscope (AFM) for observing the surface of a specimen cell; a first calculation unit for extracting a cell boundary from the image of the surface of the specimen cell observed by the AFM; and a second calculation unit for calculating a fractal dimension (FD) from the extracted cell boundary. The apparatus for analyzing cancer cells according to the present invention analyzes the fractal dimension for the microstructure of the cell boundary, and the microstructure of the surface of a disease cell, such as a tumor cell, has a unique FD value which is different from that of a normal cell. Particularly, a metastatic cancer cell tends to have a fractal dimension remarkably lower than that of a non-metastatic cancer cell. Thus, the apparatus of the present invention collects FD information on an ultra-low volume of tumor cells, and effectively uses the collected information in predicting and diagnosing various characteristics of tumor cells such as the progression of tumor cells, and whether tumor cells are malignant or benign. In addition, the apparatus of the present invention can measure, at a nanoscale level, the structure of surfaces of live cells, and therefore can be valuably used in the development of biological tools for the study of cells, that is, for the analysis of the ultra-microstructures of the surfaces of cells.
摘要翻译：本发明涉及使用细胞表面微结构分析来分析癌细胞的装置，更具体地，涉及用于分析癌细胞的装置，其特征在于，包括：用于观察样本细胞表面的原子力显微镜（AFM）第一计算单元，用于从由AFM观察到的样本单元的表面的图像中提取单元边界; 以及第二计算单元，用于从提取的单元边界计算分形维数（FD）。根据本发明的用于分析癌细胞的装置分析细胞边界的微结构的分形维数，并且诸如肿瘤细胞的疾病细胞的表面的微观结构具有与之不同的唯一FD值的正常细胞。特别是转移性癌细胞的分形维数明显低于非转移性癌细胞。因此，本发明的装置在超低体积肿瘤细胞上收集FD信息，并且有效地将收集的信息用于预测和诊断肿瘤细胞的各种特征，例如肿瘤细胞的进展以及肿瘤细胞是否恶性或良性此外，本发明的装置可以在纳米尺度上测量活细胞表面的结构，因此可以有价值地用于开发用于细胞研究的生物工具，即用于分析细胞表面的超微结构。

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