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    • 1. 发明授权
    • Non-volatile memory
    • 非易失性存储器
    • US06646912B2
    • 2003-11-11
    • US09875356
    • 2001-06-05
    • Terril N. HurstCraig PerlovCarol WilsonCarl Taussig
    • Terril N. HurstCraig PerlovCarol WilsonCarl Taussig
    • G11C1136
    • G11C17/16G11C8/10
    • A data storage device is disclosed that comprises a cross-point memory array formed on a dielectric substrate material. The cross-point memory array comprises first and second sets of transverse electrodes separated by a storage layer including at least one semiconductor layer. The storage layer forms a non-volatile memory element at each crossing point of electrodes from the first and second sets. Each memory element can be switched between low and high impedance states, representing respective binary data states, by application of a write signal in the form of a predetermined current density through the memory element. Each memory element includes a diode junction formed in the storage layer, at least whilst in the low impedance state. A plurality of the data storage devices can be stacked and laminated into a memory module providing inexpensive high capacity data storage. Such a memory module can be employed in an archival data storage system in which the memory module provides a write-once data storage unit receivable in an appliance or interface card.
    • 公开了一种数据存储装置,其包括形成在电介质基板材料上的交叉点存储器阵列。 交叉点存储器阵列包括由包括至少一个半导体层的存储层分开的第一组和第二组横向电极。 存储层在与第一和第二组的电极的每个交叉点处形成非易失性存储元件。 通过以预定电流密度的形式通过存储元件施加写入信号,每个存储元件可以在表示相应的二进制数据状态​​的低阻抗状态和高阻抗状态之间切换。 每个存储元件至少在处于低阻抗状态时包括在存储层中形成的二极管结。 可以将多个数据存储装置堆叠并层叠到提供便宜的高容量数据存储的存储器模块中。 这样的存储器模块可以用于档案数据存储系统,其中存储器模块提供可接收在设备或接口卡中的一次写入数据存储单元。
    • 10. 发明授权
    • Addressing and sensing a cross-point diode memory array
    • US06567295B2
    • 2003-05-20
    • US09875496
    • 2001-06-05
    • Carl TaussigRichard Elder
    • Carl TaussigRichard Elder
    • G11C1706
    • G11C8/10G11C17/06G11C17/18
    • A memory circuit includes a cross-point memory array having first and second sets of transverse electrodes with respective memory elements formed at the crossing-points of the first and second set electrodes. Each of the memory elements is formed to include, in at least one of its binary states, a diode element. The memory circuit also includes an addressing circuit coupled to the memory array. The addressing circuit has a first set of address lines with first diode connections between the first set address lines and the first set memory array electrodes, with the first diode connections coupling each memory array electrode in the first set to a respective unique subset of the first set address lines. The addressing circuit also has a second set of address lines with second diode connections between the second set address lines and the second set memory array electrodes, with the second diode connections coupling each memory array electrode in the second set to a respective unique subset of the second set address lines. The first and second diode connections form a permuted diode logic circuit whereby application of predetermined voltages to selected subsets of the first and second address lines enables unique addressing of a single memory element in the array. By sensing the current in the address lines the binary state of the addressed memory element may be determined. Also, by application of a writing voltage to the selected subsets of address lines, the binary state of a memory element can be changed by substantially and permanently changing the resistance thereof.