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    • 3. 发明授权
    • Apparatus for measuring a mechanical quantity
    • 用于测量机械量的装置
    • US08056421B2
    • 2011-11-15
    • US12719977
    • 2010-03-09
    • Takashi SumigawaHiroyuki Ohta
    • Takashi SumigawaHiroyuki Ohta
    • G01B7/16
    • G01B7/18G01B7/16G01B7/20G01L1/2206G01L1/2262G01L5/0047
    • An apparatus structure and measurement method are provided to retain high precision and high reliability of a semiconductor mechanical quantity measuring apparatus which senses a mechanical quantity and transmits measured information wirelessly. As to a silicon substrate of the semiconductor mechanical quantity measuring apparatus, for example, a ratio of a substrate thickness to a substrate length along a measurement direction is set small, and a ratio of a substrate thickness to a substrate length along a direction perpendicular to the measurement direction is set small. The apparatus upper surface is covered with a protective member. It is possible to measure a strain along a particular direction and realize mechanical quantity measurement with less error and high precision. An impact resistance and environment resistance of the apparatus itself can be improved.
    • 提供了一种装置结构和测量方法,以保持半导体机械量测量装置的高精度和高可靠性,该装置检测机械量并无线传送测量信息。 对于半导体机械量测量装置的硅衬底,例如,沿着测量方向将衬底厚度与衬底长度的比率设置得较小,并且沿着垂直于半导体机械量测量装置的方向的衬底厚度与衬底长度的比率 测量方向设定得很小。 设备上表面被保护构件覆盖。 可以测量特定方向的应变,实现误差小,精度更高的机械量测量。 可以提高装置本身的耐冲击性和耐环境性。
    • 5. 发明授权
    • Mechanical-quantity measuring device
    • 机械量测量装置
    • US07484422B2
    • 2009-02-03
    • US11350109
    • 2006-02-09
    • Takashi SumigawaHiroyuki Ohta
    • Takashi SumigawaHiroyuki Ohta
    • G01B7/16
    • G01B7/18G01L1/18
    • A mechanical-quantity measuring device capable of measuring a strain component of structure deformation for an object to be measured in a particular desired direction with long life, high reliability and high precision. A strain sensor is formed on a semiconductor substrate. Impurity-diffused layers considering the crystal orientation of the semiconductor single crystalline substrate are used to form a Wheatstone bridge circuit on the substrate. The Wheatstone bridge circuit can operate on one substrate since the semiconductor single crystal has the anisotropy of piezoresistance effect.
    • 一种机械量测量装置,其能够以长寿命,高可靠性和高精度在特定的期望方向上测量待测量物体的结构变形的应变分量。 应变传感器形成在半导体衬底上。 考虑到半导体单晶衬底的晶体取向的杂质扩散层用于在衬底上形成惠斯通电桥电路。 惠斯登电桥电路可以在一个衬底上工作,因为半导体单晶具有压阻效应的各向异性。
    • 6. 发明授权
    • Apparatus for measuring a mechanical quantity
    • 用于测量机械量的装置
    • US07430921B2
    • 2008-10-07
    • US11797417
    • 2007-05-03
    • Hiroyuki OhtaTakashi Sumigawa
    • Hiroyuki OhtaTakashi Sumigawa
    • G01B7/16
    • G01L1/18
    • A mechanical quantity measuring apparatus is provided which can make highly precise measurements and is not easily affected by noise even when it is supplied an electricity through electromagnetic induction or microwaves. At least a strain sensor and an amplifier, an analog/digital converter, a rectification/detection/modulation-demodulation circuit, and a communication control circuit are formed in one and the same silicon substrate. Or, the silicon substrate is also formed at its surface with a dummy resistor which has its longitudinal direction set in a particular crystal orientation and which, together with the strain sensor, forms a Wheatstone bridge. With this arrangement, even when a current flowing through the sensor is reduced, measured data is prevented from being buried in noise, allowing the sensor to operate on a small power and to measure a mechanical quantity with high precision even when it is supplied electricity through electromagnetic induction or microwaves.
    • 提供了能够进行高精度测量并且即使当通过电磁感应或微波供应电而不易受噪声影响的机械量测量装置。 至少一个应变传感器和放大器,模拟/数字转换器,整流/检测/调制解调电路和通信控制电路形成在同一个硅衬底中。 或者,硅衬底也在其表面上形成一个虚拟电阻器,该虚拟电阻器的纵向方向设置在特定的晶体取向中,并与应变传感器一起形成惠斯通电桥。 通过这种布置,即使当流过传感器的电流减小时,也可以防止测量数据被埋入噪声中,使得传感器能够以小功率工作,并且即使在通过电力供应通过时也以高精度测量机械量 电磁感应或微波。
    • 8. 发明申请
    • APPARATUS FOR MEASURING A MECHANICAL QUANTITY
    • 用于测量机械数量的装置
    • US20080289432A1
    • 2008-11-27
    • US12184104
    • 2008-07-31
    • Hiroyuki OhtaTakashi Sumigawa
    • Hiroyuki OhtaTakashi Sumigawa
    • G01B7/16
    • G01L1/18
    • A mechanical quantity measuring apparatus is provided which can make highly precise measurements and is not easily affected by noise even when it is supplied an electricity through electromagnetic induction or microwaves. At least a strain sensor and an amplifier, an analog/digital converter, a rectification/detection/modulation-demodulation circuit, and a communication control circuit are formed in one and the same silicon substrate. Or, the silicon substrate is also formed at its surface with a dummy resistor which has its longitudinal direction set in a particular crystal orientation and which, together with the strain sensor, forms a Wheatstone bridge. With this arrangement, even when a current flowing through the sensor is reduced, measured data is prevented from being buried in noise, allowing the sensor to operate on a small power and to measure a mechanical quantity with high precision even when it is supplied electricity through electromagnetic induction or microwaves.
    • 提供了能够进行高精度测量并且即使当通过电磁感应或微波供应电而不易受噪声影响的机械量测量装置。 至少一个应变传感器和放大器,模拟/数字转换器,整流/检测/调制解调电路和通信控制电路形成在同一个硅衬底中。 或者,硅衬底也在其表面上形成一个虚拟电阻器,该虚拟电阻器的纵向方向设置在特定的晶体取向中,并与应变传感器一起形成惠斯通电桥。 通过这种布置,即使当流过传感器的电流减小时,也可以防止测量数据被埋入噪声中,使得传感器能够以小功率工作,并且即使在通过电力供应通过时也以高精度测量机械量 电磁感应或微波。