专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US08015534B2 Method and apparatus for estimating core size in designing semiconductor integrated circuit 有权
标题翻译：在设计半导体集成电路时估计磁芯尺寸的方法和装置
公开(公告)号：US08015534B2
公开(公告)日：2011-09-06
申请号：US12252043
申请日：2008-10-15
申请人： Takashi Kurihara , Kazutaka Takeuchi
发明人： Takashi Kurihara , Kazutaka Takeuchi
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , G06F17/5068
摘要： A method, apparatus, and recording medium including computer instructions for estimating the size of a core section of a semiconductor integrated circuit are provided. The method includes calculating a total net length of wires of nets and usable channel length of the core section by referring to circuit information and a layout parameter that are used to design the semiconductor integrated circuit. The method includes determining a size of the core section that satisfies conditions based on total net length and usable channel length.
摘要翻译：提供了包括用于估计半导体集成电路的芯部的尺寸的计算机指令的方法，装置和记录介质。该方法包括通过参考用于设计半导体集成电路的电路信息和布局参数来计算网线的总净长度和芯部分的可用信道长度。该方法包括基于总净长度和可用信道长度来确定满足条件的核心部分的大小。

2. 发明授权

US07454724B2 Method and apparatus distribution power suply pad of semiconductor integrated circuit 有权
标题翻译：半导体集成电路的方法和装置配电电源板
公开(公告)号：US07454724B2
公开(公告)日：2008-11-18
申请号：US10823649
申请日：2004-04-14
申请人： Takashi Kurihara , Kazutaka Takeuchi
发明人： Takashi Kurihara , Kazutaka Takeuchi
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , G06F17/5068
摘要： A method for accurately determining the provisional quantity and provisional locations of power supply pads prior to detailed layout of a semiconductor integrated circuit. The method decreases redesigning, shortens the design time, and lowers design costs. The method includes performing a power supply network analysis of the core section to obtain voltage values of the nodes, calculating current values between the nodes from the voltage values of the nodes and the resistances between the nodes, and calculating current values of the power supply pads from the current values between the nodes. The method further includes determining whether to eliminate or add a power supply pad depending on whether the current value of each power supply pad exceeds the current capacity of an associated IO buffer.
摘要翻译：一种用于在半导体集成电路的详细布局之前准确地确定电源焊盘的临时位置和临时位置的方法。该方法减少了重新设计，缩短了设计时间，降低了设计成本。该方法包括执行核心部分的电源网络分析以获得节点的电压值，从节点的电压值和节点之间的电阻计算节点之间的电流值，并计算电源焊盘的电流值从节点之间的当前值。该方法还包括根据每个电源焊盘的当前值是否超过相关联的IO缓冲器的当前容量来确定是否消除或添加电源焊盘。

3. 发明申请

US20050050502A1 Method and apparatus for designing semiconductor integrated circuit 有权
标题翻译：半导体集成电路设计方法及设备
公开(公告)号：US20050050502A1
公开(公告)日：2005-03-03
申请号：US10823649
申请日：2004-04-14
申请人： Takashi Kurihara , Kazutaka Takeuchi
发明人： Takashi Kurihara , Kazutaka Takeuchi
IPC分类号： G06F17/50 , G06F9/45 , H01L21/82 , H01L21/822 , H01L27/04
CPC分类号： G06F17/5036 , G06F17/5068
摘要： A method for accurately determining the provisional quantity and provisional locations of power supply pads prior to detailed layout of a semiconductor integrated circuit. The method decreases redesigning, shortens the design time, and lowers design costs. The method includes performing a power supply network analysis of the core section to obtain voltage values of the nodes, calculating current values between the nodes from the voltage values of the nodes and the resistances between the nodes, and calculating current values of the power supply pads from the current values between the nodes. The method further includes determining whether to eliminate or add a power supply pad depending on whether the current value of each power supply pad exceeds the current capacity of an associated IO buffer.
摘要翻译：一种用于在半导体集成电路的详细布局之前准确地确定电源焊盘的临时位置和临时位置的方法。该方法减少了重新设计，缩短了设计时间，降低了设计成本。该方法包括执行核心部分的电源网络分析以获得节点的电压值，从节点的电压值和节点之间的电阻计算节点之间的电流值，并计算电源焊盘的电流值从节点之间的当前值。该方法还包括根据每个电源焊盘的当前值是否超过相关联的IO缓冲器的当前容量来确定是否消除或添加电源焊盘。

4. 发明申请

US20160010312A1 DISPLAY SYSTEM OF EXCAVATING MACHINE AND EXCAVATING MACHINE 有权
标题翻译：展示机和出版机展示系统
公开(公告)号：US20160010312A1
公开(公告)日：2016-01-14
申请号：US14442162
申请日：2013-11-11
申请人： Takashi Kurihara , Daishi Iwanaga
发明人： Takashi Kurihara , Daishi Iwanaga
IPC分类号： E02F9/26 , G06T11/20 , E02F9/20
CPC分类号： E02F9/265 , E02F3/435 , E02F9/2012 , E02F9/261 , E02F9/264 , G01S19/54 , G06T11/203
摘要： A display system of an excavating machine including a work machine with a bucket and a main body part to which the work machine is attached, includes: a storage storing positional information of a design surface indicating a design land shape and outer shape information of the bucket; and a processor determining, among measurement reference points predetermined along an outer shape of a buttock part of the bucket for measuring a position, including at least a tip of the bucket, a measurement reference point closest to the design surface, based on information on a current position of the excavating machine, information on a posture of the main body part, information on a position of the tip of the bucket, and the outer shape information of the bucket.
摘要翻译：包括具有铲斗的作业机械和附着有作业机械的主体部的挖掘机的显示系统包括：存储表示设计地形状的设计表面的位置信息和铲斗的外形信息的存储器 ; 以及处理器，其基于关于所述桶的信息，确定沿着所述铲斗的臀部的外部形状预定的测量参考点，用于测量包括所述铲斗的至少一个尖端的位置，最接近所述设计表面的测量参考点挖掘机的当前位置，关于主体部位的姿势的信息，关于铲斗前端的位置的信息以及铲斗的外形信息。

5. 发明申请

US20120242353A1 Physical Property Measuring Method for TFT Liquid Crystal Panel and Physical Property Measuring Apparatus for TFT Liquid Crystal Panel 有权
标题翻译： TFT液晶面板物理性能测量方法及TFT液晶面板物理性能测量装置
公开(公告)号：US20120242353A1
公开(公告)日：2012-09-27
申请号：US13489198
申请日：2012-06-05
申请人： Masaru Inoue , Kunihiko Sasaki , Takashi Kurihara , Yasuhiro Kume
发明人： Masaru Inoue , Kunihiko Sasaki , Takashi Kurihara , Yasuhiro Kume
IPC分类号： G01R27/26
CPC分类号： G02F1/1309 , G02F2001/136254 , G09G3/006 , G09G3/3648
摘要： There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.
摘要翻译：提供一种用于TFT液晶面板的物理性质测量方法，包括将TFT液晶面板的TFT的源极与漏极之间的阻抗设定为小于或等于预定值的阻抗设定步骤，施加周期性变化的电压到TFT液晶面板的液晶层的电压施加步骤。该方法还包括物理性能测量步骤，用于测量在电压施加步骤中施加循环变化的电压的流过液晶层的瞬态电流，以测量液晶层的物理性质。

6. 发明申请

US20110227100A1 LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING THEREOF 审中-公开
标题翻译：发光装置及其制造方法
公开(公告)号：US20110227100A1
公开(公告)日：2011-09-22
申请号：US13131806
申请日：2009-11-26
申请人： Takashi Kurihara , Yukiya Nishioka , Masaru Kajitani , Takuji Fujisawa , Mitsutoshi Akatsu , Satoshi Amamiya
发明人： Takashi Kurihara , Yukiya Nishioka , Masaru Kajitani , Takuji Fujisawa , Mitsutoshi Akatsu , Satoshi Amamiya
IPC分类号： H01L33/62
CPC分类号： H01L27/3246 , H01L27/3283 , H01L51/0004 , H01L51/0005 , H05B33/10 , H05B33/22
摘要： A light-emitting device comprises: a substrate; a plurality of organic electroluminescent elements provided on the substrate; and a partition defining pixel areas in each of which one of the organic EL elements is provided. The partition comprises an insulating film provided with openings each hollowly formed in an area corresponding to one of the pixel areas and a partition body provided on an opposite side of the insulating film with respect to the substrate. Each of the organic EL elements comprises a pair of electrodes and a light-emitting portion that is interposed between the electrodes and that is arranged in an area surrounded by the insulating film. The thickness of the insulating film is smaller than the thickness of the light-emitting portion.
摘要翻译：发光装置包括：基板; 设置在所述基板上的多个有机电致发光元件; 以及限定在其中设置有机EL元件之一的像素区域的分区。所述隔板包括设置有开口部的绝缘膜，所述绝缘膜中空地形成在与所述像素区域中的一个相对应的区域中，以及设置在所述绝缘膜相对于所述基板的相反侧的分隔体。每个有机EL元件包括一对电极和位于电极之间并且被布置在被绝缘膜包围的区域中的发光部分。绝缘膜的厚度小于发光部的厚度。

7. 发明申请

US20110102477A1 LIQUID CRYSTAL DISPLAY DEVICE 审中-公开
标题翻译：液晶显示装置
公开(公告)号：US20110102477A1
公开(公告)日：2011-05-05
申请号：US12867637
申请日：2008-12-11
申请人： Tomoko Nango , Takashi Kurihara , Yasuhiro Kume , Masayuki Hata , Takaaki Okamoto , Kazuhito Matsumoto , Koji Yabuta , Hideki Fujimoto , Norikazu Hohshi , Masakazu Wada , Tomohisa Matsushita
发明人： Tomoko Nango , Takashi Kurihara , Yasuhiro Kume , Masayuki Hata , Takaaki Okamoto , Kazuhito Matsumoto , Koji Yabuta , Hideki Fujimoto , Norikazu Hohshi , Masakazu Wada , Tomohisa Matsushita
IPC分类号： G09G5/10 , G09G3/36
CPC分类号： G02F1/133606 , G02F1/1393 , G02F2001/133507 , G02F2001/133531 , G02F2001/133607
摘要： A backlight unit (60) is provided in such a manner that light (L3) incident from the backlight unit (60) to a liquid crystal display element (20) in a diagonal direction that causes the light to be likely to be emitted from the liquid crystal display element (20) in a normal direction thereof has lower intensity than light (L2) incident from the backlight unit (60) to the liquid crystal display element (20) in another diagonal direction.
摘要翻译：背光单元（60）以这样的方式设置，使得从背光单元（60）入射到液晶显示元件（20）的光（L3）在对角线方向上，使得光可能从液晶显示元件（20）在其正方向上的强度比在背光单元（60）入射到另一对角线方向上的液晶显示元件（20）的光强度低。

8. 发明授权

US07893707B2 Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel 有权
标题翻译： TFT液晶面板的物理性质测量方法和TFT液晶面板的物理测量装置
公开(公告)号：US07893707B2
公开(公告)日：2011-02-22
申请号：US12498844
申请日：2009-07-07
申请人： Masaru Inoue , Kunihiko Sasaki , Takashi Kurihara , Yasuhiro Kume
发明人： Masaru Inoue , Kunihiko Sasaki , Takashi Kurihara , Yasuhiro Kume
IPC分类号： G01R31/00
CPC分类号： G02F1/1309 , G02F2001/136254 , G09G3/006 , G09G3/3648
摘要： There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.
摘要翻译：提供一种用于TFT液晶面板的物理性质测量方法，包括将TFT液晶面板的TFT的源极与漏极之间的阻抗设定为小于或等于预定值的阻抗设定步骤，施加周期性变化的电压到TFT液晶面板的液晶层的电压施加步骤。该方法还包括物理性能测量步骤，用于测量在电压施加步骤中施加循环变化的电压的流过液晶层的瞬态电流，以测量液晶层的物理性质。

9. 发明授权

US07876409B2 Liquid crystal display element 有权
标题翻译：液晶显示元件
公开(公告)号：US07876409B2
公开(公告)日：2011-01-25
申请号：US11991906
申请日：2006-09-12
申请人： Yasuhiro Kume , Takashi Kurihara , Kazuhiko Tamai , Takaaki Okamoto , Shinya Saeki
发明人： Yasuhiro Kume , Takashi Kurihara , Kazuhiko Tamai , Takaaki Okamoto , Shinya Saeki
IPC分类号： G02F1/1333
CPC分类号： G02F1/133784 , G02F2001/133742 , G02F2001/133749 , G02F2001/133773
摘要： In a liquid crystal display element of the present invention, the aligning capability for imparting pre-tilt angles to a liquid crystal material is imparted only to the surface of the alignment film of one of the substrates, the material layer having dielectric anisotropy includes a chiral material and a liquid crystal material with a nematic liquid crystal phase, 0.25≦d/p≦0.50 is satisfied assuming that the thickness of the material layer having the dielectric anisotropy is d and the chiral pitch length of the liquid crystal material is p, and 1000×d/p≦Δn×d is satisfied assuming that the refractive index anisotropy of the liquid crystal material is Δn.
摘要翻译：在本发明的液晶显示元件中，仅将赋予液晶材料的倾斜角的取向能力仅赋予于其中一个基板的取向膜的表面，具有介电各向异性的材料层包括手性材料和具有向列型液晶相的液晶材料，假定具有介电各向异性的材料层的厚度为d，液晶材料的手性节距长度为p时，满足0.25＆nlE; d / p＆nlE; 0.50，假设液晶材料的折射率各向异性为＆Dgr; n，则满足1000×d / p＆nlE;＆Dgr; n×d。

10. 发明申请

US20100315382A1 TOUCH-SENSOR-PROVIDED LIQUID CRYSTAL DISPLAY DEVICE ( amended 有权
标题翻译：触摸传感器提供的液晶显示设备（修改
公开(公告)号：US20100315382A1
公开(公告)日：2010-12-16
申请号：US12866995
申请日：2008-11-28
申请人： Takashi Kurihara , Yasuhiro Kume , Takaaki Okamoto , Tomoko Nango
发明人： Takashi Kurihara , Yasuhiro Kume , Takaaki Okamoto , Tomoko Nango
IPC分类号： G06F3/042 , G09G3/36
CPC分类号： G02F1/13338 , G02F1/133512 , G02F1/133602 , G02F2001/13312 , G06F3/0412 , G06F3/0421
摘要： The present invention relates to a touch-sensor-provided liquid crystal display device (10), the touch-sensor-provided liquid crystal display device (10) including a liquid crystal display panel (20) which includes a plurality of photo sensors (40) for detecting a touched position, and a backlight unit (90) provided on a backside of the liquid crystal display panel (20). The backlight unit (90) emits light at least part of which serves as light (L10) dedicated to sensing which is used for position detection by the plurality of photo sensors (40), and the light (L10) dedicated to sensing travels in a direction (D2) which is different from a direction (D1) toward a main viewer (V) of the liquid crystal display panel (20).
摘要翻译：本发明涉及一种提供触摸传感器的液晶显示装置（10），该触控传感器提供的液晶显示装置（10）包括一液晶显示面板（20），该液晶显示面板包括多个光传感器）和设置在液晶显示面板（20）的背面的背光单元（90）。背光单元（90）发光，其至少一部分用作用于由多个光传感器（40）进行位置检测的专用于感测的光（L10），专用于感测的光（L10）以方向（D2）与液晶显示面板（20）的主观察者（V）的方向（D1）不同。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式