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    • 6. 发明授权
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US08289800B2
    • 2012-10-16
    • US12693824
    • 2010-01-26
    • Takuya FutatsuyamaNaoya Tokiwa
    • Takuya FutatsuyamaNaoya Tokiwa
    • G11C5/14
    • G11C5/147G11C16/30
    • A nonvolatile semiconductor memory device has an internal step-down power generation circuit and a memory circuit. The internal step-down power generation circuit generates a first internal power supply voltage from an external power supply voltage in an active state, and generates a second internal power supply voltage different from the first internal power supply voltage from the external power supply voltage in a standby state. The memory circuit includes a cell array containing a nonvolatile memory cell and a sense amplifier detecting data read from the cell array. The sense amplifier is supplied with a voltage generated by the internal step-down power generation circuit as an internal power supply voltage.
    • 非易失性半导体存储器件具有内部降压发电电路和存储电路。 内部降压发电电路从活动状态的外部电源电压产生第一内部电源电压,并且从外部电源电压生成与第一内部电源电压不同的第二内部电源电压 待机状态。 存储电路包括一个包含非易失性存储单元的单元阵列和一个检测从该单元阵列读出的数据的读出放大器。 感测放大器被提供有由内部降压发电电路产生的电压作为内部电源电压。