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1. 发明授权

US07120227B2 Method of displaying dynamically scattering vector of X-ray diffraction 失效
$Method of displaying dynamically scattering vector of X-ray diffraction$
标题翻译：显示X射线衍射的动态散射矢量的方法
公开(公告)号：US07120227B2
公开(公告)日：2006-10-10
申请号：US10854562
申请日：2004-05-25
申请人： Tetsuya Ozawa , Susumu Yamaguchi , Kohji Kakefuda
发明人： Tetsuya Ozawa , Susumu Yamaguchi , Kohji Kakefuda
IPC分类号： G01N23/201
CPC分类号： G01N23/2055
摘要： The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions on a screen which represents the reciprocal space of a sample crystal. The tip location of the scattering vector can be seen dynamically and the X-ray diffraction phenomenon under changing measuring conditions can be readily understood, effecting easy consideration of the measuring conditions and easy evaluation of the measured results.
摘要翻译： X射线衍射的散射矢量在屏幕上动态显示。 X射线衍射的散射矢量的尖端位置的动态运动和轨迹在表示样品晶体的倒数空间的屏幕上在变化的测量条件下二维或三维地显示。可以动态地观察散射矢量的尖端位置，并且可以容易地理解在变化的测量条件下的X射线衍射现象，容易考虑测量条件并容易地评估测量结果。

2. 发明申请

US20050002488A1 Method of displaying dynamically scattering vector of X-ray diffraction 失效
$Method of displaying dynamically scattering vector of X-ray diffraction$
标题翻译：显示X射线衍射的动态散射矢量的方法
公开(公告)号：US20050002488A1
公开(公告)日：2005-01-06
申请号：US10854562
申请日：2004-05-25
申请人： Tetsuya Ozawa , Susumu Yamaguchi , Kohji Kakefuda
发明人： Tetsuya Ozawa , Susumu Yamaguchi , Kohji Kakefuda
IPC分类号： G01N23/20 , G01N23/205 , G06F19/00 , G01N23/201
CPC分类号： G01N23/2055
摘要： The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions on a screen which represents the reciprocal space of a sample crystal. The tip location of the scattering vector can be seen dynamically and the X-ray diffraction phenomenon under changing measuring conditions can be readily understood, effecting easy consideration of the measuring conditions and easy evaluation of the measured results.
摘要翻译： X射线衍射的散射矢量在屏幕上动态显示。 X射线衍射的散射矢量的尖端位置的动态运动和轨迹在表示样品晶体的倒数空间的屏幕上在变化的测量条件下二维或三维地显示。可以动态地观察散射矢量的尖端位置，并且可以容易地理解在变化的测量条件下的X射线衍射现象，容易考虑测量条件并容易地评估测量结果。

3. 发明授权

US07206378B2 X-ray analysis apparatus 有权
标题翻译： X射线分析仪
公开(公告)号：US07206378B2
公开(公告)日：2007-04-17
申请号：US11066142
申请日：2005-02-25
申请人： Yasushi Obata , Kohji Kakefuda
发明人： Yasushi Obata , Kohji Kakefuda
IPC分类号： G01N23/20 , H04G1/28
CPC分类号： G01N23/20016
摘要： An X-ray analysis apparatus includes: an X-ray radiation unit that irradiates a sample with X-ray; an X-ray detection unit that detects X-ray emission from the sample; a unit that allows the X-ray detection unit to perform scanning operation for changing the angle of the X-ray detection unit with respect to the sample; and an image controller that displays information related to X-ray intensity detected by the X-ray detection unit and information related to a scanning angle of the X-ray detection unit as a 3D image. The image controller displays the 3D image simultaneously with the scanning operation of the X-ray detection unit. Further, simultaneously with the scanning operation of the X-ray detection unit, two or all of 1D, 2D, and 3D images are displayed in one screen. A measurement result starts being displayed as a 3D image before information related to all measurement results has been obtained.
摘要翻译： X射线分析装置包括：用X射线照射样品的X射线照射单元; X射线检测单元，其检测来自样品的X射线发射; 允许X射线检测单元执行用于改变X射线检测单元相对于样本的角度的扫描操作的单元; 以及图像控制器，其显示与由X射线检测单元检测的X射线强度相关的信息和与X射线检测单元的扫描角度相关的信息作为3D图像。图像控制器与X射线检测单元的扫描操作同时显示3D图像。此外，与X射线检测单元的扫描操作同时，在一个屏幕中显示1D，2D和3D图像中的两个或全部。在获得与所有测量结果相关的信息之前，测量结果开始显示为3D图像。

4. 发明申请

US20050190881A1 X-ray analysis apparatus 有权
标题翻译： X射线分析仪
公开(公告)号：US20050190881A1
公开(公告)日：2005-09-01
申请号：US11066142
申请日：2005-02-25
申请人： Yasushi Obata , Kohji Kakefuda
发明人： Yasushi Obata , Kohji Kakefuda
IPC分类号： G01N23/207 , G01N23/20 , G01N23/223 , G01T1/36
CPC分类号： G01N23/20016
摘要： An X-ray analysis apparatus includes: an X-ray radiation unit that irradiates a sample with X-ray; an X-ray detection unit that detects X-ray emission from the sample; a unit that allows the X-ray detection unit to perform scanning operation for changing the angle of the X-ray detection unit with respect to the sample; and an image controller that displays information related to X-ray intensity detected by the X-ray detection unit and information related to a scanning angle of the X-ray detection unit as a 3D image. The image controller displays the 3D image simultaneously with the scanning operation of the X-ray detection unit. Further, simultaneously with the scanning operation of the X-ray detection unit, two or all of 1D, 2D, and 3D images are displayed in one screen. A measurement result starts being displayed as a 3D image before information related to all measurement results has been obtained.
摘要翻译： X射线分析装置包括：用X射线照射样品的X射线照射单元; X射线检测单元，其检测来自样品的X射线发射; 允许X射线检测单元执行用于改变X射线检测单元相对于样本的角度的扫描操作的单元; 以及图像控制器，其显示与由X射线检测单元检测的X射线强度相关的信息和与X射线检测单元的扫描角度相关的信息作为3D图像。图像控制器与X射线检测单元的扫描操作同时显示3D图像。此外，与X射线检测单元的扫描操作同时，在一个屏幕中显示1D，2D和3D图像中的两个或全部。在获得与所有测量结果相关的信息之前，测量结果开始显示为3D图像。

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