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1. 发明授权

US07642973B2 Electromagnetic wave analysis apparatus and design support apparatus 失效
标题翻译：电磁波分析装置及设计支持装置
公开(公告)号：US07642973B2
公开(公告)日：2010-01-05
申请号：US11311992
申请日：2005-12-20
申请人： Tomoya Maekawa , Tetsuyoshi Ogura , Toru Yamada
发明人： Tomoya Maekawa , Tetsuyoshi Ogura , Toru Yamada
IPC分类号： G01R29/10 , G01R31/302
CPC分类号： G01R29/0814 , G01R29/0871
摘要： A design support apparatus of the present invention includes the following: an antenna electromagnetic field distribution input portion that inputs data indicating an antenna electromagnetic field distribution in the vicinity of electronic equipment; a board near electromagnetic field distribution input portion that inputs data indicating a board near electromagnetic field distribution as unwanted radiation noise radiated from a board of the electronic equipment; and a correlation value generator that generates a distribution of correlation values showing a correlation between the antenna electromagnetic field and the board near electromagnetic field based on the antenna electromagnetic field distribution data and the board near electromagnetic field distribution data.
摘要翻译：本发明的设计支持装置包括：天线电磁场分布输入部，输入表示电子设备附近的天线电磁场分布的数据; 在电磁场分布输入部分附近的板，其将表示电磁场分布附近的板的数据输入作为从电子设备的板辐射的不必要的辐射噪声; 以及相关值发生器，其基于所述天线电磁场分布数据和所述基板附近的电磁场分布数据，生成表示所述天线电磁场与所述基板之间的电磁场附近的相关性的相关值的分布。

2. 发明申请

US20070079272A1 Design support system and design method for circuit board, and noise analysis program 失效
标题翻译：电路板设计支持系统及设计方法，噪声分析程序
公开(公告)号：US20070079272A1
公开(公告)日：2007-04-05
申请号：US11513267
申请日：2006-08-31
申请人： Tomoya Maekawa , Toru Yamada , Tetsuyoshi Ogura
发明人： Tomoya Maekawa , Toru Yamada , Tetsuyoshi Ogura
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , G06F2217/82
摘要： A design support system for circuit board includes: a noise source extracting unit for extracting a source of unwanted radiation noise which is generated from a circuit board mounted on an electronic equipment; a noise characteristics input unit for inputting noise characteristics of the unwanted radiation noise which is emitted by the extracted noise source; a noise attenuation ratio input unit for inputting an attenuation ratio of the unwanted radiation noise which is emitted by the noise source and propagated to a feed point of an antenna; a correlation value calculation unit for calculating a correlation value between the noise characteristics and the attenuation ratio of the unwanted radiation noise; and a comparator unit for comparing the calculated correlation value with a predetermined allowable value, whereby avoiding malfunction of an electronic equipment due to interference of unwanted radiation noises generated from the particular electronic equipment into the circuit board via the antenna.
摘要翻译：一种用于电路板的设计支持系统包括：噪声源提取单元，用于提取从安装在电子设备上的电路板产生的不需要的辐射噪声源; 噪声特性输入单元，用于输入由所提取的噪声源发射的不需要的辐射噪声的噪声特性; 噪声衰减率输入单元，用于输入由噪声源发射并传播到天线的馈电点的不需要的辐射噪声的衰减比; 相关值计算单元，用于计算噪声特性与不需要的辐射噪声的衰减比之间的相关值; 以及比较器单元，用于将所计算的相关值与预定的允许值进行比较，由此由于由特定电子设备产生的不需要的放射线噪声经由天线到电路板中的避免电子设备的故障。

3. 发明授权

US07647034B2 Design support system and design method for circuit board, and noise analysis program 失效
标题翻译：电路板设计支持系统及设计方法，噪声分析程序
公开(公告)号：US07647034B2
公开(公告)日：2010-01-12
申请号：US11513267
申请日：2006-08-31
申请人： Tomoya Maekawa , Toru Yamada , Tetsuyoshi Ogura
发明人： Tomoya Maekawa , Toru Yamada , Tetsuyoshi Ogura
IPC分类号： H04B1/10
CPC分类号： G06F17/5036 , G06F2217/82
摘要： A design support system for circuit board includes: a noise source extracting unit for extracting a source of unwanted radiation noise which is generated from a circuit board mounted on an electronic equipment; a noise characteristics input unit for inputting noise characteristics of the unwanted radiation noise which is emitted by the extracted noise source; a noise attenuation ratio input unit for inputting an attenuation ratio of the unwanted radiation noise which is emitted by the noise source and propagated to a feed point of an antenna; a correlation value calculation unit for calculating a correlation value between the noise characteristics and the attenuation ratio of the unwanted radiation noise; and a comparator unit for comparing the calculated correlation value with a predetermined allowable value, whereby avoiding malfunction of an electronic equipment due to interference of unwanted radiation noises generated from the particular electronic equipment into the circuit board via the antenna.
摘要翻译：一种用于电路板的设计支持系统包括：噪声源提取单元，用于提取从安装在电子设备上的电路板产生的不需要的辐射噪声源; 噪声特性输入单元，用于输入由所提取的噪声源发射的不需要的辐射噪声的噪声特性; 噪声衰减率输入单元，用于输入由噪声源发射并传播到天线的馈电点的不需要的辐射噪声的衰减比; 相关值计算单元，用于计算噪声特性与不需要的辐射噪声的衰减比之间的相关值; 以及比较器单元，用于将所计算的相关值与预定的允许值进行比较，由此由于由特定电子设备产生的不需要的放射线噪声经由天线到电路板中的避免电子设备的故障。

4. 发明申请

US20060132118A1 Electromagnetic wave analysis apparatus and design support apparatus 失效
标题翻译：电磁波分析装置及设计支援装置
公开(公告)号：US20060132118A1
公开(公告)日：2006-06-22
申请号：US11311992
申请日：2005-12-20
申请人： Tomoya Maekawa , Tetsuyoshi Ogura , Toru Yamada
发明人： Tomoya Maekawa , Tetsuyoshi Ogura , Toru Yamada
IPC分类号： G01R31/00
CPC分类号： G01R29/0814 , G01R29/0871
摘要： A design support apparatus of the present invention includes the following: an antenna electromagnetic field distribution input portion that inputs data indicating an antenna electromagnetic field distribution in the vicinity of electronic equipment; a board near electromagnetic field distribution input portion that inputs data indicating a board near electromagnetic field distribution as unwanted radiation noise radiated from a board of the electronic equipment; and a correlation value generator that generates a distribution of correlation values showing a correlation between the antenna electromagnetic field and the board near electromagnetic field based on the antenna electromagnetic field distribution data and the board near electromagnetic field distribution data.
摘要翻译：本发明的设计支持装置包括：天线电磁场分布输入部，输入表示电子设备附近的天线电磁场分布的数据; 在电磁场分布输入部分附近的板，其将表示电磁场分布附近的板的数据输入作为从电子设备的板辐射的不必要的辐射噪声; 以及相关值发生器，其基于所述天线电磁场分布数据和所述基板附近的电磁场分布数据，生成表示所述天线电磁场与所述基板之间的电磁场附近的相关性的相关值的分布。

5. 发明申请

US20080183322A1 Equivalent material constant calculation system, storage medium storing an equivalent material constant calculation program, equivalent material constant calculation method, design system, and structure manufacturing method 有权
标题翻译：等效材料常数计算系统，存储等效材料常数计算程序的存储介质，等效材料常数计算方法，设计系统和结构制造方法
公开(公告)号：US20080183322A1
公开(公告)日：2008-07-31
申请号：US12077879
申请日：2008-03-21
申请人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
发明人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
IPC分类号： G06F17/00 , G06F1/02
CPC分类号： G01N25/18
摘要： An equivalent material constant calculation system that calculates an equivalent material constant of a structure constituted by a plurality of materials includes a shape data input portion that inputs shape data, a material data input portion that inputs material constant data, a dividing portion that divides the structure into a plurality of small regions, and a small region interior calculation portion that calculates equivalent material constants in the small regions, in which the small region interior calculation portion, based on the shape data and material constant data, with a function that includes a value in a variable that expresses a position in at least one direction in the small region, expresses an equivalent material constant for a region that is a portion of a small region, and using the function, calculates an equivalent material constant for the small region with respect to the at least one direction.
摘要翻译：计算由多种材料构成的结构的等效材料常数的等效材料常数计算系统包括输入形状数据的形状数据输入部分，输入材料常数数据的材料数据输入部分，分割结构的分割部分以及小区域内部计算部分，其基于所述形状数据和材料常数数据，计算小区域内部计算部分中具有包括值的功能的小区域中的等效材料常数在表示小区域中的至少一个方向的位置的变量中，表示对于小区域的一部分的区域的等效材料常数，并且使用该函数，计算小区域的等效材料常数至少一个方向。

6. 发明授权

US07814445B2 Circuit wiring interference analysis device, interference analysis program, database used in interference analysis device, and asymmetrically connected line model 有权
标题翻译：电路布线干扰分析装置，干扰分析程序，干扰分析装置使用的数据库，以及不对称线路模型
公开(公告)号：US07814445B2
公开(公告)日：2010-10-12
申请号：US11911609
申请日：2006-04-14
申请人： Hideki Iwaki , Naoki Komatsu , Tetsuyoshi Ogura , Toru Yamada
发明人： Hideki Iwaki , Naoki Komatsu , Tetsuyoshi Ogura , Toru Yamada
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , H05K1/0216 , H05K3/0005
摘要： An interference analysis device that analyzes interference includes an input unit that inputs design data, a selection unit that selects an analysis region, a division unit that divides a wire into segments, a calculation unit that calculates a circuit matrix regarding a coupled line, and an analysis unit that obtains a degree of electromagnetic interference, wherein the calculation unit calculates a circuit matrix of the coupled line, using a parameter set obtained by adding an asymmetry parameter to RLGC parameters of a transmission line in the coupled line. Thus, a method for analyzing an interference of circuit wiring can be provided, which is capable of shortening a processing time substantially while maintaining high precision.
摘要翻译：分析干扰的干扰分析装置包括：输入设备数据的输入单元，选择分析区域的选择单元，将线分割成分段的分割单元;计算与耦合线路有关的电路矩阵的计算单元;以及分析单元，其中所述计算单元使用通过将耦合线中的传输线的RLGC参数加上不对称参数而获得的参数集来计算所述耦合线路的电路矩阵。因此，可以提供用于分析电路布线的干扰的方法，其能够在保持高精度的同时基本上缩短处理时间。

7. 发明申请

US20090012750A1 CHASSIS SURFACE TEMPERATURE ESTIMATE APPARATUS, METHOD, PROGRAM, AND STORAGE MEDIUM 审中-公开
标题翻译：底盘表面温度估计装置，方法，程序和存储介质
公开(公告)号：US20090012750A1
公开(公告)日：2009-01-08
申请号：US12161946
申请日：2007-01-09
申请人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
发明人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
IPC分类号： G06F17/50 , G06F17/10
CPC分类号： G06F17/5009 , G06F2217/80
摘要： A chassis surface temperature estimate apparatus capable of quickly and easily estimating a chassis surface temperature without obtaining a parameter for each component through actual measurement for thermal design is provided. A thermal analysis execution section (6) executes a thermal analysis in units of heat-generation groups each including at least one heat-generating component, and obtains the chassis surface temperatures caused by respective heat-generation groups. A storage section (8) stores the chassis surface temperatures obtained for respective heat-generation group. A synthesis section (7) firstly reads the chassis surface temperature data from the storage section (8), and converts the chassis surface temperatures caused by respective heat-generation groups to radiation amounts. Secondly, the synthesis section (7) calculates a sum of radiation amounts by adding the radiation amounts obtained through the conversion. The synthesis section (7) calculates the chassis surface temperature in which the chassis surface temperatures of respective heat-generation groups are combined with each other by converting the obtained sum of the radiation amounts to a temperature.
摘要翻译：提供了一种能够通过对热设计的实际测量而获得每个部件的参数而能够快速而容易地估计底盘表面温度的底盘表面温度估计装置。热分析执行部（6）以包含至少一个发热部的发热体为单位进行热分析，得到各发热体所引起的底盘面温度。存储部（8）存储对于各个发热组获得的底盘表面温度。合成部（7）首先从存储部（8）读取底盘表面温度数据，并将由各个发热组引起的底盘表面温度转换为辐射量。其次，合成部（7）通过将通过转换获得的辐射量相加来计算辐射量之和。合成部（7）通过将所获得的辐射量之和转换为温度来计算将各个发热体的底盘表面温度相互组合的底盘表面温度。

8. 发明申请

US20060095493A1 Equivalent material constant calculation system, storage medium storing an equivalent material constant calculation program, equivalent material constant calculation method, design system, and structure manufacturing method 有权
公开(公告)号：US20060095493A1
公开(公告)日：2006-05-04
申请号：US11259835
申请日：2005-10-27
申请人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
发明人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
IPC分类号： G06F7/38
CPC分类号： G01N25/18
摘要： An equivalent material constant calculation system that calculates an equivalent material constant of a structure constituted by a plurality of materials includes a shape data input portion that inputs shape data, a material data input portion that inputs material constant data, a dividing portion that divides the structure into a plurality of small regions, and a small region interior calculation portion that calculates equivalent material constants in the small regions, in which the small region interior calculation portion, based on the shape data and material constant data, with a function that includes a value in a variable that expresses a position in at least one direction in the small region, expresses an equivalent material constant for a region that is a portion of a small region, and using the function, calculates an equivalent material constant for the small region with respect to the at least one direction.

9. 发明授权

US07548792B2 Equivalent material constant calculation system, storage medium storing an equivalent material constant calculation program, equivalent material constant calculation method, design system, and structure manufacturing method 有权
标题翻译：等效材料常数计算系统，存储等效材料常数计算程序的存储介质，等效材料常数计算方法，设计系统和结构制造方法
公开(公告)号：US07548792B2
公开(公告)日：2009-06-16
申请号：US12077879
申请日：2008-03-21
申请人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
发明人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
IPC分类号： G06F17/00 , G06F1/02
CPC分类号： G01N25/18
摘要： An equivalent material constant calculation system that calculates an equivalent material constant of a structure constituted by a plurality of materials includes a shape data input portion that inputs shape data, a material data input portion that inputs material constant data, a dividing portion that divides the structure into a plurality of small regions, and a small region interior calculation portion that calculates equivalent material constants in the small regions, in which the small region interior calculation portion, based on the shape data and material constant data, with a function that includes a value in a variable that expresses a position in at least one direction in the small region, expresses an equivalent material constant for a region that is a portion of a small region, and using the function, calculates an equivalent material constant for the small region with respect to the at least one direction.
摘要翻译：计算由多种材料构成的结构的等效材料常数的等效材料常数计算系统包括输入形状数据的形状数据输入部分，输入材料常数数据的材料数据输入部分，分割结构的分割部分以及小区域内部计算部分，其基于所述形状数据和材料常数数据，计算小区域内部计算部分中具有包括值的功能的小区域中的等效材料常数在表示小区域中的至少一个方向的位置的变量中，表示对于小区域的一部分的区域的等效材料常数，并且使用该函数，计算小区域的等效材料常数至少一个方向。

10. 发明授权

US07379780B2 Equivalent material constant calculation system, storage medium storing an equivalent material constant calculation program, equivalent material constant calculation method, design system, and structure manufacturing method 有权
公开(公告)号：US07379780B2
公开(公告)日：2008-05-27
申请号：US11259835
申请日：2005-10-27
申请人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
发明人： Yutaka Kumano , Tetsuyoshi Ogura , Toru Yamada
IPC分类号： G06F19/00
CPC分类号： G01N25/18
摘要： An equivalent material constant calculation system that calculates an equivalent material constant of a structure constituted by a plurality of materials includes a shape data input portion that inputs shape data, a material data input portion that inputs material constant data, a dividing portion that divides the structure into a plurality of small regions, and a small region interior calculation portion that calculates equivalent material constants in the small regions, in which the small region interior calculation portion, based on the shape data and material constant data, with a function that includes a value in a variable that expresses a position in at least one direction in the small region, expresses an equivalent material constant for a region that is a portion of a small region, and using the function, calculates an equivalent material constant for the small region with respect to the at least one direction.

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