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    • 1. 发明专利
    • Output buffer circuit
    • 输出缓冲电路
    • JPS59165522A
    • 1984-09-18
    • JP3861283
    • 1983-03-09
    • Toshiba CorpTosubatsuku Service:Kk
    • IWAHASHI HIROSHIASANO MASAMICHISUZUKI KAZUTO
    • H03K19/0175H03K5/02H03K19/0944
    • H03K5/023
    • PURPOSE:To have an output buffer circuit with which an integration circuit having a wide working margin is obtained by setting the DC current flowing between power supplies at zero via each output buffer transistor. CONSTITUTION:The gate of a driver transistor TR7 is connected to a point B which serves as a gate driving source of a TR12. A node A is set at level ''1'' after the node B is set at level ''0'' and the TR7 and 12 are turned off since the TR7 is driven by the output of the driving circuit of the TR12. Then a TR11 is turned on, and therefore the current which flows between power supplies VC and VS via TR11 and 12 is not produced when the data D is changed to ''1'' from ''0''.
    • 目的:通过将通过每个输出缓冲晶体管的电源之间流过的直流电流设置为零,获得具有宽工作余量的积分电路的输出缓冲电路。 构成:驱动晶体管TR7的栅极连接到作为TR12的栅极驱动源的点B。 在节点B设置在电平“0”之后,将节点A设置为电平“1”,并且由于TR7由TR12的驱动电路的输出驱动,TR7和12被截止。 然后,TR11导通,因此当数据D从“0”变为“1”时,不产生通过TR11和12在电源VC和VS之间流动的电流。
    • 2. 发明专利
    • Semiconductor memory
    • 半导体存储器
    • JPS59113591A
    • 1984-06-30
    • JP22465582
    • 1982-12-21
    • Toshiba CorpTosubatsuku Service:Kk
    • IWAHASHI HIROSHIASANO MASAMICHISUZUKI KAZUTO
    • G11C11/41G11C11/34G11C11/409G11C11/417
    • G11C11/34
    • PURPOSE:To reduce the short-circuit current in an output buffer to stabilize the operation, by providing two buffer amplifying parts and controlling the operation of one buffer amplifying part in accordance with an output enable signal and grasping the change of an address signal to generate its delay signal. CONSTITUTION:Two buffer amplifying parts 10A and 10B are provided, and respective input terminals and output terminals are connected commonly. A control signal A is supplied to gates of MOSFETs 13A and 17A, and a control signal A' is supplied to gates of MOSFETs 16A and 20A respectively. A control signal B is supplied to gates of MOSFETs 13B and 17B, and a control signal B' is supplied to gates of MOSFETs 16B and 20B respectively. In case that an output buffer 5 and a CPU generates a short-circuit through a bus line, the time when a conventional excessive short-circuit current is flowed is very shorter because the buffer amplifying part 10B controlled by control signals B and B' is operated only for a prescribed time after the change of the address signal.
    • 目的:为了降低输出缓冲器中的短路电流以稳定运行,通过提供两个缓冲放大部分,并根据输出使能信号控制一个缓冲放大部分的工作,并掌握地址信号的变化以产生 其延迟信号。 构成:提供两个缓冲放大部分10A和10B,各个输入端子和输出端子共同连接。 控制信号A被提供给MOSFET 13A和17A的栅极,并且控制信号A'分别被提供给MOSFET 16A和20A的栅极。 控制信号B被提供给MOSFET 13B和17B的栅极,并且控制信号B'分别提供给MOSFET 16B和20B的栅极。 在输出缓冲器5和CPU通过总线产生短路的情况下,由于由控制信号B和B'控制的缓冲放大部分10B是由传统的过量短路电流流过的时间非常短 在更改地址信号后,只能运行一段规定的时间。
    • 3. 发明专利
    • Semiconductor integrated circuit
    • 半导体集成电路
    • JPS59113590A
    • 1984-06-30
    • JP22465482
    • 1982-12-21
    • Toshiba CorpTosubatsuku Service:Kk
    • IWAHASHI HIROSHIASANO MASAMICHISUZUKI KAZUTO
    • G11C11/417G11C11/34G11C11/409H01L27/10
    • G11C11/34
    • PURPOSE:To reduce the short-circuit current in an output buffer without lowering the operation speed, by providing two buffer amplifying parts and controlling the operation of one buffer amplifying part in accordance with an output enable signal and grasping a detection data change in a sense amplifier to generate its delay signal. CONSTITUTION:One data D detected by a sense amplifier 4 is supplied to the gate of an MOSFET51, and an inverted signal DD' of a delayed signal DD is supplied to the gate of an MOSFET52 connected in series to the MOSFET51. The other data detected by the sense amplifier 4 is supplied to the gate of an MOSFET53. Even if an output buffer 5 and a CPU generate a short-circuit through a bus line similarly to a conventional circuit, the time when a conventional excessive short-circuit current is flowed is very short because a buffer amplifier 10B controlled by control signals B and B' is operated only for a prescribed time after the change of data.
    • 目的:为了降低输出缓冲器中的短路电流而不降低运行速度,通过提供两个缓冲放大部件,并根据输出使能信号控制一个缓冲放大部分的工作,并在某种意义上掌握检测数据变化 放大器产生其延迟信号。 构成:由读出放大器4检测到的一个数据D被提供给MOSFET51的栅极,延迟信号DD的反相信号DD'被提供给与MOSFET51串联连接的MOSFET52的栅极。 由感测放大器4检测的其它数据被提供给MOSFET53的栅极。 即使输出缓冲器5和CPU与常规电路类似地通过总线产生短路,由于由控制信号B和B控制的缓冲放大器10B,传统的过流短路电流流过的时间非常短 B'在数据更改之后只能运行一段规定的时间。
    • 4. 发明专利
    • Semiconductor storage device
    • 半导体存储设备
    • JPS59154692A
    • 1984-09-03
    • JP2877283
    • 1983-02-23
    • Toshiba CorpTosubatsuku Service:Kk
    • IWAHASHI HIROSHIASANO MASAMICHISUZUKI KAZUTO
    • G11C11/41G11C11/34G11C16/06G11C17/00
    • G11C17/00
    • PURPOSE:To speed up data read speed by providing an MOS transister (TR) for discharging which discharges the charge on a data line coupled with plural memory cells so as to turn on an MOS TR7 when an address signal changes. CONSTITUTION:An MOS TR(Q)41 is connected between a circuit point S being an input terminal of a sense amplifier 36 and a reference potential point and an output signal from an NOR circuit 49 is inputted to its gate. Further, the output pulse from a pulse generating circuit 45 is inputted to the gate of a Q47 being a driving transistor to the NOR circuit 49 and the output signal from an inverter 44 is inputted to the gate of a Q48 being other driving TR respectively. Further, a signal at a connecting point between the Q46 and Q47, 48 in the NOR circuit 49 is inputted to the gate of the Q41 for discharge as an output signal in this circuit. A threshould voltage of said inverter 44 and a data sense level of the sense amplifier 36 are almost coincident with each other, then the discharge by the Q41 is attained in the vicinity of the sense level of the sense amplifier 36, thereby attaining the detection of data of the sense amplifier 36 in a short time.
    • 目的:通过提供放电的MOS转移器(TR)来加速数据读取速度,其中,在与多个存储单元耦合的数据线上放电,以便在地址信号改变时接通MOS TR7。 构成:将MOS TR(Q)41连接在作为读出放大器36的输入端的电路点S与基准电位点之间,将来自NOR电路49的输出信号输入到其门。 此外,来自脉冲发生电路45的输出脉冲被输入到NOR电路49的驱动晶体管的Q47的栅极,并且来自反相器44的输出信号分别输入到作为其他驱动TR的Q48的栅极。 此外,在NOR电路49中的Q46与Q47,48之间的连接点处的信号作为该电路中的输出信号输入到用于放电的Q41的栅极。 所述反相器44的检测电压和读出放大器36的数据感测电平几乎一致,则在读出放大器36的感测电平附近获得Q41的放电,从而实现检测 在短时间内读出放大器36的数据。
    • 5. 发明专利
    • Semiconductor device and manufacture thereof
    • 半导体器件及其制造
    • JPS5966150A
    • 1984-04-14
    • JP17718882
    • 1982-10-08
    • Toshiba CorpTosubatsuku Service:Kk
    • SUZUKI KAZUTOIWAHASHI HIROSHIASANO MASAMICHI
    • H01L23/52H01L21/3205H01L21/88
    • PURPOSE:To enable to prevent improper wirings due to stepwise disconnection of aluminum wirings by forming the upper or lower layer of the wirings in a 2- layer structure formed with wirings of polysilicon layer. CONSTITUTION:A contacting hole 14 opened at a diffused layer 12 is formed on an insulating film 13 formed of a silicon oxidized film of the upper surface of a wafer formed of the layer 12 in a substrate 11. An aluminum layer 20 is covered as the first conductive layer on the entire surface of the wafer, and a polysilicon layer 21 is further laminated as the second conductive layer on the layer 30, photoetched in the prescribed wiring pattern, and the wiring layer 22 of the 2- layer structure of the layers 20, 21 is formed. Thereafter, a PSG film 23 is covered as a protective film on the upper surface of the wafer, and a PSG film 23 and the layer 21 are photoetched to expose the layer 30 for bonding. In this manner, even if the layer 20 is stepwisely disconnected, the layer 21 of upper layer is formed uniformly along the surface of the contacting hole, and the whole wiring layer 22 is not entirely disconnected.
    • 目的:通过将布线的上层或下层形成为由多晶硅层的布线形成的2-层结构,能够防止由于铝布线的逐步断开引起的不正确布线。 构成:在基板11的由层12形成的晶片的上表面的硅氧化膜形成的绝缘膜13上形成有在扩散层12开口的接触孔14,铝层20被覆盖 在晶片的整个表面上的第一导电层和多晶硅层21作为第二导电层进一步层叠在层30上,在规定的布线图案中被蚀刻,并且层的2层结构的布线层22 20,21形成。 此后,将PSG膜23作为保护膜覆盖在晶片的上表面,并且对PSG膜23和层21进行光刻,以露出用于接合的层30。 以这种方式,即使层20逐步断开,上层的层21沿着接触孔的表面均匀地形成,并且整个布线层22没有完全断开。
    • 6. 发明专利
    • Semiconductor memory
    • 半导体存储器
    • JPS59113592A
    • 1984-06-30
    • JP22465682
    • 1982-12-21
    • Toshiba CorpTosubatsuku Service:Kk
    • IWAHASHI HIROSHIASANO MASAMICHISUZUKI KAZUTO
    • G11C11/417G11C11/34G11C11/409
    • G11C11/34
    • PURPOSE:To attain a highly reliable semiconductor memory without malfunction shortening an access time in an output buffer part by providing two buffer amplifying parts and controlling the operation of one buffer amplifying part in accordance with an output enable signal and grasping the signal change of the output enable signal to generate its delay signal. CONSTITUTION:Two buffer amplifying parts which buffer-amplify detection data of a sense amplifier are provided, and one buffer amplifying part 10A is controlled in accordance with the output enable signal, and the other buffer amplifying part 10B is operated only for a prescribed time corresponding to the signal delay time of a delay circuit after the output enable signal is changed to an active state. A bus line is driven with the large driving force by the parts 10A and 10B, and one buffer amplifying part 10B is stopped in the stage where the logical level of the bus line is almost set, and the bus line is driven with the smaller driving force than before by the left buffer amplifying part 10A, thus shortening the access time practically.
    • 目的:为了获得高度可靠的半导体存储器,无需通过提供两个缓冲放大部件来缩短输出缓冲器部分的访问时间,并根据输出使能信号控制一个缓冲放大部分的操作,并且掌握输出信号的变化 使能信号产生其延迟信号。 构成:提供缓冲放大读出放大器的检测数据的两个缓冲放大部分,并根据输出使能信号控制一个缓冲放大部分10A,另一个缓冲放大部分10B只对规定时间进行操作 与输出使能信号变为有效状态之后的延迟电路的信号延迟时间。 总线通过部件10A和10B以较大的驱动力驱动,并且一个缓冲放大部分10B在总线线路的逻辑电平几乎被设置的阶段停止,并且总线线路用较小的驱动 通过左缓冲放大部10A进行比较,从而实际上缩短了存取时间。