专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2012194108A Measurement object surface abnormality identification device 有权
标题翻译：测量对象表面不正常识别设备
公开(公告)号：JP2012194108A
公开(公告)日：2012-10-11
申请号：JP2011059393
申请日：2011-03-17
申请人： Toyota Central R&D Labs Inc , Aichi Steel Works Ltd , 愛知製鋼株式会社 , 株式会社豊田中央研究所
发明人： ISHII YASUHIRO , WATANABE KEIICHI , KITAYAMA KOJI , FUTAHO YOSHINORI , FUJISAWA KAZUYA
IPC分类号： G01B11/30 , G01B11/24 , G01J5/48 , G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide a measurement object surface abnormality identification device capable of accurately identifying a surface abnormality such as oxidized scale generated on a high-temperature measurement object.SOLUTION: The present invention uses a measurement object surface abnormality identification device 1 which comprises: an image synthesis section 10 which creates a synthesized radiant light image by synthesizing a plurality of radiant light images obtained through imaging radiant light from a high-temperature measurement object 5 by a radiant light imaging section 18 every time the measurement body rotates a prescribed angle; a first luminance correction section 12 which extracts a prescribed region from the synthesized radiant light image and corrects a luminance change in an image of the prescribed region due to a reduction in temperature of the measurement object 5 during the same is imaged; and an abnormality determination section 14 which detects a prescribed dark section in the prescribed region of the corrected image and determines that the dark section in the prescribed region of the image is a surface abnormality of the measurement object.
摘要翻译：要解决的问题：提供一种能够精确地识别在高温测量对象上产生的氧化皮的表面异常的测量对象表面异常识别装置。解决方案：本发明使用测量物体表面异常识别装置1，其包括：图像合成部分10，其通过合成通过从高温的成像辐射光获得的多个辐射光图像来产生合成的辐射光图像每次测量体旋转预定角度时，由辐射光成像部18测量对象5; 第一亮度校正部分12从合成辐射光图像提取规定区域并且校正由于测量对象5的温度降低而导致的规定区域的图像中的亮度变化; 以及异常确定部14，其检测校正图像的规定区域中的规定的暗部，并且确定图像的规定区域中的暗部是测量对象的表面异常。版权所有（C）2013，JPO＆INPIT

2. 发明专利

JP2010237008A Device and method for measuring profile of high-temperature object 有权
标题翻译：用于测量高温对象轮廓的装置和方法
公开(公告)号：JP2010237008A
公开(公告)日：2010-10-21
申请号：JP2009084816
申请日：2009-03-31
申请人： Aichi Steel Works Ltd , Toyota Central R&D Labs Inc , 愛知製鋼株式会社 , 株式会社豊田中央研究所
发明人： WATANABE KEIICHI , ISHII YASUHIRO , KITAYAMA TSUNAJI , FUJISAWA KAZUYA , FUTAHO YOSHINORI
IPC分类号： G01B11/24
摘要： PROBLEM TO BE SOLVED: To accurately and easily identify surface abnormality in a body to be measured when measuring the profile of the high-temperature body to be measured.
SOLUTION: In shape measurement of the high-temperature body 10 to be measured, laser beams having a peak wavelength differing from that of radiant light are projected from a laser light source 20 to the body 10 to be measured, and a profile calculation section 60 calculates the profile of the body to be measured, based on reflection light data according to laser beams obtained by a reflection light imaging section 40. An abnormality determination section 110 extracts a prescribed dark section from radiant light images obtained by allowing a radiant light imaging section 30 to image radiant light of the body 10 to be measured, and determines that the dark section of the radiant light has surface abnormality of the high-temperature body to be measured. The profile calculation section 60 computes a profile estimated to be normal for a region that has been determined to have surface abnormality.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：在测量要测量的高温体的轮廓时，准确且容易地识别待测体内的表面异常。解决方案：在要测量的高温体10的形状测量中，具有与辐射光不同的峰值波长的激光束从激光源20投射到要测量的主体10，并且轮廓计算部60基于由反射光成像部40获得的激光，根据反射光数据计算被测体的轮廓。异常判定部110从通过允许辐射的摄像获得的辐射光图像中提取规定的暗部对摄像体10的被测光的辐射光进行成像，并且确定辐射光的暗部具有要测量的高温体的表面异常。轮廓计算部分60计算已经被确定具有表面异常的区域估计为正常的轮廓。版权所有（C）2011，JPO＆INPIT

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式