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    • 1. 发明授权
    • Flat type IC conveyor
    • 扁平型IC输送机
    • US5711413A
    • 1998-01-27
    • US761796
    • 1996-12-06
    • Akio NakamuraTetsuya OkudairaYoshihiro Goto
    • Akio NakamuraTetsuya OkudairaYoshihiro Goto
    • B65D85/86H01L21/673B65G21/20
    • H01L21/67333
    • A flat type IC conveyor capable of conveying flat type ICs while stabilizing the posture of the ICs. A plurality of recess portions accommodating therein flat type ICs are formed lengthwise and widthwise on a flat type IC conveyor. Through holes are respectively defined in the bottom surfaces of the recess portions in a manner of avoiding leads of the ICs. Positioning pins are provided upright on the IC conveyor. A cover includes a plurality of convex portions which are positioned corresponding to the recess portions and direct to project toward package portions of the ICs to be accommodated in the recess portions. The cover also includes holes into which the positioning pins are inserted. When the cover is mounted on the conveyor, the convex portions can prevent the inclination of the ICs in the recess portions.
    • 平板型IC输送机能够在稳定IC的姿势的同时输送扁平型IC。 容纳在其中的平坦型IC的多个凹部形成在扁平型IC输送机上纵向和横向地形成。 以避免IC的引线的方式,在凹部的底表面分别限定通孔。 定位销直立在IC输送机上。 一个盖子包括多个凸起部分,这些凸起部分对应于这些凹部并且直接突出到IC的封装部分以容纳在凹部中。 盖子还包括定位销插入其中的孔。 当盖子安装在输送机上时,凸起部分可以防止IC在凹部中的倾斜。
    • 2. 发明授权
    • Handling system
    • 处理系统
    • US5686834A
    • 1997-11-11
    • US717258
    • 1996-09-20
    • Tetsuya OkudairaAkio NakamuraYoshihiro Goto
    • Tetsuya OkudairaAkio NakamuraYoshihiro Goto
    • G01R31/26G01R31/28H01L21/66H01L21/677G01R31/02
    • G01R31/2893G01R31/2851
    • A handling system which carries a carrier carrying a plurality of IC devices, subjects the IC devices to testing, sorts the tested IC devices and stores the tested IC devices, said handling system comprises test units for electrically connecting IC devices to an IC socket for transmitting electrical signals provided by the IC devices to an IC tester; a loader/unloader unit for transferring IC devices to be tested from a container to a carrier, sorting tested IC devices and selectively transferring the tested IC devices from the carrier to containers; and carrier transfer units combined with the test units, respectively, to transfer the carrier from the loader/unloader unit to the corresponding test units and from the corresponding test units to the loader/unloader unit. The number of the test units to be used in combination with the loader/unloader unit being varied according to test time required by the IC tester for testing the IC devices contained in the carrier.
    • 承载携带承载IC器件进行测试的多个IC器件的载体的处理系统对所测试的IC器件进行分类并存储所测试的IC器件,所述处理系统包括用于将IC器件电连接到用于传输的IC插座的测试单元 由IC器件提供给IC测试仪的电信号; 用于将测试的IC器件从容器转移到载体的装载器/卸载器单元,对测试的IC器件进行分类并将测试的IC器件从载体选择性地传送到容器; 以及与测试单元组合的载体传送单元,以将载体从装载机/卸载机单元传送到相应的测试单元,并将相应的测试单元传送到装载机/卸载机单元。 与装载机/卸载机组合使用的测试单元的数量根据IC测试仪测试载体中包含的IC器件所需的测试时间而变化。
    • 6. 发明授权
    • Method of fabricating light emitting device and thus-fabricated light emitting device
    • 制造发光器件和由此制造的发光器件的方法
    • US07663151B2
    • 2010-02-16
    • US11587632
    • 2005-04-13
    • Hitoshi IkedaKingo SuzukiAkio Nakamura
    • Hitoshi IkedaKingo SuzukiAkio Nakamura
    • H01L33/00
    • H01L33/22H01L33/0079H01L33/0095H01L33/30
    • A light emitting device chip is obtained by dicing a light emitting device wafer having a light emitting layer section 24 based on a double heterostructure in which a first-conductivity-type cladding layer 6, an active layer 5 and an second-conductivity-type cladding layer 4, each of which being composed of a compound semiconductor having a composition allowing lattice matching with GaAs, out of compound semiconductors expressed by formula (AlxGa1-x)yIn1-yP (where, 0≦x≦1, 0≦y≦1), are stacked in this order, and having the (100) surface appeared on the main surface thereof, and GaP transparent semiconductor layers 20, 90 stacked on the light emitting layer section 24 as being agreed with the crystal orientation thereof, so that the {100} surfaces appear on the side faces of the GaP transparent semiconductor layer. Accordingly, there can be provided a method of fabricating a light emitting device having the AlGaInP light emitting layer section and the GaP transparent semiconductor layers, less causative of failures such as edge chipping during the dicing.
    • 通过基于双异质结构对具有发光层部分24的发光器件晶片进行切割来获得发光器件芯片,其中第一导电型包覆层6,有源层5和第二导电型包层 (Al x Ga 1-x)y In 1-y P表示的化合物半导体中的每一个由具有允许与GaAs晶格匹配的组成的化合物半导体构成,其中,0≤x≤1,0< y <= 1)按顺序堆叠,并且在其主表面上出现(100)表面,并且与发光层部分24堆叠在一起的GaP透明半导体层20,90与晶体取向一致 ,使得{100}表面出现在GaP透明半导体层的侧面上。 因此,可以提供一种制造具有AlGaInP发光层部分和GaP透明半导体层的发光器件的方法,其不利于在切割期间的边缘切屑等故障。
    • 9. 发明授权
    • Fuel cell device and case thereof
    • 燃料电池装置及其壳体
    • US07416805B2
    • 2008-08-26
    • US10677353
    • 2003-10-03
    • Akio NakamuraTakashi Arita
    • Akio NakamuraTakashi Arita
    • H01M2/00H01M2/14H01M8/00
    • H01M8/2475H01M8/248
    • A fuel cell device is disclosed that is capable of being made compact when being transported and in storage. The fuel cell device includes a fuel cell unit including a number of fuel cells arranged sequentially in a case. The case includes a holder frame for holding the fuel cells, a first hemi-case, and a second hemi-case. The width of the case is adjustable in the direction in which the fuel cells are arranged in a line. When the fuel cell device is being transported or in storage, the first hemi-case and the second hemi-case are pushed to approach each other, making the size of the case small. When the fuel cell device is used to generate electrical power, the first hemi-case and the second hemi-case are pulled apart from each other and, accordingly, the fuel cells are separated from each other by a springy plate.
    • 公开了一种燃料电池装置,其能够在运输和存储时被制造得紧凑。 燃料电池装置包括燃料电池单元,该燃料电池单元包括在壳体中顺次布置的多个燃料电池。 壳体包括用于保持燃料电池的保持架,第一半壳体和第二半壳体。 壳体的宽度可以在燃料电池排列成一行的方向上调节。 当燃料电池装置被运输或储存时,第一半箱和第二半壳被推动以彼此靠近,使得壳体的尺寸小。 当燃料电池装置用于产生电力时,第一半壳体和第二半壳体彼此分离,因此燃料电池通过弹性板彼此分离。