会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
    • 耐蚀组合物和形成耐力图案的方法
    • US20130337387A1
    • 2013-12-19
    • US13868462
    • 2013-04-23
    • Tokyo Ohta Kogyo Co., Ltd.
    • Masahito YahagiJun Iwashita
    • G03F7/004
    • G03F7/004G03F7/0045G03F7/0382G03F7/0392G03F7/0397G03F7/2041G03F7/2059G03F7/40
    • A resist composition including a base component (A) which generates acid upon exposure and exhibits changed solubility in a developing solution by the action of acid, (A) including (A1) including (a0) and (a2), and the resist composition having a Tf temperature of lower than 170° C. (└La01 represents —COO—, —CON(R′)— or a divalent aromatic group, R′ represents a hydrogen atom or a methyl group, Va01 represents a linear alkylene group of at least 3 carbon atoms, A− represents an anion-containing group, Mm+ represents an organic cation, Ya21 represents a single bond or divalent linking group, La21 represents —O—, —COO—, —CON(R′)— or —OCO—, R′ represents a hydrogen atom or a methyl group, and Ra21 represents a lactone-containing group, a carbonate containing group or an —SO2— containing group.
    • 一种抗蚀剂组合物,其包含在曝光后产生酸的基础组分(A),并且通过酸作用而在显影液中溶解度变化,(A)包括(A1)(a0)和(a2)),并且所述抗蚀剂组合物具有 (◎La01表示-COO-,-CON(R') - 或二价芳族基团,R'表示氢原子或甲基,Va 01表示直链亚烷基, 至少3个碳原子,A-表示含阴离子基团,Mm +表示有机阳离子,Ya21表示单键或二价连接基团,La 21表示-O - , - COO - , - CON(R') - 或-OCO - ,R'表示氢原子或甲基,Ra 21表示含内酯基,含碳酸酯基或-SO 2 - 基团。