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1. 发明申请

US20060193508A1 Pattern measuring method and pattern measuring device 有权
公开(公告)号：US20060193508A1
公开(公告)日：2006-08-31
申请号：US11359374
申请日：2006-02-23
申请人： Takumichi Sutani , Ryoichi Matsuoka , Hidetoshi Morokuma , Hitoshi Komuro , Akiyuki Sugiyama
发明人： Takumichi Sutani , Ryoichi Matsuoka , Hidetoshi Morokuma , Hitoshi Komuro , Akiyuki Sugiyama
IPC分类号： G06K9/00
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/2817
摘要： A pattern measuring method and device are provided which set a reference position for a measuring point to be measured by a scanning electron microscope and the like, based on position information of a reference pattern on an image acquired from the scanning electron microscope and based on a positional relation, detected by using design data, between the measuring point and the reference pattern formed at a position isolated from the measuring point.

2. 发明授权

US08019161B2 Method, device and computer program of length measurement 有权
标题翻译：长度测量的方法，设备和计算机程序
公开(公告)号：US08019161B2
公开(公告)日：2011-09-13
申请号：US11717772
申请日：2007-03-14
申请人： Hidetoshi Morokuma , Takumichi Sutani , Ryoichi Matsuoka , Hitoshi Komuro , Akiyuki Sugiyama
发明人： Hidetoshi Morokuma , Takumichi Sutani , Ryoichi Matsuoka , Hitoshi Komuro , Akiyuki Sugiyama
IPC分类号： G06K9/46
CPC分类号： G01N23/2251
摘要： A workpiece size measurement method suitable for length measurement of multilayered circuit elements with increased complexities is disclosed. This method employs a technique for changing measurement conditions in a way pursuant to either an image of workpiece or the situation of a target semiconductor circuit element to be measured when measuring pattern sizes on the workpiece image using design data of the semiconductor circuit element. With such an arrangement, adequate measurement conditions are selectable in accordance with the state of workpiece image and/or the state of a circuit element formed on the workpiece, thereby making it possible to improve the measurement efficiency. A workpiece size measurement apparatus using the technique is also disclosed.
摘要翻译：公开了一种适合于具有增加的复杂度的多层电路元件的长度测量的工件尺寸测量方法。该方法采用在使用半导体电路元件的设计数据测量工件图像上的图案尺寸时，根据工件的图像或待测量的目标半导体电路元件的情况来改变测量条件的技术。通过这样的布置，可以根据工件图像的状态和/或形成在工件上的电路元件的状态来选择适当的测量条件，从而可以提高测量效率。还公开了使用该技术的工件尺寸测量装置。

3. 发明授权

US07518110B2 Pattern measuring method and pattern measuring device 有权
标题翻译：图案测量方法和图案测量装置
公开(公告)号：US07518110B2
公开(公告)日：2009-04-14
申请号：US11359374
申请日：2006-02-23
申请人： Takumichi Sutani , Ryoichi Matsuoka , Hidetoshi Morokuma , Hitoshi Komuro , Akiyuki Sugiyama
发明人： Takumichi Sutani , Ryoichi Matsuoka , Hidetoshi Morokuma , Hitoshi Komuro , Akiyuki Sugiyama
IPC分类号： G01B9/00
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/2817
摘要： A pattern measuring method and device are provided which set a reference position for a measuring point to be measured by a scanning electron microscope and the like, based on position information of a reference pattern on an image acquired from the scanning electron microscope and based on a positional relation, detected by using design data, between the measuring point and the reference pattern formed at a position isolated from the measuring point.
摘要翻译：提供了一种图案测量方法和装置，其基于通过扫描电子显微镜等测量的测量点的基准位置，基于从扫描电子显微镜获取的图像上的参考图案的位置信息，并基于通过使用设计数据检测的位置关系，在测量点和形成在与测量点隔离的位置处形成的参考图案之间。

4. 发明授权

US08507856B2 Pattern measuring method and pattern measuring device 有权
公开(公告)号：US08507856B2
公开(公告)日：2013-08-13
申请号：US13457359
申请日：2012-04-26
申请人： Takumichi Sutani , Ryoichi Matsuoka , Hidetoshi Morokuma , Hitoshi Komuro , Akiyuki Sugiyama
发明人： Takumichi Sutani , Ryoichi Matsuoka , Hidetoshi Morokuma , Hitoshi Komuro , Akiyuki Sugiyama
IPC分类号： G06K9/48 , G06K9/00
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/2817
摘要： A pattern measuring method and device are provided which set a reference position for a measuring point to be measured by a scanning electron microscope and the like, based on position information of a reference pattern on an image acquired from the scanning electron microscope and based on a positional relation, detected by using design data, between the measuring point and the reference pattern formed at a position isolated from the measuring point.

5. 发明申请

US20120211653A1 PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE 有权
标题翻译：图形测量方法和图案测量装置
公开(公告)号：US20120211653A1
公开(公告)日：2012-08-23
申请号：US13457359
申请日：2012-04-26
申请人： Takumichi SUTANI , Ryoichi Matsuoka , Hidetoshi Morokuma , Hitoshi Komuro , Akiyuki Sugiyama
发明人： Takumichi SUTANI , Ryoichi Matsuoka , Hidetoshi Morokuma , Hitoshi Komuro , Akiyuki Sugiyama
IPC分类号： H01J37/26
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/2817
摘要： A pattern measuring method and device are provided which set a reference position for a measuring point to be measured by a scanning electron microscope and the like, based on position information of a reference pattern on an image acquired from the scanning electron microscope and based on a positional relation, detected by using design data, between the measuring point and the reference pattern formed at a position isolated from the measuring point.
摘要翻译：提供了一种图案测量方法和装置，其基于通过扫描电子显微镜等测量的测量点的基准位置，基于从扫描电子显微镜获取的图像上的参考图案的位置信息，并基于通过使用设计数据检测的位置关系，在测量点和形成在与测量点隔离的位置处形成的参考图案之间。

6. 发明申请

US20070221842A1 Workpiece size measurement method and apparatus 有权
标题翻译：工件尺寸测量方法和装置
公开(公告)号：US20070221842A1
公开(公告)日：2007-09-27
申请号：US11717772
申请日：2007-03-14
申请人： Hidetoshi Morokuma , Takumichi Sutani , Ryoichi Matsuoka , Hitoshi Komuro , Akiyuki Sugiyama
发明人： Hidetoshi Morokuma , Takumichi Sutani , Ryoichi Matsuoka , Hitoshi Komuro , Akiyuki Sugiyama
IPC分类号： G01N23/00
CPC分类号： G01N23/2251
摘要： A workpiece size measurement method suitable for length measurement of multilayered circuit elements with increased complexities is disclosed. This method employs a technique for changing measurement conditions in a way pursuant to either an image of workpiece or the situation of a target semiconductor circuit element to be measured when measuring pattern sizes on the workpiece image using design data of the semiconductor circuit element. With such an arrangement, adequate measurement conditions are selectable in accordance with the state of workpiece image and/or the state of a circuit element formed on the workpiece, thereby making it possible to improve the measurement efficiency. A workpiece size measurement apparatus using the technique is also disclosed.
摘要翻译：公开了一种适合于具有增加的复杂度的多层电路元件的长度测量的工件尺寸测量方法。该方法采用在使用半导体电路元件的设计数据测量工件图像上的图案尺寸时，根据工件的图像或待测量的目标半导体电路元件的情况来改变测量条件的技术。通过这样的布置，可以根据工件图像的状态和/或形成在工件上的电路元件的状态来选择适当的测量条件，从而可以提高测量效率。还公开了使用该技术的工件尺寸测量装置。

7. 发明授权

US07925095B2 Pattern matching method and computer program for executing pattern matching 有权
标题翻译：模式匹配方法和执行模式匹配的计算机程序
公开(公告)号：US07925095B2
公开(公告)日：2011-04-12
申请号：US11698988
申请日：2007-01-29
申请人： Akiyuki Sugiyama , Hiroyuki Shindo , Hitoshi Komuro , Takumichi Sutani , Hidetoshi Morokuma
发明人： Akiyuki Sugiyama , Hiroyuki Shindo , Hitoshi Komuro , Takumichi Sutani , Hidetoshi Morokuma
IPC分类号： G06K9/32
CPC分类号： G06K9/6204 , G06K9/4633
摘要： A pattern matching method which is capable of selecting a suitable measurement object pattern, even on a sample containing a periodic structure, and a computer program for making a computer execute the pattern matching. In a pattern matching method which executes matching between the design data-based first image of an object sample, and a second image, whether or not a periodic structure is included in a region to execute the matching is determined, so as to select a pattern, based on distance between an original point which is set in said image, and the pattern configuring said periodic structure, in the case where the periodic structure is included in said region, and to select a pattern based on coincidence of the pattern in said image, in the case where the periodic structure is not included in said region, and a computer program product.
摘要翻译：能够选择合适的测量对象图案的模式匹配方法，即使在包含周期性结构的样本上，也可以使计算机程序使计算机执行模式匹配。在执行对象样本的基于设计数据的第一图像与第二图像之间的匹配的图案匹配方法中，确定在区域中是否包括周期性结构以执行匹配，以便选择图案基于在所述图像中设置的原始点与构成所述周期性结构的图案之间的距离，在所述区域中包括周期性结构的情况下，以及基于所述图像中的图案的一致性来选择图案在周期性结构不包括在所述区域中的情况下，以及计算机程序产品。

8. 发明申请

US20110150345A1 PATTERN MATCHING METHOD AND COMPUTER PROGRAM FOR EXECUTING PATTERN MATCHING 有权
标题翻译：图案匹配方法和计算机程序执行模式匹配
公开(公告)号：US20110150345A1
公开(公告)日：2011-06-23
申请号：US13034237
申请日：2011-02-24
申请人： Akiyuki SUGIYAMA , Hiroyuki Shindo , Hitoshi Komuro , Takumichi Sutani , Hidetoshi Morokuma
发明人： Akiyuki SUGIYAMA , Hiroyuki Shindo , Hitoshi Komuro , Takumichi Sutani , Hidetoshi Morokuma
IPC分类号： G06K9/62
CPC分类号： G06K9/6204 , G06K9/4633
摘要： A pattern matching method which is capable of selecting a suitable measurement object pattern, even on a sample containing a periodic structure, and a computer program for making a computer execute the pattern matching. In a pattern matching method which executes matching between the design data-based first image of an object sample, and a second image, whether or not a periodic structure is included in a region to execute the matching is determined, so as to select a pattern, based on distance between an original point which is set in said image, and the pattern configuring said periodic structure, in the case where the periodic structure is included in said region, and to select a pattern based on coincidence of the pattern in said image, in the case where the periodic structure is not included in said region, and a computer program product.
摘要翻译：能够选择合适的测量对象图案的模式匹配方法，即使在包含周期性结构的样本上，也可以使计算机程序使计算机执行模式匹配。在执行对象样本的基于设计数据的第一图像与第二图像之间的匹配的图案匹配方法中，确定在区域中是否包括周期性结构以执行匹配，以便选择图案基于在所述图像中设置的原始点与构成所述周期性结构的图案之间的距离，在所述区域中包括周期性结构的情况下，以及基于所述图像中的图案的一致性来选择图案在周期性结构不包括在所述区域中的情况下，以及计算机程序产品。

9. 发明申请

US20080037830A1 Pattern matching method and computer program for executing pattern matching 有权
标题翻译：模式匹配方法和执行模式匹配的计算机程序
公开(公告)号：US20080037830A1
公开(公告)日：2008-02-14
申请号：US11698988
申请日：2007-01-29
申请人： Akiyuki Sugiyama , Hiroyuki Shindo , Hitoshi Komuro , Takumichi Sutani , Hidetoshi Morokuma
发明人： Akiyuki Sugiyama , Hiroyuki Shindo , Hitoshi Komuro , Takumichi Sutani , Hidetoshi Morokuma
IPC分类号： G06K9/00
CPC分类号： G06K9/6204 , G06K9/4633
摘要： A pattern matching method which is capable of selecting a suitable measurement object pattern, even on a sample containing a periodic structure, and a computer program for making a computer execute the pattern matching. In a pattern matching method which executes matching between the design data-based first image of an object sample, and a second image, whether or not a periodic structure is included in a region to execute the matching is determined, so as to select a pattern, based on distance between an original point which is set in said image, and the pattern configuring said periodic structure, in the case where the periodic structure is included in said region, and to select a pattern based on coincidence of the pattern in said image, in the case where the periodic structure is not included in said region, and a computer program product.
摘要翻译：能够选择合适的测量对象图案的模式匹配方法，即使在包含周期性结构的样本上，也可以使计算机程序使计算机执行模式匹配。在执行对象样本的基于设计数据的第一图像与第二图像之间的匹配的图案匹配方法中，确定在区域中是否包括周期性结构以执行匹配，以便选择图案基于在所述图像中设置的原始点与构成所述周期性结构的图案之间的距离，在所述区域中包括周期性结构的情况下，以及基于所述图像中的图案的一致性来选择图案在周期性结构不包括在所述区域中的情况下，以及计算机程序产品。

10. 发明申请

US20070223803A1 Pattern matching method and pattern matching program 有权
标题翻译：模式匹配方法和模式匹配程序
公开(公告)号：US20070223803A1
公开(公告)日：2007-09-27
申请号：US11723577
申请日：2007-03-21
申请人： Hiroyuki Shindo , Akiyuki Sugiyama , Takumichi Sutani , Hidetoshi Morokuma , Hitoshi Komuro
发明人： Hiroyuki Shindo , Akiyuki Sugiyama , Takumichi Sutani , Hidetoshi Morokuma , Hitoshi Komuro
IPC分类号： G06K9/00
CPC分类号： G06K9/2036 , G06T7/0006 , G06T2207/10056 , G06T2207/30148 , H01J2237/221 , H01J2237/24592
摘要： It is an object of the invention to provide a suitable method for identifying depression/protrusion information in a design data; and a program and an apparatus for the same; for example, even in the case that similar portions are arranged, to provide a method for enabling a pattern matching with high precision between the design data and an image obtained by an image formation apparatus or the like; and a program and an apparatus for the same. To attain the above object, a pattern matching method, wherein, using information concerning a depression and/or a protrusion of the pattern on the design data, or a pattern portion and/or a non-pattern portion on the design data, pattern matching is executed between the pattern on the design data and the pattern on said image; and a program for the same are provided.
摘要翻译：本发明的目的是提供一种用于在设计数据中识别抑郁/突出信息的合适方法; 以及用于其的程序和装置; 例如，即使在配置相似部分的情况下，也可以提供一种能够在设计数据和由图像形成装置等获得的图像之间实现高精度的图案匹配的方法; 以及用于其的程序和装置。为了实现上述目的，提供了一种图案匹配方法，其中使用关于设计数据上的图案的凹陷和/或突出的信息，或者设计数据上的图案部分和/或非图案部分的图案匹配在设计数据上的图案和所述图像上的图案之间执行; 并提供其程序。

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