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    • 2. 发明授权
    • Matching circuit and plasma processing apparatus
    • 匹配电路和等离子体处理装置
    • US06707253B2
    • 2004-03-16
    • US10324031
    • 2002-12-20
    • Kenji SumidaTomohiro OkumuraYukihiro MaegawaIchiro NakayamaKibatsu ShinoharaMinoru KandaShiniti Matamura
    • Kenji SumidaTomohiro OkumuraYukihiro MaegawaIchiro NakayamaKibatsu ShinoharaMinoru KandaShiniti Matamura
    • H01J2336
    • H01J37/32082H01J37/32183
    • The present invention provides a matching circuit which has a wide range in which matching can be achieved and the matched state of which is stabilized with respect to a change in the load state. To an input terminal (31) of a matching circuit (30), one terminal of a first variable reactance element (32) is connected. The other terminal of the first variable reactance element (32) is connected to a point between a first fixed reactance element (33a) and a second fixed reactance element (33b), which are connected in series. The first fixed reactance element (33a) is grounded, and the second fixed reactance element (33b) is connected to one terminal of a second variable reactance element (36) and connected to one terminal of a stripline (37). The other terminal of the second variable reactance element (36) is grounded, and the other terminal of the stripline (37) is connected to an output terminal (38).
    • 本发明提供一种匹配电路,其具有可以实现匹配的宽范围,并且其匹配状态相对于负载状态的变化是稳定的。 对于匹配电路(30)的输入端子(31),连接第一可变电抗元件(32)的一个端子。 第一可变电抗元件(32)的另一个端子连接到串联连接的第一固定电抗元件(33a)和第二固定电抗元件(33b)之间的点。 第一固定电抗元件(33a)接地,第二固定电抗元件(33b)连接到第二可变电抗元件(36)的一个端子,并连接到带状线(37)的一个端子。 第二可变电抗元件(36)的另一个端子接地,并且带状线(37)的另一个端子连接到输出端子(38)。
    • 4. 发明授权
    • Plasma processing method and apparatus
    • 等离子体处理方法和装置
    • US06830653B2
    • 2004-12-14
    • US10207183
    • 2002-07-30
    • Tomohiro OkumuraYukihiro MaegawaIzuru MatsudaTakayuki KaiMitsuo Saitoh
    • Tomohiro OkumuraYukihiro MaegawaIzuru MatsudaTakayuki KaiMitsuo Saitoh
    • C23C1600
    • H01J37/32091C23C16/4412H01J37/32192H01J37/3222H01J37/3244H01J37/32834
    • A plasma processing method for generating plasma in a vacuum chamber and processing a substrate placed on a substrate electrode, the plasma being generated by supplying a high-frequency power having a frequency of 50 MHz to 3 GHz to an antenna provided opposite to the substrate electrode while interior of the vacuum chamber is controlled to a specified pressure by supplying a gas into the vacuum chamber and exhausting the interior of the vacuum chamber, the method includes with a dielectric plate being sandwiched between the antenna and the vacuum chamber and both the antenna and the dielectric plate projecting into the vacuum chamber, controlling plasma distribution on the substrate with an annular and recessed slit provided between the antenna and the vacuum chamber, and processing the substrate in a state where the antenna cover is fixed by making both an inner side face of the slit and the antenna covered with an antenna cover, making a bottom face of the slit covered with a slit cover, supporting the antenna cover by the slit cover, and fixing the slit cover to a wall surface of the vacuum chamber.
    • 一种用于在真空室中产生等离子体并处理放置在基板电极上的基板的等离子体处理方法,所述等离子体是通过将频率为50MHz至3GHz的高频电源提供给与基板电极相对设置的天线而产生的 通过向真空室供给气体并排出真空室的内部,真空室的内部被控制到规定的压力,该方法包括夹在天线和真空室之间的电介质板,天线和 电介质板突出到真空室中,通过设置在天线和真空室之间的环形和凹槽来控制基板上的等离子体分布,并且通过使天线盖固定的状态来处理基板 的狭缝和天线覆盖有天线盖,使狭缝的底面覆盖有狭缝c 通过狭缝盖支撑天线罩,并将狭缝盖固定到真空室的壁面。
    • 5. 发明授权
    • Plasma processing method and apparatus
    • 等离子体处理方法和装置
    • US07406925B2
    • 2008-08-05
    • US10983670
    • 2004-11-09
    • Tomohiro OkumuraYukihiro MaegawaIzuru MatsudaTakayuki KaiMitsuo Saitoh
    • Tomohiro OkumuraYukihiro MaegawaIzuru MatsudaTakayuki KaiMitsuo Saitoh
    • H01L21/00C23C16/00
    • H01J37/32091C23C16/4412H01J37/32192H01J37/3222H01J37/3244H01J37/32834
    • A plasma processing apparatus including a vacuum chamber, a gas supply unit for supplying gas into the vacuum chamber, an exhausting unit for exhausting the interior of the vacuum chamber, a pressure-regulating valve for controlling the interior of the vacuum chamber to a specified pressure, a substrate electrode for placing thereon a substrate within the vacuum chamber, an antenna provided opposite to the substrate electrode, and a high-frequency power supply capable of supplying to the antenna a high-frequency power having a frequency of 50 MHz to 3 GHz. The plasma processing apparatus also has a dielectric plate sandwiched between the antenna and an inner surface of the vacuum chamber, an antenna cover for covering side surfaces of the antenna and the dielectric plate and a substrate-facing surface of the antenna, a slit cover for covering an exposed surface of the substrate-facing inner surface of the vacuum chamber and fixing the antenna cover to a wall surface of the vacuum chamber. Also, a heat-conducting sheet is provided between the antenna and the antenna cover.
    • 一种等离子体处理装置,包括真空室,用于向真空室供应气体的气体供应单元,用于排出真空室内部的排气单元,用于将真空室内部控制到特定压力的压力调节阀 ,用于将真空室内的基板放置的基板电极,与基板电极相对设置的天线,以及能够向天线供给频率为50MHz〜3GHz的高频电力的高频电源 。 等离子体处理装置还具有夹在天线和真空室的内表面之间的电介质板,用于覆盖天线和电介质板的侧表面的天线盖和天线的面向基板的表面,狭缝盖 覆盖真空室的面向基板的内表面的暴露表面,并将天线盖固定到真空室的壁表面。 此外,在天线和天线罩之间设置导热片。
    • 6. 发明申请
    • Plasma processing method and apparatus
    • 等离子体处理方法和装置
    • US20050082005A1
    • 2005-04-21
    • US10983670
    • 2004-11-09
    • Tomohiro OkumuraYukihiro MaegawaIzuru MatsudaTakayuki KaiMitsuo Saitoh
    • Tomohiro OkumuraYukihiro MaegawaIzuru MatsudaTakayuki KaiMitsuo Saitoh
    • C23C16/00C23F1/00H01J37/32H01L21/00H05H1/24
    • H01J37/32091C23C16/4412H01J37/32192H01J37/3222H01J37/3244H01J37/32834
    • A plasma processing method for generating plasma in a vacuum chamber and processing a substrate placed on a substrate electrode, the plasma being generated by supplying a high-frequency power having a frequency of 50 MHz to 3 GHz to an antenna provided opposite to the substrate electrode while interior of the vacuum chamber is controlled to a specified pressure by supplying a gas into the vacuum chamber and exhausting the interior of the vacuum chamber, the method includes with a dielectric plate being sandwiched between the antenna and the vacuum chamber and both the antenna and the dielectric plate projecting into the vacuum chamber, controlling plasma distribution on the substrate with an annular and recessed slit provided between the antenna and the vacuum chamber, and processing the substrate in a state where the antenna cover is fixed by making both an inner side face of the slit and the antenna covered with an antenna cover, making a bottom face of the slit covered with a slit cover, supporting the antenna cover by the slit cover, and fixing the slit cover to a wall surface of the vacuum chamber.
    • 一种用于在真空室中产生等离子体并处理放置在基板电极上的基板的等离子体处理方法,所述等离子体是通过将频率为50MHz至3GHz的高频电源提供给与基板电极相对设置的天线而产生的 通过向真空室供给气体并排出真空室的内部,真空室的内部被控制到规定的压力,该方法包括夹在天线和真空室之间的电介质板,天线和 电介质板突出到真空室中,通过设置在天线和真空室之间的环形和凹槽来控制基板上的等离子体分布,并且通过使天线盖固定的状态来处理基板 的狭缝和天线覆盖有天线盖,使狭缝的底面覆盖有狭缝c 通过狭缝盖支撑天线罩,并将狭缝盖固定到真空室的壁面。