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1. 发明授权

US06784680B2 Contact probe with guide unit and fabrication method thereof 失效
标题翻译：带导向单元的接触式探头及其制造方法
公开(公告)号：US06784680B2
公开(公告)日：2004-08-31
申请号：US10445181
申请日：2003-05-23
申请人： Tsuyoshi Haga , Katsuya Okumura , Nobuo Hayasaka , Hideki Shibata , Noriaki Matsunaga
发明人： Tsuyoshi Haga , Katsuya Okumura , Nobuo Hayasaka , Hideki Shibata , Noriaki Matsunaga
IPC分类号： G01R3102
CPC分类号： G01R1/06716 , G01R1/06722 , G01R1/06733 , G01R1/06738
摘要： A contact probe is fabricated by a method including a lithography step and a plating step. The contact probe includes a plunger unit to form contact with a circuit to be tested, a spring unit, and a lead wire connection unit, all formed integrally so as to have a three dimensional configuration with uniform thickness with respect to a predetermined plane configuration in a thickness direction perpendicular to the predetermined plane configuration. Preferably, a guide unit parallel to the spring unit is also formed integrally. Further preferably, the contact probe is formed integrally also including a stopper for each unitary configuration of the spring unit constituted by a leaf spring.
摘要翻译：通过包括光刻步骤和电镀步骤的方法制造接触探针。接触探针包括与被测试电路形成接触的柱塞单元，弹簧单元和引线连接单元，其全部形成为具有相对于预定平面构造具有均匀厚度的三维构造垂直于预定平面构造的厚度方向。优选地，与弹簧单元平行的引导单元也整体形成。进一步优选地，接触探针一体地形成，还包括用于由板簧构成的弹簧单元的每个单一构造的止动件。

2. 发明授权

US07344382B2 Fine terminal, its manufacturing method, and contact sheet 失效
标题翻译：精细终端，其制造方法和接触片
公开(公告)号：US07344382B2
公开(公告)日：2008-03-18
申请号：US10553748
申请日：2004-12-09
申请人： Tsuyoshi Haga
发明人： Tsuyoshi Haga
IPC分类号： H01R12/00
CPC分类号： H01M2/204 , H01M2/30
摘要： A micro terminal for inspection or installation with high connection reliability is provided at lower cost. A micro terminal according to the present invention has electrical conduction between the micro terminal and an electrode of an electronic device or an inspection device and includes a columnar contactor in contact with the electrode. The contactor has a spring structure which is elastically deformed when pressed against the electrode. The contactor includes a protrusion protruding outwardly at its end in contact with the electrode and the shape of the protrusion has a part of a sphere or a part of a paraboloid of revolution.
摘要翻译：以较低的成本提供了具有高连接可靠性的检查或安装微型终端。根据本发明的微型端子在微型端子与电子器件或检查装置的电极之间具有导电性，并且包括与电极接触的柱状接触器。接触器具有弹簧结构，当按压电极时弹性变形。接触器包括在其与电极接触的端部向外突出的突起，并且突起的形状具有球体的一部分或旋转抛物面的一部分。

3. 发明授权

US07151385B2 Contact probe, method of manufacturing the contact probe, and device and method for inspection 有权
标题翻译：接触式探头，接触式探针的制造方法，检测装置及方法
公开(公告)号：US07151385B2
公开(公告)日：2006-12-19
申请号：US10470399
申请日：2002-01-22
申请人： Yoshihiro Hirata , Tsuyoshi Haga , Toshiyuki Numazawa , Kazuo Nakamae , Kazunori Okada , Jun Yorita
发明人： Yoshihiro Hirata , Tsuyoshi Haga , Toshiyuki Numazawa , Kazuo Nakamae , Kazunori Okada , Jun Yorita
IPC分类号： G01R31/02 , H01K3/10
CPC分类号： G01R1/06733 , G01R1/06738 , G01R1/06755 , G01R3/00 , Y10T29/49117 , Y10T29/49204
摘要： A method of manufacturing a contact probe includes an electroforming step of, using a resist film (522) arranged on a substrate (521) as a pattern frame having a shape corresponding to a contact probe, performing electroforming to fill a gap in the resist film (522) to form a metal layer (526), a tip end shaping step of obliquely removing and sharpening that part of the metal layer (526) which serves as a tip end portion of the contact probe, and a take-out step of taking out only the metal layer (526) from the pattern frame.
摘要翻译：制造接触探针的方法包括：电铸步骤，使用布置在基板（521）上的抗蚀剂膜（522）作为具有与接触探针对应的形状的图案框架，进行电铸以填充抗蚀剂膜的间隙（522），以形成金属层（526）;顶端成形步骤，用于倾斜和磨削用作接触探针的顶端部分的金属层（526）的该部分，以及取出步骤仅从图案框架中取出金属层（526）。

4. 发明申请

US20060276044A1 Method for manufacturing metal microstructure 失效
标题翻译：制造金属微观结构的方法
公开(公告)号：US20060276044A1
公开(公告)日：2006-12-07
申请号：US11503303
申请日：2006-08-14
申请人： Jun Yorita , Yoshihiro Hirata , Tsuyoshi Haga
发明人： Jun Yorita , Yoshihiro Hirata , Tsuyoshi Haga
IPC分类号： G03C5/00 , H01L21/302
CPC分类号： B81C99/0085 , B81C2201/032 , C25D1/003 , H01L21/4821 , H05K3/202 , H05K3/205
摘要： A method of manufacturing a metal microstructure (1) by using a resin mold (13). In order to provide a method in which a mild manufacturing condition which causes less damage to the resin mold (13) can be set and the high-precision metal microstructure (1) can be mass-produced by uniform electroforming, the method of manufacturing the metal microstructure (1) according to the present invention includes the steps of: fixing on a conductive substrate (11) the resin mold (13) having a vacant portion penetrating in the direction of thickness, by interposing a photosensitive polymer (12) having a chemical composition changed by an electron beam, ultraviolet radiation or visible radiation so as to form a layered structure (2) having the resin mold (13); exposing the layered structure (2) having the resin mold (13) to an electron beam, ultraviolet radiation or visible radiation; removing an exposed photosensitive polymer (12c) existing at the vacant portion of the resin mold (13); and filling with a metal (14) the vacant portion of the layered structure (2) having the resin mold (13) by electroforming.
摘要翻译：一种通过使用树脂模具（13）制造金属微结构（1）的方法。为了提供可以设定对树脂模具（13）造成较小损害的温和制造条件并且可以通过均匀电铸来大量生产高精度金属微结构（1）的方法，制造根据本发明的金属微结构（1）包括以下步骤：通过插入具有一个或多个金属微结构（1）的光敏聚合物（12）将具有穿过厚度方向的空白部分的树脂模具（13）固定在导电基板（11）上，化学成分由电子束，紫外线辐射或可见光辐射而变化，形成具有树脂模具（13）的层状结构（2）。将具有树脂模具（13）的层状结构（2）暴露于电子束，紫外线或可见光; 去除存在于树脂模具（13）的空缺部分的曝光的光敏聚合物（12c）; 并通过电铸将金属（14）填充到具有树脂模具（13）的层状结构（2）的空位部分上。

5. 发明申请

US20060255815A1 Contact probe and method of manufacturing the same and test apparatus and test method 审中-公开
标题翻译：接触式探头及其制造方法及试验装置及试验方法
公开(公告)号：US20060255815A1
公开(公告)日：2006-11-16
申请号：US11472621
申请日：2006-06-21
申请人： Yoshihiro Hirata , Tsuyoshi Haga , Toshiyuki Numazawa , Kazuo Nakamae , Kazunori Okada , Jun Yorita
发明人： Yoshihiro Hirata , Tsuyoshi Haga , Toshiyuki Numazawa , Kazuo Nakamae , Kazunori Okada , Jun Yorita
IPC分类号： G01R31/02
CPC分类号： G01R1/06733 , G01R1/06738 , G01R1/06755 , G01R3/00 , Y10T29/49117 , Y10T29/49204
摘要： A method of manufacturing a contact probe includes an electroforming step of, using a resist film (522) arranged on a substrate (521) as a pattern frame having a shape corresponding to a contact probe, performing electroforming to fill a gap in the resist film (522) to form a metal layer (526), a tip end shaping step of obliquely removing and sharpening that part of the metal layer (526) which serves as a tip end portion of the contact probe, and a take-out step of taking out only the metal layer (526) from the pattern frame.
摘要翻译：制造接触探针的方法包括：电铸步骤，使用布置在基板（521）上的抗蚀剂膜（522）作为具有与接触探针对应的形状的图案框架，进行电铸以填充抗蚀剂膜的间隙（522），以形成金属层（526）;顶端成形步骤，用于倾斜和磨削用作接触探针的顶端部分的金属层（526）的该部分，以及取出步骤仅从图案框架中取出金属层（526）。

6. 发明申请

US20060251871A1 Anisotropic electrically conductive film and method of producing the same 失效
公开(公告)号：US20060251871A1
公开(公告)日：2006-11-09
申请号：US10551459
申请日：2004-03-12
申请人： Yasuhito Masuda , Yasuhiro Okuda , Fumihiro Hayashi , Tsuyoshi Haga
发明人： Yasuhito Masuda , Yasuhiro Okuda , Fumihiro Hayashi , Tsuyoshi Haga
IPC分类号： B32B3/00
CPC分类号： H01L23/4828 , G01R1/0408 , G01R31/2863 , H01L21/486 , H01L23/49827 , H01L2924/0002 , H01L2924/09701 , H01R43/007 , H05K3/4069 , Y10T428/24917 , H01L2924/00
摘要： The present invention is directed to an anisotropic conductive film and manufacturing methods thereof, in which an electrically insulative porous film made of synthetic resin is used as a base film and in which conductive parts capable of being provided with conductiveness in the film thickness direction are formed independently at plural positions of the base film by adhering conductive metal to resinous parts of porous structure in such a manner as piercing through from a first surface to a second surface.

7. 发明申请

US20130077806A1 AMPLIFIER APPARATUS 有权
公开(公告)号：US20130077806A1
公开(公告)日：2013-03-28
申请号：US13701554
申请日：2011-06-16
申请人： Mingxue Zhang , Seigo Ozaki , Tsuyoshi Haga
发明人： Mingxue Zhang , Seigo Ozaki , Tsuyoshi Haga
IPC分类号： H03F3/20
CPC分类号： H03F3/183 , H03F1/0233 , H03F1/26 , H03F3/20 , H03F3/217 , H03F3/2173 , H03F2200/03 , H03F2200/351
摘要： Disclosed is a technique for reducing noise superimposed on an output signal while keeping loop gain constant without increasing the circuit scale and without changing the transfer function of the amplifier apparatus (frequency characteristics of gain and phase). According to the technique, there are included a power-supply voltage control unit 7 for detecting the amplitude level S9 of an input audio signal S1 and outputting power with a voltage value indicated by target set voltage value information Vs corresponding to this amplitude level S9, and a PWM modulation unit 2 including a PWM converter 23 for converting the pulse width of the input audio signal S1 and a correction unit for correcting the signal modulated by the PWM converter 23. The PWM modulation unit 2 corrects the pulse width of a PWM signal S5 modulated by the PWM converter 23 so that the correction unit will cancel out a change in amplification gain of a power amplification unit 4 according to the target set voltage value information Vs.

8. 发明授权

US07190179B2 Contact probe 有权
标题翻译：接触探头
公开(公告)号：US07190179B2
公开(公告)日：2007-03-13
申请号：US10472571
申请日：2002-04-10
申请人： Tsuyoshi Haga , Kazunori Okada
发明人： Tsuyoshi Haga , Kazunori Okada
IPC分类号： G01R31/02
CPC分类号： G01R1/07314 , C22C19/03 , C22C19/07 , C25D1/10 , G01R1/06716
摘要： A contact probe is fabricated by forming a resin mold with a cavity on a substrate having conductivity, and filling the cavity with metal through electroforming. The metal includes a cobalt-tungsten alloy. Alternatively, a cobalt-molybdenum alloy may be used instead of the cobalt-tungsten alloy. Alternatively, a contact probe can be made from nickel, cobalt or copper, and have a coat film of cobalt-tungsten alloy or cobalt-molybdenum alloy formed thereon to increase the abrasion resistance. A nickel-molybdenum alloy can be used instead of the cobalt-tungsten alloy or cobalt-molybdenum alloy.
摘要翻译：通过在具有导电性的基板上形成具有空腔的树脂模具并通过电铸将金属填充到空腔中来制造接触探针。金属包括钴 - 钨合金。或者，可以使用钴 - 钼合金代替钴 - 钨合金。或者，接触探针可以由镍，钴或铜制成，并且具有形成在其上的钴 - 钨合金或钴 - 钼合金的涂膜以增加耐磨性。可以使用镍 - 钼合金代替钴 - 钨合金或钴 - 钼合金。

9. 发明授权

US07105281B2 Method for manufacturing metal microstructure 失效
标题翻译：制造金属微观结构的方法
公开(公告)号：US07105281B2
公开(公告)日：2006-09-12
申请号：US10492918
申请日：2002-10-25
申请人： Jun Yorita , Yoshihiro Hirata , Tsuyoshi Haga
发明人： Jun Yorita , Yoshihiro Hirata , Tsuyoshi Haga
IPC分类号： G03F7/039
CPC分类号： B81C99/0085 , B81C2201/032 , C25D1/003 , H01L21/4821 , H05K3/202 , H05K3/205
摘要： A method of manufacturing a metal microstructure by using a resin mold. In order to provide a method in which a mild manufacturing condition which causes less damage to the resin mold can be set and the high-precision metal microstructure can be mass-produced by uniform electroforming, the method of manufacturing the metal microstructure according to the present invention includes the steps of: fixing on a conductive substrate the resin mold having a vacant portion penetrating in the direction of thickness, by interposing a photosensitive polymer having a chemical composition changed by an electron beam, ultraviolet radiation or visible radiation so as to form a layered structure having the resin mold; exposing the layered structure having the resin mold to an electron beam, ultraviolet radiation or visible radiation; removing an exposed photosensitive polymer existing at the vacant portion of the resin mold; and filling with a metal the vacant portion of the layered structure having the resin mold by electroforming.
摘要翻译：通过使用树脂模具制造金属微结构的方法。为了提供一种可以设定对树脂模具造成较小损害的温和制造条件并且通过均匀电铸可以大量生产高精度金属微结构的方法，根据本发明的金属组织的制造方法本发明包括以下步骤：通过插入具有由电子束，紫外线或可见光辐照的化学组成改变的光敏聚合物，将具有穿透厚度方向的空白部分的树脂模具固定在导电基板上，以形成具有树脂模具的层状结构; 将具有树脂模具的层状结构暴露于电子束，紫外线辐射或可见光辐射; 去除存在于树脂模具的空缺部分的曝光的光敏聚合物; 并通过电铸将金属填充到具有树脂模具的层状结构的空
间部分。

10. 发明申请

US20050145103A1 Electronic stringed instrument, system, and method with note height control 有权
标题翻译：电子弦乐器，系统和音符高度控制方法
公开(公告)号：US20050145103A1
公开(公告)日：2005-07-07
申请号：US11021663
申请日：2004-12-22
申请人： Tsuyoshi Haga
发明人： Tsuyoshi Haga
IPC分类号： G10H1/00 , G10H1/02 , G10H1/057 , G10H3/18
CPC分类号： G10H1/02 , G10H1/057 , G10H3/188
摘要： An electronic stringed instrument is provided where the value of a pitch that has been currently detected and the value of a pitch that has been stored are compared. A determination is made as to whether or not the pitch has dropped roughly a half tone. In those cases where the currently detected pitch has dropped roughly a half tone from the pitch detected a specified period earlier, a tone generator begins the attenuation of a musical tone that is generated and the note height of the musical tone is controlled so that the note height does not change.
摘要翻译：提供一种电子弦乐器，其中比较当前检测到的音调的值和已经存储的音调的值。确定音调是否已经降低了大约一半的音调。在当前检测到的音调已经从指定时间段之前检测到的音调中下降了大约一半的音调的情况下，乐音发生器开始衰减所产生的乐音，并且控制音调的音高，使得音符身高不变。

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