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    • 2. 发明申请
    • Memory device
    • 内存设备
    • US20060056247A1
    • 2006-03-16
    • US11227038
    • 2005-09-14
    • Tomotoshi Satoh
    • Tomotoshi Satoh
    • G11C29/00
    • G11C29/808G11C5/02G11C5/04G11C29/785
    • First memory chips each have a memory cell as storage means for storing data and do not have a redundant memory cell as redundant storage means for repairing an erroneous bit in the memory cell. Furthermore, a logic minimal in degree is solely provided for operation on a control logic of a second memory chip. The second memory chip has a control logic for effecting memory control of the memory cells, the redundant memory cells, etc. and a redundant memory cell for repairing an error bit of the first memory chips. The memory device is structured by stacking the first and second memory chips.
    • 第一存储器芯片各自具有作为用于存储数据的存储装置的存储单元,并且没有冗余存储单元作为用于修复存储器单元中的错误位的冗余存储装置。 此外,仅对第二存储器芯片的控制逻辑进行操作的逻辑最小程度。 第二存储器芯片具有用于实现存储器单元,冗余存储器单元等的存储器控​​制的控制逻辑和用于修复第一存储器芯片的错误位的冗余存储单元。 存储器件通过堆叠第一和第二存储器芯片来构造。
    • 5. 发明授权
    • Memory device having redundant memory for repairing defects
    • 具有用于修复缺陷的冗余存储器的存储器件
    • US07218559B2
    • 2007-05-15
    • US11227038
    • 2005-09-14
    • Tomotoshi Satoh
    • Tomotoshi Satoh
    • G11C29/00
    • G11C29/808G11C5/02G11C5/04G11C29/785
    • First memory chips each have a memory cell as storage means for storing data and do not have a redundant memory cell as redundant storage means for repairing an erroneous bit in the memory cell. Furthermore, a logic minimal in degree is solely provided for operation on a control logic of a second memory chip. The second memory chip has a control logic for effecting memory control of the memory cells, the redundant memory cells, etc. and a redundant memory cell for repairing an error bit of the first memory chips. The memory device is structured by stacking the first and second memory chips.
    • 第一存储器芯片各自具有作为用于存储数据的存储装置的存储单元,并且没有冗余存储单元作为用于修复存储器单元中的错误位的冗余存储装置。 此外,仅对第二存储器芯片的控制逻辑进行操作的逻辑最小程度。 第二存储器芯片具有用于实现存储器单元,冗余存储器单元等的存储器控​​制的控制逻辑和用于修复第一存储器芯片的错误位的冗余存储单元。 存储器件通过堆叠第一和第二存储器芯片来构造。