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1. 发明授权

US07053367B2 Mass spectrometer 有权
标题翻译：质谱仪
公开(公告)号：US07053367B2
公开(公告)日：2006-05-30
申请号：US10494335
申请日：2001-11-07
申请人： Tomoyuki Tobita , Toshihiro Ishizuka , Masaru Tomioka , Kiyomi Yoshinari , Masami Sakamoto
发明人： Tomoyuki Tobita , Toshihiro Ishizuka , Masaru Tomioka , Kiyomi Yoshinari , Masami Sakamoto
IPC分类号： H01J49/00
CPC分类号： H01J49/067 , H01J49/044
摘要： In a mass spectrometer utilizing an atmospheric pressure ion source, the amount of un-vaporized droplets that reach a mass spectrometric section is reduced. A mass spectrometer comprises: an ionization section for ionizing a sample at substantially atmospheric pressure; a first and a second intermediate pressure section in which the pressure is maintained lower than the pressure in said ionization section; a high vacuum section in which the pressure is maintained lower than the pressure in said intermediate pressure section and in which a mass spectrometric means for subjecting ions to mass spectrometry is disposed; a first pore electrode disposed between said ionization section and said first intermediate pressure section; an intermediate pore electrode disposed between said first intermediate pressure section and said second intermediate pressure section; and a second pore electrode disposed between said second intermediate pressure section and said high vacuum section. A first converging electrode is provided in the first intermediate pressure section, the first converging electrode having an opening towards the first pore electrode and another opening towards the intermediate pore electrode. The opening towards the first pore electrode has a larger diameter than the opening towards the intermediate pore electrode, such that the first converging electrode has a tapered shape.
摘要翻译：在使用大气压离子源的质谱仪中，达到质谱分析的未汽化液滴的量减少。质谱仪包括：用于在基本上大气压下电离样品的电离部分; 第一和第二中间压力段，其中所述压力保持低于所述电离部分中的压力; 其中压力保持低于所述中压部分中的压力并且其中设置用于使离子进行质谱分析的质谱装置的高真空部分; 设置在所述电离部和所述第一中间压部之间的第一孔电极; 设置在所述第一中间压力部分和所述第二中间压力部分之间的中间孔电极; 以及设置在所述第二中间压力部分和所述高真空部分之间的第二孔电极。第一会聚电极设置在第一中间压力部分中，第一会聚电极具有朝向第一孔电极的开口和朝向中间孔电极的另一开口。朝向第一孔电极的开口具有比朝向中间孔电极的开口更大的直径，使得第一会聚电极具有锥形形状。

2. 发明授权

US6157030A Ion trap mass spectrometer 有权
标题翻译：离子阱质谱仪
公开(公告)号：US6157030A
公开(公告)日：2000-12-05
申请号：US143398
申请日：1998-08-28
申请人： Minoru Sakairi , Tadao Mimura , Toshihiro Ishizuka , Masaru Tomioka , Yasuaki Takada , Takayuki Nabeshima
发明人： Minoru Sakairi , Tadao Mimura , Toshihiro Ishizuka , Masaru Tomioka , Yasuaki Takada , Takayuki Nabeshima
IPC分类号： H01J49/42
CPC分类号： H01J49/424
摘要： Disclosed is an ion trap mass spectrometer improved to obtain a high sensitivity without the lowering of resolution. By fitting a mesh electrode to an aperture (an ion sampling aperture or an ion extracting aperture) made in endcap electrodes constituting an ion trap mass analysis region, a radio frequency electric field in the mass analysis region is not disturbed even if the diameter of the aperture is set to a large value to heighten ion transmission efficiency. By fitting a shield electrode for preventing collision of ions with an insulated ring constituting an outer wall of the mass analysis region, charging up of the insulated ring is prevented to improve stability of detection signals. Furthermore, by arranging a shield member for shielding stray charged particles detouring through the circumference of the mass analysis region to approach an ion detector, generation of noises based on these stray charged particles is prevented.
摘要翻译：公开了一种改进的离子阱质谱仪，可以在不降低分辨率的情况下获得高灵敏度。通过将网状电极装配到构成离子阱质量分析区域的端盖电极中的孔（离子取样孔或离子提取孔）上，即使直径为孔径被设定为大的值以提高离子传输效率。通过安装用于防止离子与构成质量分析区域的外壁的绝缘环碰撞的屏蔽电极，防止了绝缘环的充电以提高检测信号的稳定性。此外，通过设置用于屏蔽通过质量分析区域的圆周去除杂散带电粒子的屏蔽构件以接近离子检测器，防止了基于这些杂散带电粒子的噪声的产生。

3. 发明申请

US20070200582A1 Probe and method of manufacturing a probe 失效
标题翻译：探头和制造探针的方法
公开(公告)号：US20070200582A1
公开(公告)日：2007-08-30
申请号：US11482848
申请日：2006-07-10
申请人： Toshihiro Ishizuka
发明人： Toshihiro Ishizuka
IPC分类号： G01R31/02
CPC分类号： G01R3/00 , G01R1/06738
摘要： A probe 10 to be used when inspecting characteristics of an object of inspection includes: a bar-shaped base member 3 forming a main body; a nickel plating layer 4 constituting a ground layer and a gold plating layer 5 constituting an outermost layer formed on a surface of the base member 3; and a plurality of square-pyramidal 1 protrusions formed in a lattice-like fashion at one end of the base member 3 and brought into contact with the object of inspection.
摘要翻译：当检查检查对象的特性时使用的探针10包括：形成主体的条形基部构件3; 构成接地层的镀镍层4和形成在基材3的表面上的最外层的镀金层5; 以及在基部构件3的一端形成为格子状的多个方形金字塔状的1个突起，与检查对象物接触。

4. 发明授权

US5109198A Nuclear magnetic resonance imaging apparatus 失效
标题翻译：核磁共振成像装置
公开(公告)号：US5109198A
公开(公告)日：1992-04-28
申请号：US469916
申请日：1990-01-24
申请人： Yoshiki Murakami , Etsuji Yamamoto , Masao Yabusaki , Hideki Kohno , Munetaka Tsuda , Toshihiro Ishizuka
发明人： Yoshiki Murakami , Etsuji Yamamoto , Masao Yabusaki , Hideki Kohno , Munetaka Tsuda , Toshihiro Ishizuka
IPC分类号： G01R33/34
CPC分类号： G01R33/34046
摘要： In a nuclear magnetic resonance imaging apparatus including a first probe circuit for detecting magnetic flux in a first direction and a second probe circuit for detecting magnetic flux in a direction perpendicular to the first direction, the arm angle of conductor arms to form the first probe circuit and the arm angle of conductor arms to form the second probe circuit are different from each other.
摘要翻译：在包括用于检测第一方向的磁通的第一探针电路和用于检测与第一方向垂直的方向上的磁通的第二探针电路的核磁共振成像装置中，形成第一探针电路的导体臂的臂角并且形成第二探针电路的导体臂的臂角彼此不同。

5. 发明申请

US20070229097A1 Probe, probe card, and testing device 审中-公开
标题翻译：探头，探针卡和测试装置
公开(公告)号：US20070229097A1
公开(公告)日：2007-10-04
申请号：US11439227
申请日：2006-05-24
申请人： Toshihiro Ishizuka
发明人： Toshihiro Ishizuka
IPC分类号： G01R31/02
CPC分类号： G01R1/07342 , G01R1/06738
摘要： An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for performing a test for conductivity of a conductive wiring in a hole such as a through hole or a contact hole provided in a circuit board. The probe (10) is provided with an elastically deformable leg portion (11) and a contact portion (13) provided on a tip side of the leg portion (11) to be brought into contact with the conductive wiring (21) provided in a through hole (22). The contact portion (13) is formed to be in a shape and size so as to be prevented from entering the through hole (22).
摘要翻译：本发明的目的是提供一种探针，探针卡和测试装置，其可以精确地对例如设置在电路板中的通孔或接触孔中的导电布线的导电状态进行测试。提供一种用于对设置在电路板中的通孔或接触孔等孔中的导电配线进行导电性试验的探针（10）。探针（10）设置有可弹性变形的腿部（11）和设置在腿部（11）的末端侧的接触部分（13），以与设置在其中的导电布线（21）接触通孔（22）。接触部分（13）形成为防止其进入通孔（22）的形状和尺寸。

6. 发明授权

US5261403A Magnetic resonance imaging apparatus 失效
标题翻译：磁共振成像装置
公开(公告)号：US5261403A
公开(公告)日：1993-11-16
申请号：US839662
申请日：1992-01-21
申请人： Minoru Saito , Toshihiro Ishizuka , Yasuo Wada
发明人： Minoru Saito , Toshihiro Ishizuka , Yasuo Wada
IPC分类号： G01R33/34 , A61B5/055
CPC分类号： G01R33/34061 , G01R33/34084
摘要： In an MR imaging apparatus, a receiving coil comprising an upper coil and a lower coil which jointly sandwitch a desired part of a body to be inspected in an openable and closable manner, the upper and the lower coils being connected by connection means comprised of flexible and electrically conductive member to form a single coil. NMR signals can be detected at a high sensitivity, enabling an image of a high S/N ratio and measurement of a wide detection region.
摘要翻译：在MR成像装置中，包括上部线圈和下部线圈的接收线圈，其以可开启和关闭的方式联合地对待检查的物体的所需部分进行开关，所述上部和下部线圈由包括柔性的连接装置连接和导电构件以形成单个线圈。可以以高灵敏度检测NMR信号，使得能够获得高S / N比的图像和宽检测区域的测量。

7. 发明授权

US4814709A Method of selecting specific region of sample 失效
标题翻译：选择样品的特定区域的方法
公开(公告)号：US4814709A
公开(公告)日：1989-03-21
申请号：US59879
申请日：1987-05-26
申请人： Ryuzaburo Takeda , Hideaki Koizumi , Toshihiro Ishizuka
发明人： Ryuzaburo Takeda , Hideaki Koizumi , Toshihiro Ishizuka
IPC分类号： A61B10/00 , A61B5/055 , G01R33/48 , G01R33/483 , G01R33/54 , G01R33/20
CPC分类号： G01R33/4838 , G01R33/482
摘要： This invention relates to a selection method of a specific region of a sample which is suitable for use in a nuclear magnetic resonance (NMR) imaging. Selection of a specific region suitable for obtaining multi-dimensional spatial information can be preferably made. To satisfy this requirement, the spin of the specific region of the sample is brought down in a direction at right angles to a static magnetic field, the regions other than the specific region are, in the mean time, brought down in a direction at right angles to the static magnetic field, and thereafter the static magnetic field is rendered non-uniform to that the spins of the regions other than the specific region become saturated.
摘要翻译： PCT No.PCT / JP86 / 00492 Sec。 371日期：1987年5月26日 102（e）日期1987年5月26日PCT PCT日期为1986年9月25日。本发明涉及适用于核磁共振（NMR）成像的样品的特定区域的选择方法。可以优选选择适于获得多维空间信息的特定区域。为了满足这一要求，样品的特定区域的旋转沿与静磁场成直角的方向下降，特定区域以外的区域同时沿着向右的方向下降与静磁场成角度，此后静电磁场变得不均匀，使特定区域以外的区域的自旋变得饱和。

8. 发明授权

US4755749A Strobo electron beam apparatus 失效
标题翻译： Strobo电子束装置
公开(公告)号：US4755749A
公开(公告)日：1988-07-05
申请号：US897857
申请日：1986-08-19
申请人： Kazuo Ookubo , Akio Ito , Yoshiro Goto , Toshihiro Ishizuka , Kazuyuki Ozaki
发明人： Kazuo Ookubo , Akio Ito , Yoshiro Goto , Toshihiro Ishizuka , Kazuyuki Ozaki
IPC分类号： H01L21/66 , G01Q30/02 , G01R31/302 , G01R31/305 , H01J37/28 , G01N23/00
CPC分类号： G01R31/305
摘要： A strobo electron beam apparatus is provided having an energy analyzer, which: measures the voltage in the integrated circuit; samples a secondary electron signal by setting and connecting a retarding voltage of the energy analyzer to the measured phase; obtains the waveform of the secondary electron signal by a one time or several times phase scanning; and adds the product of a suitable coefficient and a difference between the secondary electron signal waveform, and a slice level to the retarding voltage and corrects the same. Multiple units are provided for: judging the conversion of the retarding voltage, from the value of the dispersion for the slice level of the secondary electron signal waveform; for adding and giving a mean of the retarding voltage, for obtaining a measured value of retarding voltage having a desired S/N ratio; and for random phase scanning so that the measured value having a desired S/N ratio can be easily obtained.
摘要翻译：提供了一种频闪电子束装置，其具有：能量分析器，其测量集成电路中的电压; 通过将能量分析仪的延迟电压设置并连接到测量相位来对二次电子信号进行采样; 通过一次或多次相位扫描获得二次电子信号的波形; 并将二次电子信号波形和限幅电平之间的适当系数和差值的乘积加到延迟电压上并进行校正。提供多个单元，用于从二次电子信号波形的限幅电平的色散值判断延迟电压的转换; 为了获得具有期望S / N比的延迟电压的测量值，用于添加和给出平均延迟电压; 并进行随机相位扫描，从而可以容易地获得具有期望S / N比的测量值。

9. 发明授权

US07612572B2 Probe and method of manufacturing a probe 失效
标题翻译：探头和制造探针的方法
公开(公告)号：US07612572B2
公开(公告)日：2009-11-03
申请号：US11482848
申请日：2006-07-10
申请人： Toshihiro Ishizuka
发明人： Toshihiro Ishizuka
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： G01R3/00 , G01R1/06738
摘要： A probe 10 to be used when inspecting characteristics of an object of inspection includes: a bar-shaped base member 3 forming a main body; a nickel plating layer 4 constituting a ground layer and a gold plating layer 5 constituting an outermost layer formed on a surface of the base member 3; and a plurality of square-pyramidal 1 protrusions formed in a lattice-like fashion at one end of the base member 3 and brought into contact with the object of inspection.
摘要翻译：当检查检查对象的特性时使用的探针10包括：形成主体的条形基部构件3; 构成接地层的镀镍层4和形成在基材3的表面上的最外层的镀金层5; 以及在基部构件3的一端形成为格子状的多个方形金字塔状的1个突起，与检查对象物接触。

10. 发明申请

US20080157797A1 Probe, probe card, and testing device 有权
标题翻译：探头，探针卡和测试装置
公开(公告)号：US20080157797A1
公开(公告)日：2008-07-03
申请号：US12073114
申请日：2008-02-29
申请人： Toshihiro Ishizuka
发明人： Toshihiro Ishizuka
IPC分类号： G01R1/067
CPC分类号： G01R1/07342 , G01R1/06738
摘要： An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for performing a test for conductivity of a conductive wiring in a hole such as a through hole or a contact hole provided in a circuit board. The probe (10) is provided with an elastically deformable leg portion (11) and a contact portion (13) provided on a tip side of the leg portion (11) to be brought into contact with the conductive wiring (21) provided in a through hole (22). The contact portion (13) is formed to be in a shape and size so as to be prevented from entering the through hole (22).
摘要翻译：本发明的目的是提供一种探针，探针卡和测试装置，其可以精确地对例如设置在电路板中的通孔或接触孔中的导电布线的导电状态进行测试。提供一种用于对设置在电路板中的通孔或接触孔等孔中的导电配线进行导电性试验的探针（10）。探针（10）设置有可弹性变形的腿部（11）和设置在腿部（11）的末端侧的接触部分（13），以与设置在其中的导电布线（21）接触通孔（22）。接触部分（13）形成为防止其进入通孔（22）的形状和尺寸。

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